SG10201901038UA - Tool set for use in position adjustment of positioning pins - Google Patents

Tool set for use in position adjustment of positioning pins

Info

Publication number
SG10201901038UA
SG10201901038UA SG10201901038UA SG10201901038UA SG10201901038UA SG 10201901038U A SG10201901038U A SG 10201901038UA SG 10201901038U A SG10201901038U A SG 10201901038UA SG 10201901038U A SG10201901038U A SG 10201901038UA SG 10201901038U A SG10201901038U A SG 10201901038UA
Authority
SG
Singapore
Prior art keywords
position adjustment
positioning pins
tool set
yft14
rafirm
Prior art date
Application number
SG10201901038UA
Other languages
English (en)
Inventor
Nishida Hiroaki
Original Assignee
Ebara Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ebara Corp filed Critical Ebara Corp
Publication of SG10201901038UA publication Critical patent/SG10201901038UA/en

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23QDETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q3/00Devices holding, supporting, or positioning work or tools, of a kind normally removable from the machine
    • B23Q3/18Devices holding, supporting, or positioning work or tools, of a kind normally removable from the machine for positioning only
    • B23Q3/186Aligning devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/24Measuring arrangements characterised by the use of mechanical techniques for measuring angles or tapers; for testing the alignment of axes
    • G01B5/25Measuring arrangements characterised by the use of mechanical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691Handling of masks or workpieces
    • G03F7/70716Stages
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/06Apparatus for monitoring, sorting, marking, testing or measuring
    • H10P72/0606Position monitoring, e.g. misposition detection or presence detection
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/50Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for positioning, orientation or alignment
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/76Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches
    • H10P72/7604Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support
    • H10P72/7608Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a plurality of separate clamping members, e.g. clamping fingers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Jigs For Machine Tools (AREA)
  • Heterocyclic Carbon Compounds Containing A Hetero Ring Having Nitrogen And Oxygen As The Only Ring Hetero Atoms (AREA)
SG10201901038UA 2018-02-06 2019-02-07 Tool set for use in position adjustment of positioning pins SG10201901038UA (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2018019032A JP6936161B2 (ja) 2018-02-06 2018-02-06 位置決めピンの位置調整に使用される治具セット

Publications (1)

Publication Number Publication Date
SG10201901038UA true SG10201901038UA (en) 2019-09-27

Family

ID=67475320

Family Applications (1)

Application Number Title Priority Date Filing Date
SG10201901038UA SG10201901038UA (en) 2018-02-06 2019-02-07 Tool set for use in position adjustment of positioning pins

Country Status (3)

Country Link
US (1) US11059137B2 (https=)
JP (1) JP6936161B2 (https=)
SG (1) SG10201901038UA (https=)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6936161B2 (ja) * 2018-02-06 2021-09-15 株式会社荏原製作所 位置決めピンの位置調整に使用される治具セット
USD954567S1 (en) 2019-06-25 2022-06-14 Ebara Corporation Measurement jig
CN113834400B (zh) * 2020-06-23 2022-11-15 长鑫存储技术有限公司 位置检测判断装置、校准装置、方法及系统

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5035062A (en) * 1990-04-06 1991-07-30 Intel Corporation Apparatus and method for aligning automated loading and unloading arms
JP3011401B2 (ja) 1996-08-29 2000-02-21 日本電産リード株式会社 上側治具位置決め機構付きプリント基板検査装置および上側治具位置決め方法
US6032512A (en) * 1998-06-02 2000-03-07 Taiwan Semiconductor Manufacturing Co. Ltd. Wafer centering device and method of using
JPH11354619A (ja) * 1998-06-08 1999-12-24 Dainippon Screen Mfg Co Ltd 基板処理装置および基板処理装置における基板搬送アームの位置決め方法
US6146463A (en) * 1998-06-12 2000-11-14 Applied Materials, Inc. Apparatus and method for aligning a substrate on a support member
US6463782B1 (en) * 2000-01-13 2002-10-15 Taiwan Semiconductor Manufacturing Co., Ltd. Self-centering calibration tool and method of calibrating
US20030051364A1 (en) * 2001-08-14 2003-03-20 Bernardo Donoso Method and apparatus for positioning a wafer chuck
US6530157B1 (en) * 2001-09-04 2003-03-11 Process Integration Precise positioning device for workpieces
JP2003297894A (ja) * 2002-03-18 2003-10-17 Nissin Electric Co Ltd 基板保持機構の製造方法
JP4574561B2 (ja) * 2006-01-24 2010-11-04 信越半導体株式会社 半導体ウエーハと外周リングとの位置合せ用治具及び半導体ウエーハのプラズマエッチング方法
US9146090B2 (en) * 2013-11-14 2015-09-29 Globalfoundries Inc. Nozzle alignment tool for a fluid dispensing apparatus
JP6936161B2 (ja) * 2018-02-06 2021-09-15 株式会社荏原製作所 位置決めピンの位置調整に使用される治具セット

Also Published As

Publication number Publication date
US11059137B2 (en) 2021-07-13
US20190240794A1 (en) 2019-08-08
JP6936161B2 (ja) 2021-09-15
JP2019136778A (ja) 2019-08-22

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