SG10201801393SA - Semiconductor ingot inspecting method and apparatus, and laser processing apparatus - Google Patents
Semiconductor ingot inspecting method and apparatus, and laser processing apparatusInfo
- Publication number
- SG10201801393SA SG10201801393SA SG10201801393SA SG10201801393SA SG10201801393SA SG 10201801393S A SG10201801393S A SG 10201801393SA SG 10201801393S A SG10201801393S A SG 10201801393SA SG 10201801393S A SG10201801393S A SG 10201801393SA SG 10201801393S A SG10201801393S A SG 10201801393SA
- Authority
- SG
- Singapore
- Prior art keywords
- ingot
- light
- inspecting method
- projected image
- laser processing
- Prior art date
Links
- 238000000034 method Methods 0.000 title abstract 4
- 239000004065 semiconductor Substances 0.000 title abstract 3
- 230000015572 biosynthetic process Effects 0.000 abstract 1
- 238000003384 imaging method Methods 0.000 abstract 1
- 238000000926 separation method Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/10—Measuring as part of the manufacturing process
- H01L22/12—Measuring as part of the manufacturing process for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/03—Observing, e.g. monitoring, the workpiece
- B23K26/032—Observing, e.g. monitoring, the workpiece using optical means
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/06—Shaping the laser beam, e.g. by masks or multi-focusing
- B23K26/062—Shaping the laser beam, e.g. by masks or multi-focusing by direct control of the laser beam
- B23K26/0622—Shaping the laser beam, e.g. by masks or multi-focusing by direct control of the laser beam by shaping pulses
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/08—Devices involving relative movement between laser beam and workpiece
- B23K26/082—Scanning systems, i.e. devices involving movement of the laser beam relative to the laser head
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/36—Removing material
- B23K26/38—Removing material by boring or cutting
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/50—Working by transmitting the laser beam through or within the workpiece
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/50—Working by transmitting the laser beam through or within the workpiece
- B23K26/53—Working by transmitting the laser beam through or within the workpiece for modifying or reforming the material inside the workpiece, e.g. for producing break initiation cracks
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K31/00—Processes relevant to this subclass, specially adapted for particular articles or purposes, but not covered by only one of the preceding main groups
- B23K31/12—Processes relevant to this subclass, specially adapted for particular articles or purposes, but not covered by only one of the preceding main groups relating to investigating the properties, e.g. the weldability, of materials
- B23K31/125—Weld quality monitoring
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/36—Carbides
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/40—AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
- C30B29/403—AIII-nitrides
- C30B29/406—Gallium nitride
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B33/00—After-treatment of single crystals or homogeneous polycrystalline material with defined structure
- C30B33/02—Heat treatment
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/08—Mirrors
- G02B5/10—Mirrors with curved faces
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02002—Preparing wafers
- H01L21/02005—Preparing bulk and homogeneous wafers
- H01L21/02008—Multistep processes
- H01L21/0201—Specific process step
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/26—Bombardment with radiation
- H01L21/263—Bombardment with radiation with high-energy radiation
- H01L21/268—Bombardment with radiation with high-energy radiation using electromagnetic radiation, e.g. laser radiation
- H01L21/2686—Bombardment with radiation with high-energy radiation using electromagnetic radiation, e.g. laser radiation using incoherent radiation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/20—Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
- H01L22/24—Optical enhancement of defects or not directly visible states, e.g. selective electrolytic deposition, bubbles in liquids, light emission, colour change
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K2103/00—Materials to be soldered, welded or cut
- B23K2103/50—Inorganic material, e.g. metals, not provided for in B23K2103/02 – B23K2103/26
- B23K2103/56—Inorganic material, e.g. metals, not provided for in B23K2103/02 – B23K2103/26 semiconducting
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/611—Specific applications or type of materials patterned objects; electronic devices
- G01N2223/6116—Specific applications or type of materials patterned objects; electronic devices semiconductor wafer
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Mechanical Engineering (AREA)
- Plasma & Fusion (AREA)
- Manufacturing & Machinery (AREA)
- Metallurgy (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
- Oil, Petroleum & Natural Gas (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Inorganic Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- High Energy & Nuclear Physics (AREA)
- Thermal Sciences (AREA)
- Quality & Reliability (AREA)
- Analytical Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Signal Processing (AREA)
- Life Sciences & Earth Sciences (AREA)
- Pathology (AREA)
- Biochemistry (AREA)
- Immunology (AREA)
- Toxicology (AREA)
- Electromagnetism (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Laser Beam Processing (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Processing Of Stones Or Stones Resemblance Materials (AREA)
Abstract
SEMICONDUCTOR INGOT INSPECTING METHOD AND APPARATUS, AND LASER PROCESSING APPARATUS Disclosed herein is an inspecting method for a semiconductor ingot in which modified layers parallel to an upper surface of the ingot and cracks extending from each modified layer are previously formed as a separation start point. The inspecting method includes a light applying step of applying light from a light source to the upper surface of the ingot, the light impinging on the upper surface at a predetermined incidence angle, a projected image forming step of reflecting the light on the upper surface of the ingot to obtain reflected light and then forming a projected image from the reflected light, the projected image showing the emphasis of asperities generated on the upper surface of the ingot due to the formation of the modified layers and the cracks inside the ingot, an imaging step of detecting the projected image to form a detected image, and a determining step of comparing the detected image with preset conditions to determine the condition of the modified layers and the cracks. [Figure 8]
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017038435A JP6797481B2 (en) | 2017-03-01 | 2017-03-01 | Semiconductor ingot inspection method, inspection equipment and laser processing equipment |
Publications (1)
Publication Number | Publication Date |
---|---|
SG10201801393SA true SG10201801393SA (en) | 2018-10-30 |
Family
ID=63170904
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG10201801393SA SG10201801393SA (en) | 2017-03-01 | 2018-02-21 | Semiconductor ingot inspecting method and apparatus, and laser processing apparatus |
Country Status (8)
Country | Link |
---|---|
US (1) | US20180254223A1 (en) |
JP (1) | JP6797481B2 (en) |
KR (1) | KR102298614B1 (en) |
CN (1) | CN108538740B (en) |
DE (1) | DE102018202984B4 (en) |
MY (1) | MY197791A (en) |
SG (1) | SG10201801393SA (en) |
TW (1) | TWI762571B (en) |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2017163515A1 (en) * | 2016-03-24 | 2017-09-28 | ソニー株式会社 | Information processing system, information processing device, information processing method, and recording medium |
JP7128067B2 (en) * | 2018-09-14 | 2022-08-30 | 株式会社ディスコ | WAFER PRODUCTION METHOD AND LASER PROCESSING APPARATUS |
WO2020090902A1 (en) * | 2018-10-30 | 2020-05-07 | 浜松ホトニクス株式会社 | Laser machining device and laser machining method |
JP7285067B2 (en) * | 2018-10-30 | 2023-06-01 | 浜松ホトニクス株式会社 | LASER PROCESSING APPARATUS AND LASER PROCESSING METHOD |
US11897056B2 (en) | 2018-10-30 | 2024-02-13 | Hamamatsu Photonics K.K. | Laser processing device and laser processing method |
CN109308707B (en) * | 2018-11-09 | 2021-08-24 | 河北工业大学 | Non-contact type online measuring method for thickness of aluminum ingot |
US10562130B1 (en) | 2018-12-29 | 2020-02-18 | Cree, Inc. | Laser-assisted method for parting crystalline material |
US10576585B1 (en) | 2018-12-29 | 2020-03-03 | Cree, Inc. | Laser-assisted method for parting crystalline material |
US11024501B2 (en) | 2018-12-29 | 2021-06-01 | Cree, Inc. | Carrier-assisted method for parting crystalline material along laser damage region |
JP7237427B2 (en) * | 2019-05-14 | 2023-03-13 | 株式会社ディスコ | WAFER MANUFACTURING METHOD AND INGOT CUTTING DEVICE |
US10611052B1 (en) | 2019-05-17 | 2020-04-07 | Cree, Inc. | Silicon carbide wafers with relaxed positive bow and related methods |
JP7330771B2 (en) | 2019-06-14 | 2023-08-22 | 株式会社ディスコ | Wafer production method and wafer production apparatus |
JP7321888B2 (en) * | 2019-10-24 | 2023-08-07 | 株式会社ディスコ | SiC ingot processing method and laser processing apparatus |
CN112059422A (en) * | 2020-09-12 | 2020-12-11 | 北京航空航天大学 | Laser processing equipment for grinding semiconductor wafer |
JP2024043868A (en) | 2022-09-20 | 2024-04-02 | 株式会社ディスコ | Workpiece inspection method and inspection device |
CN115971642A (en) * | 2022-12-30 | 2023-04-18 | 山东天岳先进科技股份有限公司 | Silicon carbide stripping sheet based on laser induced cracking and processing method |
CN115821394B (en) * | 2023-01-05 | 2023-05-26 | 西北电子装备技术研究所(中国电子科技集团公司第二研究所) | SiC wafer detection system and detection method thereof |
CN116000458B (en) * | 2023-03-27 | 2023-07-25 | 苏州长光华芯半导体激光创新研究院有限公司 | Semiconductor crystal cleavage device and cleavage method |
Family Cites Families (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5334844A (en) * | 1993-04-05 | 1994-08-02 | Space Systems/Loral, Inc. | Optical illumination and inspection system for wafer and solar cell defects |
JP2897754B2 (en) * | 1997-03-27 | 1999-05-31 | 日本電気株式会社 | Inspection method for semiconductor device |
JPH11281585A (en) * | 1998-03-26 | 1999-10-15 | Nikon Corp | Method and apparatus for inspection |
JP2000009452A (en) | 1998-06-22 | 2000-01-14 | Hitachi Tobu Semiconductor Ltd | Method and apparatus for inspecting surface roughness |
JP2000094221A (en) | 1998-09-24 | 2000-04-04 | Toyo Advanced Technologies Co Ltd | Electric discharge wire saw |
JP4707605B2 (en) * | 2006-05-16 | 2011-06-22 | 三菱電機株式会社 | Image inspection method and image inspection apparatus using the method |
JP4065893B1 (en) * | 2006-12-04 | 2008-03-26 | 東京エレクトロン株式会社 | Defect detection device, defect detection method, information processing device, information processing method, and program thereof |
JP2008216054A (en) * | 2007-03-05 | 2008-09-18 | Hitachi High-Technologies Corp | Device and method for inspecting test object |
WO2008124397A1 (en) * | 2007-04-03 | 2008-10-16 | David Fishbaine | Inspection system and method |
JP2009090387A (en) | 2007-10-04 | 2009-04-30 | Denso Corp | Wire saw device for manufacturing silicon carbide substrate |
JP5131564B2 (en) * | 2007-12-19 | 2013-01-30 | 株式会社東京精密 | Laser dicing apparatus and dicing method |
US7773212B1 (en) * | 2008-05-21 | 2010-08-10 | Kla-Tencor Corporation | Contemporaneous surface and edge inspection |
US8741740B2 (en) | 2008-10-02 | 2014-06-03 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing SOI substrate |
WO2011062279A1 (en) * | 2009-11-20 | 2011-05-26 | 独立行政法人産業技術総合研究所 | Method of examining defects, wafer subjected to defect examination or semiconductor element manufactured using the wafer, quality control method for wafer or semiconductor element, and defect examining device |
KR101519476B1 (en) * | 2010-02-17 | 2015-05-14 | 한미반도체 주식회사 | Ingot Inspection Apparatus and Method for Inspecting an Ingot |
US9279774B2 (en) * | 2011-07-12 | 2016-03-08 | Kla-Tencor Corp. | Wafer inspection |
CN104412098B (en) * | 2012-07-06 | 2018-10-30 | Bt成像股份有限公司 | The method for checking semiconductor wafer |
US20130097727A1 (en) * | 2012-11-08 | 2013-04-18 | Laboratoire ASL | Melon variety nun 96141 me |
JP6395213B2 (en) * | 2014-09-26 | 2018-09-26 | 株式会社Screenホールディングス | MODIFICATION TREATMENT DEVICE AND MODIFICATION TREATMENT METHOD |
JP6399913B2 (en) | 2014-12-04 | 2018-10-03 | 株式会社ディスコ | Wafer generation method |
JP2016111114A (en) | 2014-12-04 | 2016-06-20 | サンデンホールディングス株式会社 | Radio communication device |
JP6395634B2 (en) * | 2015-02-09 | 2018-09-26 | 株式会社ディスコ | Wafer generation method |
KR101716369B1 (en) * | 2015-10-19 | 2017-03-27 | 주식회사 이오테크닉스 | Auto inspection apparatus and method of laser processing apparatus |
-
2017
- 2017-03-01 JP JP2017038435A patent/JP6797481B2/en active Active
-
2018
- 2018-02-05 TW TW107103995A patent/TWI762571B/en active
- 2018-02-15 MY MYPI2018700629A patent/MY197791A/en unknown
- 2018-02-21 SG SG10201801393SA patent/SG10201801393SA/en unknown
- 2018-02-26 CN CN201810159187.8A patent/CN108538740B/en active Active
- 2018-02-28 KR KR1020180024558A patent/KR102298614B1/en active IP Right Grant
- 2018-02-28 DE DE102018202984.9A patent/DE102018202984B4/en active Active
- 2018-02-28 US US15/908,307 patent/US20180254223A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
TWI762571B (en) | 2022-05-01 |
TW201836033A (en) | 2018-10-01 |
CN108538740A (en) | 2018-09-14 |
JP6797481B2 (en) | 2020-12-09 |
US20180254223A1 (en) | 2018-09-06 |
KR102298614B1 (en) | 2021-09-03 |
MY197791A (en) | 2023-07-14 |
CN108538740B (en) | 2024-02-02 |
KR20180100496A (en) | 2018-09-11 |
JP2018147928A (en) | 2018-09-20 |
DE102018202984B4 (en) | 2022-10-06 |
DE102018202984A1 (en) | 2018-09-06 |
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