SG10201709477TA - Imprint apparatus, imprinting method, and method for manufacturing article - Google Patents
Imprint apparatus, imprinting method, and method for manufacturing articleInfo
- Publication number
- SG10201709477TA SG10201709477TA SG10201709477TA SG10201709477TA SG10201709477TA SG 10201709477T A SG10201709477T A SG 10201709477TA SG 10201709477T A SG10201709477T A SG 10201709477TA SG 10201709477T A SG10201709477T A SG 10201709477TA SG 10201709477T A SG10201709477T A SG 10201709477TA
- Authority
- SG
- Singapore
- Prior art keywords
- substrate
- imprint apparatus
- shot area
- manufacturing article
- imprinting
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0002—Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C37/00—Component parts, details, accessories or auxiliary operations, not covered by group B29C33/00 or B29C35/00
- B29C37/0025—Applying surface layers, e.g. coatings, decorative layers, printed layers, to articles during shaping, e.g. in-mould printing
- B29C37/0028—In-mould coating, e.g. by introducing the coating material into the mould after forming the article
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/38—Treatment before imagewise removal, e.g. prebaking
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70091—Illumination settings, i.e. intensity distribution in the pupil plane or angular distribution in the field plane; On-axis or off-axis settings, e.g. annular, dipole or quadrupole settings; Partial coherence control, i.e. sigma or numerical aperture [NA]
- G03F7/70116—Off-axis setting using a programmable means, e.g. liquid crystal display [LCD], digital micromirror device [DMD] or pupil facets
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70141—Illumination system adjustment, e.g. adjustments during exposure or alignment during assembly of illumination system
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70191—Optical correction elements, filters or phase plates for controlling intensity, wavelength, polarisation, phase or the like
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70208—Multiple illumination paths, e.g. radiation distribution devices, microlens illumination systems, multiplexers or demultiplexers for single or multiple projection systems
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70258—Projection system adjustments, e.g. adjustments during exposure or alignment during assembly of projection system
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C37/00—Component parts, details, accessories or auxiliary operations, not covered by group B29C33/00 or B29C35/00
- B29C37/0025—Applying surface layers, e.g. coatings, decorative layers, printed layers, to articles during shaping, e.g. in-mould printing
- B29C37/0028—In-mould coating, e.g. by introducing the coating material into the mould after forming the article
- B29C2037/0046—In-mould printing, in-mould transfer printing
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
Abstract
IMPRINT APPARATUS, IMPRINTING METHOD, AND METHOD FOR MANUFACTURING ARTICLE An imprint apparatus forms a pattern of an imprint material in a shot area of the substrate using the mold, and includes a heating mechanism that changes a shape of the substrate by irradiating the shot area of the substrate with light, wherein the heating mechanism includes a plurality of optical modulators that forms an illuminance distribution in the shot area of the substrate, and light beams from the plurality of optical modulators illuminate mutually different areas of the shot area. (Figure 1)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016233247A JP6827785B2 (en) | 2016-11-30 | 2016-11-30 | Imprinting equipment, imprinting methods, and manufacturing methods for articles |
Publications (1)
Publication Number | Publication Date |
---|---|
SG10201709477TA true SG10201709477TA (en) | 2018-06-28 |
Family
ID=62190802
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG10201709477TA SG10201709477TA (en) | 2016-11-30 | 2017-11-17 | Imprint apparatus, imprinting method, and method for manufacturing article |
Country Status (6)
Country | Link |
---|---|
US (1) | US11204548B2 (en) |
JP (1) | JP6827785B2 (en) |
KR (1) | KR102282089B1 (en) |
CN (1) | CN108121155B (en) |
SG (1) | SG10201709477TA (en) |
TW (1) | TWI668734B (en) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP3620856A1 (en) * | 2018-09-10 | 2020-03-11 | Canon Kabushiki Kaisha | Imprint method and article manufacturing method |
JP7289633B2 (en) * | 2018-11-08 | 2023-06-12 | キヤノン株式会社 | Imprint apparatus and article manufacturing method |
EP3650937A1 (en) * | 2018-11-08 | 2020-05-13 | Canon Kabushiki Kaisha | Imprint apparatus and product manufacturing method |
JP7267801B2 (en) * | 2019-03-26 | 2023-05-02 | キヤノン株式会社 | IMPRINT APPARATUS, IMPRINT METHOD, AND ARTICLE MANUFACTURING METHOD |
JP7379091B2 (en) * | 2019-10-30 | 2023-11-14 | キヤノン株式会社 | Imprint device, imprint method, and article manufacturing method |
US11747731B2 (en) * | 2020-11-20 | 2023-09-05 | Canon Kabishiki Kaisha | Curing a shaped film using multiple images of a spatial light modulator |
Family Cites Families (28)
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JP3528364B2 (en) | 1995-10-18 | 2004-05-17 | ソニー株式会社 | Laser beam synthesizing apparatus, synthesizing method, laser engraving apparatus, and laser engraving method |
JP2002122945A (en) | 2000-10-18 | 2002-04-26 | Noritsu Koki Co Ltd | Digital exposure device and photographic processing device having the same |
TW529172B (en) * | 2001-07-24 | 2003-04-21 | Asml Netherlands Bv | Imaging apparatus |
US7153616B2 (en) * | 2004-03-31 | 2006-12-26 | Asml Holding N.V. | System and method for verifying and controlling the performance of a maskless lithography tool |
JP4958614B2 (en) * | 2006-04-18 | 2012-06-20 | キヤノン株式会社 | Pattern transfer apparatus, imprint apparatus, pattern transfer method, and alignment apparatus |
EP2037488A4 (en) * | 2006-06-09 | 2011-11-23 | Nikon Corp | Pattern formation method, pattern formation device, exposure method, exposure device, and device manufacturing method |
KR101360160B1 (en) | 2006-11-22 | 2014-02-12 | 엘아이지에이디피 주식회사 | Apparatus for forming a nano-pattern and method using the same |
DE102008016011A1 (en) | 2007-03-27 | 2008-10-02 | Carl Zeiss Smt Ag | Correction of optical elements by means of flatly irradiated correction light |
JPWO2009153925A1 (en) * | 2008-06-17 | 2011-11-24 | 株式会社ニコン | Nanoimprint method and apparatus |
US8345242B2 (en) * | 2008-10-28 | 2013-01-01 | Molecular Imprints, Inc. | Optical system for use in stage control |
JP2011248327A (en) * | 2010-04-27 | 2011-12-08 | Panasonic Corp | Illumination device and projection type display apparatus provided therewith |
CN102696157B (en) | 2010-07-30 | 2014-03-05 | 索尼公司 | Light source unit, illumination device, and display device |
JP5713961B2 (en) | 2011-06-21 | 2015-05-07 | キヤノン株式会社 | Position detection apparatus, imprint apparatus, and position detection method |
JP5932286B2 (en) * | 2011-10-14 | 2016-06-08 | キヤノン株式会社 | Imprint apparatus and article manufacturing method using the same |
JP5686779B2 (en) * | 2011-10-14 | 2015-03-18 | キヤノン株式会社 | Imprint apparatus and article manufacturing method using the same |
JP2013175604A (en) | 2012-02-24 | 2013-09-05 | Toshiba Corp | Pattern forming device, pattern forming method, and method for manufacturing semiconductor device |
JP6076618B2 (en) | 2012-05-14 | 2017-02-08 | アストロデザイン株式会社 | Optical resolution improvement device |
CN103962079B (en) * | 2013-01-28 | 2017-11-17 | 西门子公司 | Heater and the equipment for chemically reacting |
JP6236095B2 (en) * | 2013-03-13 | 2017-11-22 | カール・ツァイス・エスエムティー・ゲーエムベーハー | Microlithography equipment |
JP6418773B2 (en) | 2013-05-14 | 2018-11-07 | キヤノン株式会社 | Imprint apparatus, imprint method, and article manufacturing method |
JP2015005676A (en) * | 2013-06-22 | 2015-01-08 | 株式会社ニコン | Illuminating optical system, illuminating optical device, exposure device, and device manufacturing method |
JP6329353B2 (en) | 2013-10-01 | 2018-05-23 | キヤノン株式会社 | Imprint apparatus and article manufacturing method |
JP6336275B2 (en) * | 2013-12-26 | 2018-06-06 | キヤノン株式会社 | Imprint apparatus and article manufacturing method |
JP6294680B2 (en) * | 2014-01-24 | 2018-03-14 | キヤノン株式会社 | Imprint apparatus and article manufacturing method |
US9946166B2 (en) * | 2014-05-02 | 2018-04-17 | Asml Netherlands B.V. | Reduction of hotspots of dense features |
JP2016042498A (en) * | 2014-08-13 | 2016-03-31 | キヤノン株式会社 | Imprint device and goods production method |
US20170210036A1 (en) * | 2016-01-22 | 2017-07-27 | Canon Kabushiki Kaisha | Mold replicating method, imprint apparatus, and article manufacturing method |
US11175598B2 (en) * | 2017-06-30 | 2021-11-16 | Canon Kabushiki Kaisha | Imprint apparatus and method of manufacturing article |
-
2016
- 2016-11-30 JP JP2016233247A patent/JP6827785B2/en active Active
-
2017
- 2017-11-17 SG SG10201709477TA patent/SG10201709477TA/en unknown
- 2017-11-23 TW TW106140698A patent/TWI668734B/en active
- 2017-11-27 US US15/823,338 patent/US11204548B2/en active Active
- 2017-11-29 KR KR1020170161314A patent/KR102282089B1/en active IP Right Grant
- 2017-11-30 CN CN201711231748.2A patent/CN108121155B/en active Active
Also Published As
Publication number | Publication date |
---|---|
US11204548B2 (en) | 2021-12-21 |
TWI668734B (en) | 2019-08-11 |
CN108121155A (en) | 2018-06-05 |
JP6827785B2 (en) | 2021-02-10 |
KR102282089B1 (en) | 2021-07-27 |
CN108121155B (en) | 2022-06-03 |
KR20180062391A (en) | 2018-06-08 |
US20180149969A1 (en) | 2018-05-31 |
TW201822250A (en) | 2018-06-16 |
JP2018092997A (en) | 2018-06-14 |
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