SG10201609520XA - Method and apparatus for generating mid-ir laser for ultrasound inspection - Google Patents

Method and apparatus for generating mid-ir laser for ultrasound inspection

Info

Publication number
SG10201609520XA
SG10201609520XA SG10201609520XA SG10201609520XA SG10201609520XA SG 10201609520X A SG10201609520X A SG 10201609520XA SG 10201609520X A SG10201609520X A SG 10201609520XA SG 10201609520X A SG10201609520X A SG 10201609520XA SG 10201609520X A SG10201609520X A SG 10201609520XA
Authority
SG
Singapore
Prior art keywords
laser
ultrasound inspection
generating mid
mid
generating
Prior art date
Application number
SG10201609520XA
Other languages
English (en)
Inventor
Thomas E Drake Jr
Peter W Lorraine
John B Deaton Jr
Marc Dubois
Robert Filkins
Original Assignee
Lockheed Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lockheed Corp filed Critical Lockheed Corp
Publication of SG10201609520XA publication Critical patent/SG10201609520XA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1702—Systems in which incident light is modified in accordance with the properties of the material investigated with opto-acoustic detection, e.g. for gases or analysing solids
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/12—Analysing solids by measuring frequency or resonance of acoustic waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/24—Probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/24—Probes
    • G01N29/2418—Probes using optoacoustic interaction with the material, e.g. laser radiation, photoacoustics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/34—Generating the ultrasonic, sonic or infrasonic waves, e.g. electronic circuits specially adapted therefor
    • G01N29/348—Generating the ultrasonic, sonic or infrasonic waves, e.g. electronic circuits specially adapted therefor with frequency characteristics, e.g. single frequency signals, chirp signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1702—Systems in which incident light is modified in accordance with the properties of the material investigated with opto-acoustic detection, e.g. for gases or analysing solids
    • G01N2021/1706—Systems in which incident light is modified in accordance with the properties of the material investigated with opto-acoustic detection, e.g. for gases or analysing solids in solids
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N2021/8472—Investigation of composite materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/023—Solids

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Acoustics & Sound (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
SG10201609520XA 2008-05-15 2009-05-14 Method and apparatus for generating mid-ir laser for ultrasound inspection SG10201609520XA (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US12/120,823 US7821646B2 (en) 2008-05-15 2008-05-15 Method and apparatus for generating mid-IR laser beam for ultrasound inspection

Publications (1)

Publication Number Publication Date
SG10201609520XA true SG10201609520XA (en) 2016-12-29

Family

ID=40873363

Family Applications (1)

Application Number Title Priority Date Filing Date
SG10201609520XA SG10201609520XA (en) 2008-05-15 2009-05-14 Method and apparatus for generating mid-ir laser for ultrasound inspection

Country Status (11)

Country Link
US (1) US7821646B2 (ko)
EP (1) EP2283340A1 (ko)
JP (1) JP5520933B2 (ko)
KR (2) KR101662334B1 (ko)
CN (2) CN102089642A (ko)
BR (1) BRPI0912675A2 (ko)
CA (1) CA2724314C (ko)
IL (1) IL209291A (ko)
SG (1) SG10201609520XA (ko)
TW (1) TWI472758B (ko)
WO (1) WO2009140458A1 (ko)

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DE102009043700B4 (de) * 2009-10-01 2013-11-07 Eads Deutschland Gmbh Laser-Ultraschall-Messvorrichtung
JP6841609B2 (ja) 2015-07-10 2021-03-10 ３スキャン インコーポレイテッド 組織学的染色の空間的多重化
JP6739836B2 (ja) * 2016-06-01 2020-08-12 国立研究開発法人物質・材料研究機構 レーザおよびそれを用いたレーザ超音波探傷装置
CN105938087B (zh) * 2016-06-29 2018-10-30 华南理工大学 一种基于多轴飞行器的激光超声检测系统与方法
JP2023115856A (ja) 2022-02-08 2023-08-21 本田技研工業株式会社 車両用前照灯装置
JP2023115852A (ja) * 2022-02-08 2023-08-21 本田技研工業株式会社 車両用前照灯装置
US20230375708A1 (en) * 2022-05-17 2023-11-23 Northrop Grumman Systems Corporation Quantum lidar system

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US5355247A (en) * 1993-03-30 1994-10-11 The Board Of Trustees Of The Leland Stanford, Jr. University Method using a monolithic crystalline material for producing radiation by quasi-phase-matching, diffusion bonded monolithic crystalline material for quasi-phase-matching, and method for fabricating same
US5400173A (en) * 1994-01-14 1995-03-21 Northrop Grumman Corporation Tunable mid-infrared wavelength converter using cascaded parametric oscillators
US5640405A (en) * 1996-02-01 1997-06-17 Lighthouse Electronics Corporation Multi quasi phase matched interactions in a non-linear crystal
JP3465478B2 (ja) * 1996-04-30 2003-11-10 理化学研究所 光パラメトリック発振装置
US5911389A (en) * 1996-12-20 1999-06-15 Lockheed Martin Corp. Wave based satellite constellation
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US6094447A (en) * 1998-06-12 2000-07-25 Lockheed Martin Corporation System and method for reducing wavefront distortion in high-gain diode-pumped laser media
US6643002B2 (en) * 2000-07-14 2003-11-04 Lockheed Martin Corporation System and method for locating and positioning an ultrasonic signal generator for testing purposes
US6122060A (en) * 1998-06-30 2000-09-19 Lockheed Martin Corporation Method and apparatus for detecting ultrasonic surface displacements using post-collection optical amplification
US6657733B1 (en) * 1998-06-30 2003-12-02 Lockheed Martin Corporation Method and apparatus for detecting ultrasonic surface displacements using post-collection optical amplification
US6633384B1 (en) * 1998-06-30 2003-10-14 Lockheed Martin Corporation Method and apparatus for ultrasonic laser testing
US6016214A (en) * 1998-09-11 2000-01-18 Northrop Grumman Corporation Quadruple grating period PPLN optical parametric oscillator difference frequency generator with common doubly resonant cavity
WO2000020841A1 (en) * 1998-10-05 2000-04-13 Kla-Tencor Corporation Interferometric system for measurement disturbance of a sample
US7286241B2 (en) * 1999-06-24 2007-10-23 Lockheed Martin Corporation System and method for high-speed laser detection of ultrasound
US6483859B1 (en) * 1999-06-24 2002-11-19 Lockheed Martin Corporation System and method for high-speed laser detection of ultrasound
US6176135B1 (en) * 1999-07-27 2001-01-23 Marc Dubois System and method for laser-ultrasonic frequency control using optimal wavelength tuning
US6335943B1 (en) * 1999-07-27 2002-01-01 Lockheed Martin Corporation System and method for ultrasonic laser testing using a laser source to generate ultrasound having a tunable wavelength
JP4789394B2 (ja) * 2000-07-14 2011-10-12 ロッキード マーティン コーポレイション 超音波を用いて複合材料の気孔度を検出するシステムと方法
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Also Published As

Publication number Publication date
KR20160075852A (ko) 2016-06-29
WO2009140458A1 (en) 2009-11-19
CA2724314C (en) 2013-11-26
CN106226401A (zh) 2016-12-14
US7821646B2 (en) 2010-10-26
EP2283340A1 (en) 2011-02-16
KR20110010111A (ko) 2011-01-31
CN102089642A (zh) 2011-06-08
US20090284751A1 (en) 2009-11-19
CA2724314A1 (en) 2009-11-19
IL209291A (en) 2013-03-24
TW200951433A (en) 2009-12-16
AU2009246358A1 (en) 2009-11-19
TWI472758B (zh) 2015-02-11
JP5520933B2 (ja) 2014-06-11
IL209291A0 (en) 2011-01-31
KR101662334B1 (ko) 2016-10-04
BRPI0912675A2 (pt) 2016-01-26
JP2011521230A (ja) 2011-07-21

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