SG10201402805UA - Inactive gas supply facility and inactive gas supply method - Google Patents

Inactive gas supply facility and inactive gas supply method

Info

Publication number
SG10201402805UA
SG10201402805UA SG10201402805UA SG10201402805UA SG10201402805UA SG 10201402805U A SG10201402805U A SG 10201402805UA SG 10201402805U A SG10201402805U A SG 10201402805UA SG 10201402805U A SG10201402805U A SG 10201402805UA SG 10201402805U A SG10201402805U A SG 10201402805UA
Authority
SG
Singapore
Prior art keywords
gas supply
inactive gas
control device
processing
facility
Prior art date
Application number
SG10201402805UA
Inventor
Shin Takeshi
Nishikawa Tadashi
Takahara Masahiro
Ueda Toshihito
Original Assignee
Daifuku Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Daifuku Kk filed Critical Daifuku Kk
Publication of SG10201402805UA publication Critical patent/SG10201402805UA/en

Links

Classifications

    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F17STORING OR DISTRIBUTING GASES OR LIQUIDS
    • F17CVESSELS FOR CONTAINING OR STORING COMPRESSED, LIQUEFIED OR SOLIDIFIED GASES; FIXED-CAPACITY GAS-HOLDERS; FILLING VESSELS WITH, OR DISCHARGING FROM VESSELS, COMPRESSED, LIQUEFIED, OR SOLIDIFIED GASES
    • F17C5/00Methods or apparatus for filling containers with liquefied, solidified, or compressed gases under pressures
    • F17C5/002Automated filling apparatus
    • F17C5/007Automated filling apparatus for individual gas tanks or containers, e.g. in vehicles
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B9/00Cleaning hollow articles by methods or apparatus specially adapted thereto 
    • B08B9/08Cleaning containers, e.g. tanks
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/673Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
    • H01L21/6735Closed carriers
    • H01L21/67389Closed carriers characterised by atmosphere control
    • H01L21/67393Closed carriers characterised by atmosphere control characterised by the presence of atmosphere modifying elements inside or attached to the closed carrierl
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67763Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
    • H01L21/67769Storage means
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F17STORING OR DISTRIBUTING GASES OR LIQUIDS
    • F17CVESSELS FOR CONTAINING OR STORING COMPRESSED, LIQUEFIED OR SOLIDIFIED GASES; FIXED-CAPACITY GAS-HOLDERS; FILLING VESSELS WITH, OR DISCHARGING FROM VESSELS, COMPRESSED, LIQUEFIED, OR SOLIDIFIED GASES
    • F17C2227/00Transfer of fluids, i.e. method or means for transferring the fluid; Heat exchange with the fluid
    • F17C2227/04Methods for emptying or filling
    • F17C2227/047Methods for emptying or filling by repeating a process cycle
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F17STORING OR DISTRIBUTING GASES OR LIQUIDS
    • F17CVESSELS FOR CONTAINING OR STORING COMPRESSED, LIQUEFIED OR SOLIDIFIED GASES; FIXED-CAPACITY GAS-HOLDERS; FILLING VESSELS WITH, OR DISCHARGING FROM VESSELS, COMPRESSED, LIQUEFIED, OR SOLIDIFIED GASES
    • F17C2250/00Accessories; Control means; Indicating, measuring or monitoring of parameters
    • F17C2250/03Control means
    • F17C2250/034Control means using wireless transmissions
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F17STORING OR DISTRIBUTING GASES OR LIQUIDS
    • F17CVESSELS FOR CONTAINING OR STORING COMPRESSED, LIQUEFIED OR SOLIDIFIED GASES; FIXED-CAPACITY GAS-HOLDERS; FILLING VESSELS WITH, OR DISCHARGING FROM VESSELS, COMPRESSED, LIQUEFIED, OR SOLIDIFIED GASES
    • F17C2250/00Accessories; Control means; Indicating, measuring or monitoring of parameters
    • F17C2250/04Indicating or measuring of parameters as input values
    • F17C2250/0404Parameters indicated or measured
    • F17C2250/0443Flow or movement of content
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F17STORING OR DISTRIBUTING GASES OR LIQUIDS
    • F17CVESSELS FOR CONTAINING OR STORING COMPRESSED, LIQUEFIED OR SOLIDIFIED GASES; FIXED-CAPACITY GAS-HOLDERS; FILLING VESSELS WITH, OR DISCHARGING FROM VESSELS, COMPRESSED, LIQUEFIED, OR SOLIDIFIED GASES
    • F17C2270/00Applications
    • F17C2270/05Applications for industrial use
    • F17C2270/0518Semiconductors

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Mechanical Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Warehouses Or Storage Devices (AREA)
  • Filling Or Discharging Of Gas Storage Vessels (AREA)
  • Packages (AREA)
  • Pipeline Systems (AREA)

Abstract

40 INACTIVE GAS SUPPLY FACILITY AND INACTIVE GAS SUPPLY A first control device executes, if it is determined that a second 5 control device has become unable to output an operation instruction, continued operation processing for operating an inactive gas supply portion based on the operation instruction that was last output by the second control device. The first control device further executes, if it is determined during execution of continued operation processing that a stop condition is satisfied, 10 operation stop processing for stopping the inactive gas supply portion by suspending the continued operation processing. Fig. 9
SG10201402805UA 2013-06-26 2014-06-02 Inactive gas supply facility and inactive gas supply method SG10201402805UA (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013134271A JP5874691B2 (en) 2013-06-26 2013-06-26 Inert gas supply equipment

Publications (1)

Publication Number Publication Date
SG10201402805UA true SG10201402805UA (en) 2015-01-29

Family

ID=52114441

Family Applications (1)

Application Number Title Priority Date Filing Date
SG10201402805UA SG10201402805UA (en) 2013-06-26 2014-06-02 Inactive gas supply facility and inactive gas supply method

Country Status (6)

Country Link
US (1) US9822929B2 (en)
JP (1) JP5874691B2 (en)
KR (1) KR102204816B1 (en)
CN (1) CN104253068B (en)
SG (1) SG10201402805UA (en)
TW (1) TWI625813B (en)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104937709B (en) * 2013-03-05 2017-05-31 村田机械株式会社 The flow-measuring method of measuring unit and purification gas
KR101903441B1 (en) * 2014-06-16 2018-10-02 무라다기카이가부시끼가이샤 Purge device, purge system, purge method, and control method in purge system
US9550219B2 (en) * 2014-12-29 2017-01-24 Daifuku Co., Ltd. Apparatus of inhalation type for stocking wafer at ceiling and inhaling type wafer stocking system having the same
JP6451453B2 (en) * 2015-03-31 2019-01-16 Tdk株式会社 GAS PURGE DEVICE, LOAD PORT DEVICE, PURGE CONTAINER CONTAINER STAND, AND GAS PURGE METHOD
JP6554872B2 (en) * 2015-03-31 2019-08-07 Tdk株式会社 GAS PURGE DEVICE, LOAD PORT DEVICE, PURGE CONTAINER CONTAINER STAND, AND GAS PURGE METHOD
US10586721B2 (en) * 2015-08-25 2020-03-10 Murata Machinery, Ltd. Purge device, purge stocker, and purge method
JP6414525B2 (en) * 2015-09-02 2018-10-31 株式会社ダイフク Storage facilities
US10855971B2 (en) * 2015-09-16 2020-12-01 HashD, Inc. Systems and methods of creating a three-dimensional virtual image
JP6455404B2 (en) 2015-11-17 2019-01-23 株式会社ダイフク Container transfer equipment
JP6551240B2 (en) * 2016-01-06 2019-07-31 株式会社ダイフク Article storage rack and article storage facility provided with the same
JP6460015B2 (en) * 2016-03-07 2019-01-30 株式会社ダイフク Container transfer equipment
JP6610476B2 (en) * 2016-09-09 2019-11-27 株式会社ダイフク Container storage equipment
SG11201906971VA (en) * 2017-02-07 2019-08-27 Murata Machinery Ltd Stocker
KR101988361B1 (en) * 2017-06-15 2019-06-12 버슘머트리얼즈 유에스, 엘엘씨 Gas Supply System
US10703563B2 (en) * 2017-11-10 2020-07-07 Taiwan Semiconductor Manufacturing Co., Ltd. Stocker
JP6856015B2 (en) * 2017-12-20 2021-04-14 株式会社ダイフク Storage equipment
KR20200022682A (en) * 2018-08-23 2020-03-04 세메스 주식회사 Buffer unit, Apparatus and Method for treating substrate with the unit
JP7501497B2 (en) 2021-11-10 2024-06-18 株式会社ダイフク Container storage facilities
JP7501498B2 (en) 2021-11-10 2024-06-18 株式会社ダイフク Container storage facilities

Family Cites Families (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09153533A (en) * 1995-12-01 1997-06-10 Mitsubishi Electric Corp Semiconductor wafer storage system and semiconductor device manufacturing system using the same
JPH10321714A (en) * 1997-05-20 1998-12-04 Sony Corp Airtight container and airtight container atmosphere replacer and atmosphere replacing method
JP3866840B2 (en) * 1997-10-28 2007-01-10 三機工業株式会社 Inert gas supply equipment
US5988233A (en) * 1998-03-27 1999-11-23 Asyst Technologies, Inc. Evacuation-driven SMIF pod purge system
JP2000315107A (en) * 1999-05-06 2000-11-14 Mitsubishi Electric Corp Process progress management device and its method
JP4181283B2 (en) * 1999-09-29 2008-11-12 株式会社日立製作所 Failure detection notification method and internetwork apparatus
JP2003092345A (en) * 2001-07-13 2003-03-28 Semiconductor Leading Edge Technologies Inc Substrate container, substrate transport system, storage device and gas substituting method
JP3880343B2 (en) * 2001-08-01 2007-02-14 株式会社ルネサステクノロジ Load port, substrate processing apparatus, and atmosphere replacement method
JP4136451B2 (en) * 2002-05-22 2008-08-20 富士通株式会社 BIST circuit
JP4027837B2 (en) * 2003-04-28 2007-12-26 Tdk株式会社 Purge apparatus and purge method
JP2005019911A (en) * 2003-06-30 2005-01-20 Trecenti Technologies Inc Process progress control system and manufacturing method for semiconductor device
JP2006040122A (en) * 2004-07-29 2006-02-09 Toyoda Mach Works Ltd Programmable controller
JP3983254B2 (en) * 2005-06-24 2007-09-26 Tdk株式会社 Purge system for product container and stand provided for the purge system
JP4776374B2 (en) * 2005-12-27 2011-09-21 株式会社東芝 Redundant supervisory control system and redundant switching method for the same system
JP2007226711A (en) * 2006-02-27 2007-09-06 Hitachi Ltd Integrated circuit device, method of diagnosing integrated circuit device, and diagnostic circuit
JP4670808B2 (en) * 2006-12-22 2011-04-13 ムラテックオートメーション株式会社 Container transport system and measuring container
JP4577663B2 (en) * 2008-03-04 2010-11-10 Tdk株式会社 Purge control device and load boat device including the same
JP5256810B2 (en) * 2008-03-24 2013-08-07 村田機械株式会社 Storage system and transport system with storage
JP4692584B2 (en) 2008-07-03 2011-06-01 村田機械株式会社 Purge device
JP5236518B2 (en) * 2009-02-03 2013-07-17 株式会社ダン・タクマ Storage system and storage method
US9212786B2 (en) * 2009-06-30 2015-12-15 Roylan Developments Limited Apparatus for purging containers for storing sensitive materials
JP5404437B2 (en) * 2010-01-13 2014-01-29 株式会社東芝 Safety output device
JP5608409B2 (en) * 2010-04-23 2014-10-15 ルネサスエレクトロニクス株式会社 Self-diagnosis system and test circuit determination method
CN102933472A (en) * 2010-06-10 2013-02-13 村田机械株式会社 Conveyance system and method of communication in conveyance system
JP5440871B2 (en) * 2010-08-20 2014-03-12 株式会社ダイフク Container storage equipment
JP5494734B2 (en) * 2011-08-15 2014-05-21 Tdk株式会社 Purge device and load port device having the purge device
JP2013042062A (en) * 2011-08-19 2013-02-28 Hitachi Kokusai Electric Inc Substrate processing apparatus and semiconductor device manufacturing method
JP6087161B2 (en) * 2012-02-03 2017-03-01 東京エレクトロン株式会社 Method for purging substrate container
CN104603032B (en) * 2012-08-21 2016-12-07 村田机械株式会社 Possess the accumulator of cleaning function, accumulator unit and the supply method of clean gas
US9257320B2 (en) * 2013-06-05 2016-02-09 GlobalFoundries, Inc. Wafer carrier purge apparatuses, automated mechanical handling systems including the same, and methods of handling a wafer carrier during integrated circuit fabrication

Also Published As

Publication number Publication date
JP5874691B2 (en) 2016-03-02
JP2015012042A (en) 2015-01-19
TW201508854A (en) 2015-03-01
CN104253068B (en) 2018-09-07
TWI625813B (en) 2018-06-01
KR102204816B1 (en) 2021-01-18
US20150000785A1 (en) 2015-01-01
CN104253068A (en) 2014-12-31
US9822929B2 (en) 2017-11-21
KR20150001614A (en) 2015-01-06

Similar Documents

Publication Publication Date Title
SG10201402805UA (en) Inactive gas supply facility and inactive gas supply method
MX2015003752A (en) Application program running method and device.
MY182186A (en) Washing machine and method for controlling the same
MX364338B (en) Configuring workflows in a host device operating in a process control system.
CL2016002141A1 (en) Methods for monitoring the performance of an operator during the operation of an agricultural tool comprising monitoring an operating characteristic of an agricultural tool and / or determining one or more operator performance criteria.
MX2017005119A (en) Facilitating integration of medical devices into computing devices for generating and operating smart medical devices.
MX2016013762A (en) Information presentation device and information presentation method.
BR112018003950A2 (en) gpu workload characterization and power management using command flow suggestion
MX355827B (en) Application control method and device.
MX340052B (en) Vector exception code.
MY178987A (en) Information processing device, information processing method, and program
GB2520858A (en) Instruction set for message scheduling of SHA256 algorithm
MX345054B (en) Air-conditioning apparatus.
NZ729814A (en) Water management system and method
MX2016013740A (en) Monitoring power consumption by electrical devices using monitored operational parameters.
NO20151677A1 (en) Workover Safety System
EP2947582A4 (en) Computing device and method for executing database operation command
CL2015002269A1 (en) Automatic dust suppression system and method.
PH12015500380A1 (en) Device, system and method for controlling an operation
IN2013CH04831A (en)
MX2020006622A (en) Gesture control for in-wall device.
MX2016015953A (en) Information retrieval system and method.
WO2015058134A3 (en) Control system for cryogenic cogeneration
MX2016006887A (en) Method and apparatus to optimize generator start delay and runtime following outage.
MX2018005094A (en) Turbine analysis device, turbine analysis method, and program.