SG100690A1 - Coating and developing system - Google Patents

Coating and developing system

Info

Publication number
SG100690A1
SG100690A1 SG200102697A SG200102697A SG100690A1 SG 100690 A1 SG100690 A1 SG 100690A1 SG 200102697 A SG200102697 A SG 200102697A SG 200102697 A SG200102697 A SG 200102697A SG 100690 A1 SG100690 A1 SG 100690A1
Authority
SG
Singapore
Prior art keywords
coating
developing system
developing
Prior art date
Application number
SG200102697A
Other languages
English (en)
Inventor
Matsuyama Yuji
Kitano Junichi
Kitano Takahiro
Original Assignee
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Ltd filed Critical Tokyo Electron Ltd
Publication of SG100690A1 publication Critical patent/SG100690A1/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67011—Apparatus for manufacture or treatment
    • H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
    • H01L21/67161—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers
    • H01L21/67178—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers vertical arrangement
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67011—Apparatus for manufacture or treatment
    • H01L21/67017—Apparatus for fluid treatment
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67011—Apparatus for manufacture or treatment
    • H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
    • H01L21/67207—Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process
    • H01L21/67225—Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process comprising at least one lithography chamber

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)
  • Materials For Photolithography (AREA)
SG200102697A 2000-05-10 2001-05-09 Coating and developing system SG100690A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000137499A JP3556882B2 (ja) 2000-05-10 2000-05-10 塗布現像処理システム

Publications (1)

Publication Number Publication Date
SG100690A1 true SG100690A1 (en) 2003-12-26

Family

ID=18645266

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200102697A SG100690A1 (en) 2000-05-10 2001-05-09 Coating and developing system

Country Status (6)

Country Link
US (1) US6467976B2 (zh)
JP (1) JP3556882B2 (zh)
KR (1) KR100618264B1 (zh)
CN (1) CN1199239C (zh)
SG (1) SG100690A1 (zh)
TW (1) TWI233628B (zh)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100701578B1 (ko) * 2000-02-01 2007-04-02 동경 엘렉트론 주식회사 기판처리장치 및 기판처리방법
TW594835B (en) * 2000-05-09 2004-06-21 Tokyo Electron Ltd System for coating and developing
JP2002057100A (ja) * 2000-05-31 2002-02-22 Canon Inc 露光装置、コートデベロップ装置、デバイス製造システム、デバイス製造方法、半導体製造工場および露光装置の保守方法
JP2003027280A (ja) * 2001-07-18 2003-01-29 Ebara Corp めっき装置
JP4066661B2 (ja) * 2002-01-23 2008-03-26 セイコーエプソン株式会社 有機ｅｌ装置の製造装置および液滴吐出装置
JP4381121B2 (ja) * 2003-12-11 2009-12-09 大日本スクリーン製造株式会社 基板処理装置
JP4369325B2 (ja) * 2003-12-26 2009-11-18 東京エレクトロン株式会社 現像装置及び現像処理方法
JP4486489B2 (ja) * 2004-12-22 2010-06-23 東京エレクトロン株式会社 処理方法及び処理装置
US7741585B2 (en) * 2004-12-22 2010-06-22 Sokudo Co., Ltd. Integrated thermal unit having a shuttle with two-axis movement
US7282675B2 (en) * 2004-12-22 2007-10-16 Sokudo Co., Ltd. Integrated thermal unit having a shuttle with a temperature controlled surface
US7297906B2 (en) * 2004-12-22 2007-11-20 Sokudo Co., Ltd. Integrated thermal unit having a shuttle with two-axis movement
US7288746B2 (en) * 2004-12-22 2007-10-30 Sokudo Co., Ltd. Integrated thermal unit having laterally adjacent bake and chill plates on different planes
US7601934B2 (en) * 2004-12-22 2009-10-13 Sokudo Co., Ltd. Integrated thermal unit having a shuttle with a temperature controlled surface
WO2006069256A2 (en) * 2004-12-22 2006-06-29 Sokudo Co., Ltd. Integrated thermal unit
JP4413789B2 (ja) * 2005-01-24 2010-02-10 東京エレクトロン株式会社 ステージ装置および塗布処理装置
KR20060088817A (ko) * 2005-01-28 2006-08-07 가부시키가이샤 이빔 기판처리장치 및 기판처리방법
JP4762743B2 (ja) * 2006-02-09 2011-08-31 東京エレクトロン株式会社 熱処理装置
JP4999415B2 (ja) * 2006-09-29 2012-08-15 東京エレクトロン株式会社 基板処理装置及び基板処理方法並びに基板処理装置の用力供給装置及び基板処理装置の用力供給方法
KR100924336B1 (ko) * 2007-04-02 2009-10-30 주식회사 하이닉스반도체 헤이즈를 억제하는 포토마스크 제조 방법
US9177843B2 (en) * 2007-06-06 2015-11-03 Taiwan Semiconductor Manufacturing Company, Ltd. Preventing contamination in integrated circuit manufacturing lines
CN103794466A (zh) * 2012-10-30 2014-05-14 沈阳芯源微电子设备有限公司 保持接口单元内部洁净度装置
TW202314398A (zh) 2021-08-24 2023-04-01 南韓商三星電子股份有限公司 基板處理設備

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2066300A (en) * 1979-12-21 1981-07-08 Varian Associates Sputter coating apparatus for semiconductor wafers
WO1993026038A1 (en) * 1992-06-15 1993-12-23 Materials Research Corporation Semiconductor wafer processing method and apparatus with heat and gas flow control

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6319322B1 (en) * 1998-07-13 2001-11-20 Tokyo Electron Limited Substrate processing apparatus
JP3495954B2 (ja) 1998-10-13 2004-02-09 東京エレクトロン株式会社 パタ−ン形成装置及び塗布、現像装置
JP3416078B2 (ja) * 1999-06-09 2003-06-16 東京エレクトロン株式会社 基板処理装置
US6379056B1 (en) * 2000-09-12 2002-04-30 Tokyo Electron Limited Substrate processing apparatus

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2066300A (en) * 1979-12-21 1981-07-08 Varian Associates Sputter coating apparatus for semiconductor wafers
WO1993026038A1 (en) * 1992-06-15 1993-12-23 Materials Research Corporation Semiconductor wafer processing method and apparatus with heat and gas flow control

Also Published As

Publication number Publication date
CN1199239C (zh) 2005-04-27
KR100618264B1 (ko) 2006-09-04
US6467976B2 (en) 2002-10-22
JP2001319863A (ja) 2001-11-16
TWI233628B (en) 2005-06-01
CN1325130A (zh) 2001-12-05
US20020127879A1 (en) 2002-09-12
JP3556882B2 (ja) 2004-08-25
KR20010104650A (ko) 2001-11-26

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