SE9601800D0 - Device and method for detecting defects - Google Patents

Device and method for detecting defects

Info

Publication number
SE9601800D0
SE9601800D0 SE9601800A SE9601800A SE9601800D0 SE 9601800 D0 SE9601800 D0 SE 9601800D0 SE 9601800 A SE9601800 A SE 9601800A SE 9601800 A SE9601800 A SE 9601800A SE 9601800 D0 SE9601800 D0 SE 9601800D0
Authority
SE
Sweden
Prior art keywords
transparent strip
order
light source
light
strip
Prior art date
Application number
SE9601800A
Other languages
Swedish (sv)
Inventor
Svante Bjoerk
Original Assignee
Svante Bjoerk Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Svante Bjoerk Ab filed Critical Svante Bjoerk Ab
Priority to SE9601800A priority Critical patent/SE9601800D0/en
Publication of SE9601800D0 publication Critical patent/SE9601800D0/en
Priority to PCT/SE1997/000750 priority patent/WO1997043624A1/en

Links

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Textile Engineering (AREA)

Abstract

A device and method for improving a visualization of detected defects (1) in a substantially planar transparent strip (70), most preferably in a strip of a film. The device is arranged with a light source (90, 92) in order to substantially illuminate the width of the transparent strip (70), focusing means (50, 52) provided with an optical axis (100), in order to focus the light which is coming from the transparent strip (70), a detector (10, 12), in order to detect defects (1) on the transparent strip (70) and means (80) for displacing the transparent strip (70) in its longitudinal direction. The transparent strip (70) is arranged in a first plane between the light source (90, 92) and the focusing means (50, 52), and where the optical axis (100) is arranged in a second plane in order to focus the incoming light to the detector (10, 12) by means of the focusing means. The light from the light source is inclined with respect to the lateral direction of the transparent strip (70) and the light source (90, 92) is arranged in the second plane in order to obtain a high intensity.
SE9601800A 1996-05-13 1996-05-13 Device and method for detecting defects SE9601800D0 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
SE9601800A SE9601800D0 (en) 1996-05-13 1996-05-13 Device and method for detecting defects
PCT/SE1997/000750 WO1997043624A1 (en) 1996-05-13 1997-05-06 Device and method for detecting defects

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE9601800A SE9601800D0 (en) 1996-05-13 1996-05-13 Device and method for detecting defects

Publications (1)

Publication Number Publication Date
SE9601800D0 true SE9601800D0 (en) 1996-05-13

Family

ID=20402532

Family Applications (1)

Application Number Title Priority Date Filing Date
SE9601800A SE9601800D0 (en) 1996-05-13 1996-05-13 Device and method for detecting defects

Country Status (2)

Country Link
SE (1) SE9601800D0 (en)
WO (1) WO1997043624A1 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE514090C2 (en) 1999-04-12 2000-12-18 Photonic Systems Ab Process and system for detecting impurities in a transparent material
EP1598662A1 (en) * 2004-05-17 2005-11-23 Total Petrochemicals Research Feluy A method for quantifying the optical properties of moulded objects
RU2768505C1 (en) * 2021-05-21 2022-03-24 Российская Федерация, от имени которой выступает Государственная корпорация по атомной энергии "Росатом" (Госкорпорация "Росатом") Method of identifying through defects of polymer films deposited on metal parts

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2500630A1 (en) * 1981-02-25 1982-08-27 Leser Jacques METHOD FOR SEARCHING FOR DEFECTS IN GLASS SHEETS AND DEVICE USING SAID METHOD
JPH01169343A (en) * 1987-12-25 1989-07-04 Nippon Sheet Glass Co Ltd Cut defect detector for glass plate
WO1990015322A1 (en) * 1989-05-31 1990-12-13 Ishikawajima-Harima Jukogyo Kabushiki Kaisha Texture measuring method and texture control method and apparatus using the texture measuring method
JP2795595B2 (en) * 1992-06-26 1998-09-10 セントラル硝子株式会社 Defect detection method for transparent plate
JP3178644B2 (en) * 1995-02-10 2001-06-25 セントラル硝子株式会社 Defect detection method for transparent plate

Also Published As

Publication number Publication date
WO1997043624A1 (en) 1997-11-20

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