SE8602266D0 - PROCEDURAL KIT FOR CONTROL OF THE PRODUCTION OF A PRODUCT - Google Patents

PROCEDURAL KIT FOR CONTROL OF THE PRODUCTION OF A PRODUCT

Info

Publication number
SE8602266D0
SE8602266D0 SE8602266A SE8602266A SE8602266D0 SE 8602266 D0 SE8602266 D0 SE 8602266D0 SE 8602266 A SE8602266 A SE 8602266A SE 8602266 A SE8602266 A SE 8602266A SE 8602266 D0 SE8602266 D0 SE 8602266D0
Authority
SE
Sweden
Prior art keywords
product
pct
deformation
rate
manufacture
Prior art date
Application number
SE8602266A
Other languages
Swedish (sv)
Other versions
SE460874B (en
SE8602266L (en
Inventor
Ingegerd Dirtoft
Original Assignee
Ingegerd Dirtoft
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ingegerd Dirtoft filed Critical Ingegerd Dirtoft
Priority to SE8602266A priority Critical patent/SE460874B/en
Publication of SE8602266D0 publication Critical patent/SE8602266D0/en
Priority to DE8787903458T priority patent/DE3771078D1/en
Priority to PCT/SE1987/000232 priority patent/WO1987007363A1/en
Priority to EP87903458A priority patent/EP0307408B1/en
Priority to US07/267,467 priority patent/US4987545A/en
Priority to AT87903458T priority patent/ATE64780T1/en
Publication of SE8602266L publication Critical patent/SE8602266L/en
Publication of SE460874B publication Critical patent/SE460874B/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/16Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/161Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means
    • G01B11/164Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means by holographic interferometry

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Holo Graphy (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)

Abstract

PCT No. PCT/SE87/00232 Sec. 371 Date Nov. 2, 1988 Sec. 102(e) Date Nov. 2, 1988 PCT Filed May 12, 1987 PCT Pub. No. WO87/07363 PCT Pub. Date Dec. 3, 1987.A method for monitoring a product under manufacture for possible deformation or changes in shape. In accordance with the method there is produced at given time intervals a series of halographic product images from which the rate at which possible changes in deformation take place in time can be estimated or evaluated. These estimated values relating to the rate of deformation and the rate of progressive changes therein are extrapolated so as to obtain the final value of the deformation of the product in relation to the state or form of the product immediately subsequent to the time of its manufacture. The process of manufacture is controlled on the basis of this final value, and the product is preferably cooled forcibly prior to producing the series of images.
SE8602266A 1986-05-20 1986-05-20 PROCEDURE METHOD FOR CONTROL OF ANY CONDUCTIVE, UNEXPECTED FORM CHANGES IN A MANUFACTURED PRODUCT SE460874B (en)

Priority Applications (6)

Application Number Priority Date Filing Date Title
SE8602266A SE460874B (en) 1986-05-20 1986-05-20 PROCEDURE METHOD FOR CONTROL OF ANY CONDUCTIVE, UNEXPECTED FORM CHANGES IN A MANUFACTURED PRODUCT
DE8787903458T DE3771078D1 (en) 1986-05-20 1987-05-12 CONTROL PROCESS FOR PRODUCING A PRODUCT.
PCT/SE1987/000232 WO1987007363A1 (en) 1986-05-20 1987-05-12 A method for monitoring the manufacture of a product
EP87903458A EP0307408B1 (en) 1986-05-20 1987-05-12 A method for monitoring the manufacture of a product
US07/267,467 US4987545A (en) 1986-05-20 1987-05-12 Method for monitoring the manufacture of a product
AT87903458T ATE64780T1 (en) 1986-05-20 1987-05-12 CONTROL PROCEDURES IN THE MANUFACTURE OF A PRODUCT.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE8602266A SE460874B (en) 1986-05-20 1986-05-20 PROCEDURE METHOD FOR CONTROL OF ANY CONDUCTIVE, UNEXPECTED FORM CHANGES IN A MANUFACTURED PRODUCT

Publications (3)

Publication Number Publication Date
SE8602266D0 true SE8602266D0 (en) 1986-05-20
SE8602266L SE8602266L (en) 1987-11-21
SE460874B SE460874B (en) 1989-11-27

Family

ID=20364571

Family Applications (1)

Application Number Title Priority Date Filing Date
SE8602266A SE460874B (en) 1986-05-20 1986-05-20 PROCEDURE METHOD FOR CONTROL OF ANY CONDUCTIVE, UNEXPECTED FORM CHANGES IN A MANUFACTURED PRODUCT

Country Status (4)

Country Link
US (1) US4987545A (en)
EP (1) EP0307408B1 (en)
SE (1) SE460874B (en)
WO (1) WO1987007363A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3930632A1 (en) * 1989-09-13 1991-03-14 Steinbichler Hans METHOD FOR DIRECT PHASE MEASUREMENT OF RADIATION, IN PARTICULAR LIGHT RADIATION, AND DEVICE FOR CARRYING OUT THIS METHOD

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3934461A (en) * 1970-04-17 1976-01-27 Trw Inc. Multiple exposure holographic interferometer method
US3911733A (en) * 1974-04-01 1975-10-14 Trw Inc Optical signature method and apparatus for structural integrity verification
US3938889A (en) * 1974-06-04 1976-02-17 The United States Of America As Represented By The Secretary Of The Air Force Method and apparatus for measuring linear thermal expansion of polymeric material
SE408735B (en) * 1977-02-03 1979-07-02 Abramson Nils Hugo Leopold PROCEDURE FOR USING INTERFEROMETRIC INFORMATION FROM TWO DIFFERENT HOLOGRAMS EXPOSED IN SHORT TIME SPACES
FR2385079A1 (en) * 1977-03-23 1978-10-20 Thomson Csf VISUALIZATION DEVICE, BY HOLOGRAPHIC INTERFEROMETRY, OF DEFORMATIONS OF DEFORMABLE STRUCTURES
US4464052A (en) * 1981-05-04 1984-08-07 Neumann Don B Differential holographic interferometry

Also Published As

Publication number Publication date
US4987545A (en) 1991-01-22
EP0307408B1 (en) 1991-06-26
SE460874B (en) 1989-11-27
EP0307408A1 (en) 1989-03-22
WO1987007363A1 (en) 1987-12-03
SE8602266L (en) 1987-11-21

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