SE8400698D0 - Dynamisk transformering - Google Patents
Dynamisk transformeringInfo
- Publication number
- SE8400698D0 SE8400698D0 SE8400698A SE8400698A SE8400698D0 SE 8400698 D0 SE8400698 D0 SE 8400698D0 SE 8400698 A SE8400698 A SE 8400698A SE 8400698 A SE8400698 A SE 8400698A SE 8400698 D0 SE8400698 D0 SE 8400698D0
- Authority
- SE
- Sweden
- Prior art keywords
- transducer
- lift
- currents
- testing
- dynamic transformation
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
- G01N27/9046—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE8400698A SE456043B (sv) | 1984-02-10 | 1984-02-10 | Sett och anordning for provning och/eller metning av elektriskt ledande provobjekt med avseende pa forendringar |
JP60022727A JPS60187859A (ja) | 1984-02-10 | 1985-02-07 | 導電供試体の試験及び/もしくは測定方法及び装置 |
EP85101296A EP0152066B1 (de) | 1984-02-10 | 1985-02-07 | Verfahren und Durchführungsanordnung zum Prüfen und/oder Messen elektrisch leitender Prüfgegenstände |
DE8585101296T DE3587478D1 (de) | 1984-02-10 | 1985-02-07 | Verfahren und durchfuehrungsanordnung zum pruefen und/oder messen elektrisch leitender pruefgegenstaende. |
US06/699,594 US4661777A (en) | 1984-02-10 | 1985-02-08 | Plural frequency eddy current method and apparatus with lift-off compensation for detecting faults in electrically conductive objects |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE8400698A SE456043B (sv) | 1984-02-10 | 1984-02-10 | Sett och anordning for provning och/eller metning av elektriskt ledande provobjekt med avseende pa forendringar |
Publications (3)
Publication Number | Publication Date |
---|---|
SE8400698D0 true SE8400698D0 (sv) | 1984-02-10 |
SE8400698L SE8400698L (sv) | 1985-08-11 |
SE456043B SE456043B (sv) | 1988-08-29 |
Family
ID=20354671
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SE8400698A SE456043B (sv) | 1984-02-10 | 1984-02-10 | Sett och anordning for provning och/eller metning av elektriskt ledande provobjekt med avseende pa forendringar |
Country Status (5)
Country | Link |
---|---|
US (1) | US4661777A (sv) |
EP (1) | EP0152066B1 (sv) |
JP (1) | JPS60187859A (sv) |
DE (1) | DE3587478D1 (sv) |
SE (1) | SE456043B (sv) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SE456610B (sv) * | 1985-01-08 | 1988-10-17 | Tornbloms Kvalitetskontroll Ab | Anordning for overforing av signaler och/eller media mellan en met-och/eller kontroll-anordning och minst en dertill horande rorlig, t ex roterande givare |
US4818936A (en) * | 1985-02-15 | 1989-04-04 | The Broken Hill Proprietary Company Limited | Method and apparatus for identifying and classifying steels |
EP0216357A3 (en) * | 1985-09-25 | 1988-08-31 | Nippon Zeon Co., Ltd. | Phosphoramidite compounds and process for production thereof |
US4837510A (en) * | 1987-01-30 | 1989-06-06 | Tornbloms Kvalitetskontroll Ab | Device for suppression and/or separation of signals due to magnetic oxide scales in hot cast billets |
SE467711B (sv) * | 1987-02-09 | 1992-08-31 | Bengt Hjalmar Toernblom | Anordning foer maetning/provning med virvelstroemsteknik medelst flera dynamiskt kompenserade givare |
SE456865B (sv) * | 1987-03-17 | 1988-11-07 | Bengt Hjalmar Toernblom | Anordning foer provning och/eller maetning, innefattande minst en faskaenslig detektor |
US4967154A (en) * | 1989-09-13 | 1990-10-30 | Optima Industries, Inc. | Dynamic tube runout measuring method and apparatus with square wave energized reluctance measuring coils |
US5371461A (en) * | 1992-06-26 | 1994-12-06 | General Electric Company | Apparatus and method for compensating for variations in the lift-off of eddy current surface inspection array elements |
GB0124910D0 (en) | 2001-10-17 | 2001-12-05 | Accentus Plc | Measurement of material properties |
US7258892B2 (en) * | 2003-12-10 | 2007-08-21 | Micron Technology, Inc. | Methods and systems for controlling temperature during microfeature workpiece processing, e.g., CVD deposition |
US20130249540A1 (en) * | 2012-03-22 | 2013-09-26 | Olympus Ndt Inc. | Eddy current array probe and method for lift-off compensation during operation without known lift references |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3197693A (en) * | 1960-10-04 | 1965-07-27 | Hugo L Libby | Nondestructive eddy current subsurface testing device providing compensation for variation in probe-to-specimen spacing and surface irregularities |
US3358225A (en) * | 1964-03-27 | 1967-12-12 | Richard S Peugeot | Lift-off compensation for eddy current testers |
GB1475517A (en) * | 1974-06-27 | 1977-06-01 | British Steel Corp | Detection of surface defects in elongate metallic members |
US4191922A (en) * | 1978-03-14 | 1980-03-04 | Republic Steel Corporation | Electromagnetic flaw detection system and method incorporating improved automatic coil error signal compensation |
SE7813344L (sv) * | 1978-12-28 | 1980-06-29 | Bengt Hjalmar Tornblom | Met- och/eller kompensationsanordning |
JPS55113949A (en) * | 1979-02-26 | 1980-09-02 | Kubota Ltd | Flaw detector for cast iron pipe |
US4303885A (en) * | 1979-06-18 | 1981-12-01 | Electric Power Research Institute, Inc. | Digitally controlled multifrequency eddy current test apparatus and method |
-
1984
- 1984-02-10 SE SE8400698A patent/SE456043B/sv unknown
-
1985
- 1985-02-07 JP JP60022727A patent/JPS60187859A/ja active Pending
- 1985-02-07 EP EP85101296A patent/EP0152066B1/de not_active Expired - Lifetime
- 1985-02-07 DE DE8585101296T patent/DE3587478D1/de not_active Expired - Fee Related
- 1985-02-08 US US06/699,594 patent/US4661777A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
DE3587478D1 (de) | 1993-09-02 |
US4661777A (en) | 1987-04-28 |
SE8400698L (sv) | 1985-08-11 |
EP0152066A2 (de) | 1985-08-21 |
JPS60187859A (ja) | 1985-09-25 |
EP0152066B1 (de) | 1993-07-28 |
SE456043B (sv) | 1988-08-29 |
EP0152066A3 (en) | 1988-08-31 |
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