JPS5756762A - Impedance measuring device - Google Patents

Impedance measuring device

Info

Publication number
JPS5756762A
JPS5756762A JP13150680A JP13150680A JPS5756762A JP S5756762 A JPS5756762 A JP S5756762A JP 13150680 A JP13150680 A JP 13150680A JP 13150680 A JP13150680 A JP 13150680A JP S5756762 A JPS5756762 A JP S5756762A
Authority
JP
Japan
Prior art keywords
signal
amplitude
voltmeter
peak value
differentiated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13150680A
Other languages
Japanese (ja)
Other versions
JPS637622B2 (en
Inventor
Kenji Machida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to JP13150680A priority Critical patent/JPS5756762A/en
Publication of JPS5756762A publication Critical patent/JPS5756762A/en
Publication of JPS637622B2 publication Critical patent/JPS637622B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)

Abstract

PURPOSE:To make a titled device difficult to receive the influence of DC level change and DC drift by differentiating the signals of prescribed waveforms of a constant frequency and a constant amplitude in a differentiating circuit including an unknown capacitance in digital multimeters or the like, and utilizing the peak value of the amplitude of the differentiated signals. CONSTITUTION:A signal source 10 generates a signal e1 having a prescribed waveform such as a triangular wave of a constant frequency and a constant amplitude at a low impedance. This signal e1 is differntiated by a CR differentiating circuit 14 including an unknown impedance element C and the resultant signal e3 is applied to a peak voltmeter 12. The peak value of the amplitude of the differentiated signal obtained from the above-mentioned circuit 14 can be taken relatively large as compared to the amplitude of the inputted triangle wave signal, and the peak value of this differentiated signal is proportional to the unknown capacitance value over a wide amplitude range. Thereby, the amplification factor (sensitivity) of the voltmeter circuit measuring the unknown capacitance can be made relatively low, and therefore the influence of the DC drift or the like of the voltmeter is reduced.
JP13150680A 1980-09-24 1980-09-24 Impedance measuring device Granted JPS5756762A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13150680A JPS5756762A (en) 1980-09-24 1980-09-24 Impedance measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13150680A JPS5756762A (en) 1980-09-24 1980-09-24 Impedance measuring device

Publications (2)

Publication Number Publication Date
JPS5756762A true JPS5756762A (en) 1982-04-05
JPS637622B2 JPS637622B2 (en) 1988-02-17

Family

ID=15059611

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13150680A Granted JPS5756762A (en) 1980-09-24 1980-09-24 Impedance measuring device

Country Status (1)

Country Link
JP (1) JPS5756762A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6196378U (en) * 1984-11-29 1986-06-20

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0280528U (en) * 1988-12-02 1990-06-21

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54140778U (en) * 1978-03-23 1979-09-29

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54140778U (en) * 1978-03-23 1979-09-29

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6196378U (en) * 1984-11-29 1986-06-20

Also Published As

Publication number Publication date
JPS637622B2 (en) 1988-02-17

Similar Documents

Publication Publication Date Title
GB1192485A (en) Apparatus for Measuring Electrical Capacitors
JPS5756762A (en) Impedance measuring device
GB1507434A (en) Suppression of interfering signals in an electric measurand transmitter
JPS55144556A (en) Surface potentiometer
Heinecke Fluxgate magnetometer with time coded output signal of the sensor
SU718799A1 (en) Pulse repetition frequency meter
JPS56150365A (en) Method for removing commercial frequency in cable fault point detection
SU930162A1 (en) Device for measuring electric field strength
SU710007A1 (en) Method of measuring distribution of charge carriers in semiconductors
SU1394154A2 (en) Device for measuring amplitude of voltage pulses
SU587405A1 (en) Arrangement for measuring ilf rectangular pulse amplitude
SU978058A1 (en) Compensating converter of periodic pulse signal amplitude values
JPS562567A (en) Velocity measuring instrument
JPS5786761A (en) Low speed detection circuit
SU970257A1 (en) Signal phase fluctuation measuring method
JPS5570750A (en) Measuring method for phase difference
JPS55121109A (en) Temperature correcting method as to hardness measurement and foreign-material sorting making use of eddy current
JPS56132571A (en) Fine current measuring circuit
JPS5631656A (en) S/n instrument and s/n measuring method
JPS55149848A (en) Measuring instrument of induction system for surface electric potential
JPS522544A (en) Measuring device utilizing irregular signal
JPS562729A (en) Phase detecting circuit
JPS55153101A (en) Recording medium for measuring nonlinear distortion
JPS56112659A (en) Measuring method for sweep distortion in frequency
Blutstein et al. Simultaneous measurement of the in-phase and quadrature components of the signal in ac polarography using multiplier circuitry