SE7409441L - - Google Patents
Info
- Publication number
- SE7409441L SE7409441L SE7409441A SE7409441A SE7409441L SE 7409441 L SE7409441 L SE 7409441L SE 7409441 A SE7409441 A SE 7409441A SE 7409441 A SE7409441 A SE 7409441A SE 7409441 L SE7409441 L SE 7409441L
- Authority
- SE
- Sweden
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
- H01J37/09—Diaphragms; Shields associated with electron or ion-optical arrangements; Compensation of disturbing fields
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/24—Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Electron Sources, Ion Sources (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US00382230A US3842272A (en) | 1973-07-24 | 1973-07-24 | Scanning charged particle microprobe with external spurious electric field effect correction |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| SE7409441L true SE7409441L (ja) | 1975-01-27 |
| SE389762B SE389762B (sv) | 1976-11-15 |
Family
ID=23508051
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SE7409441A SE389762B (sv) | 1973-07-24 | 1974-07-19 | Forfarande och anordning for att vid en anleggning med avsokande partikelstrale korrigera stralens avlenkning i avseende pa inverkan fran yttre, periodiska storfelt |
Country Status (11)
| Country | Link |
|---|---|
| US (1) | US3842272A (ja) |
| JP (1) | JPS5822854B2 (ja) |
| CA (1) | CA1013483A (ja) |
| DD (1) | DD113661A1 (ja) |
| DE (1) | DE2433999C2 (ja) |
| FR (1) | FR2239013B1 (ja) |
| GB (1) | GB1465518A (ja) |
| IT (1) | IT1016963B (ja) |
| NL (1) | NL178923C (ja) |
| SE (1) | SE389762B (ja) |
| SU (1) | SU572230A3 (ja) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5243058B2 (ja) * | 1974-04-22 | 1977-10-28 | ||
| JPH06105601B2 (ja) * | 1986-10-08 | 1994-12-21 | 株式会社日立製作所 | 走査電子顕微鏡 |
| US5463268A (en) * | 1994-05-23 | 1995-10-31 | National Electrostatics Corp. | Magnetically shielded high voltage electron accelerator |
| US6714892B2 (en) * | 2001-03-12 | 2004-03-30 | Agere Systems, Inc. | Three dimensional reconstruction metrology |
| WO2018144690A1 (en) | 2017-02-03 | 2018-08-09 | Gatan, Inc. | Harmonic line noise correction for electron energy loss spectrometer |
| RU2678504C1 (ru) * | 2018-01-09 | 2019-01-29 | федеральное государственное бюджетное образовательное учреждение высшего образования "Ульяновский государственный университет" | Устройство получения электронно-микроскопического изображения и локального элементного анализа радиоактивного образца методом электронной микроскопии в радиационно-защитной камере |
| TWI870972B (zh) | 2022-09-26 | 2025-01-21 | 德商卡爾蔡司多重掃描電子顯微鏡有限公司 | 帶電粒子束裝置的擾動補償 |
| WO2025149160A1 (en) | 2024-01-11 | 2025-07-17 | Carl Zeiss Smt Gmbh | Disturbance compensation for charged particle beam devices |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE911056C (de) * | 1938-02-10 | 1954-05-10 | Siemens Ag | Elektronenmikroskop |
| US3588586A (en) * | 1968-04-26 | 1971-06-28 | Jeol Ltd | Apparatus for correcting electron beam deflection |
| US3549883A (en) * | 1968-10-07 | 1970-12-22 | Gen Electric | Scanning electron microscope wherein an image is formed as a function of specimen current |
| US3678333A (en) * | 1970-06-15 | 1972-07-18 | American Optical Corp | Field emission electron gun utilizing means for protecting the field emission tip from high voltage discharges |
-
1973
- 1973-07-24 US US00382230A patent/US3842272A/en not_active Expired - Lifetime
-
1974
- 1974-07-15 DE DE2433999A patent/DE2433999C2/de not_active Expired
- 1974-07-17 CA CA204,960A patent/CA1013483A/en not_active Expired
- 1974-07-19 SE SE7409441A patent/SE389762B/xx unknown
- 1974-07-19 FR FR7425154A patent/FR2239013B1/fr not_active Expired
- 1974-07-22 DD DD180055A patent/DD113661A1/xx unknown
- 1974-07-23 JP JP49083859A patent/JPS5822854B2/ja not_active Expired
- 1974-07-23 IT IT52237/74A patent/IT1016963B/it active
- 1974-07-23 NL NLAANVRAGE7409951,A patent/NL178923C/xx not_active IP Right Cessation
- 1974-07-24 GB GB3272574A patent/GB1465518A/en not_active Expired
- 1974-07-24 SU SU7402048236A patent/SU572230A3/ru active
Also Published As
| Publication number | Publication date |
|---|---|
| DE2433999A1 (de) | 1975-02-13 |
| DD113661A1 (ja) | 1975-06-12 |
| IT1016963B (it) | 1977-06-20 |
| FR2239013A1 (ja) | 1975-02-21 |
| AU7148674A (en) | 1976-01-22 |
| US3842272A (en) | 1974-10-15 |
| JPS5044769A (ja) | 1975-04-22 |
| CA1013483A (en) | 1977-07-05 |
| DE2433999C2 (de) | 1986-06-19 |
| GB1465518A (en) | 1977-02-23 |
| NL7409951A (nl) | 1975-01-28 |
| NL178923C (nl) | 1988-09-16 |
| FR2239013B1 (ja) | 1978-01-27 |
| SU572230A3 (ru) | 1977-09-05 |
| NL178923B (nl) | 1986-01-02 |
| SE389762B (sv) | 1976-11-15 |
| JPS5822854B2 (ja) | 1983-05-11 |