SE388941B - Spektrometriskt analysforfarande enligt vilket man riktar en direktemitterad ofokuserad elektronstrale mot ytan av ett prov och analyserar fran provets yta emitterade rontgenstralar samt anordning for genomforande... - Google Patents

Spektrometriskt analysforfarande enligt vilket man riktar en direktemitterad ofokuserad elektronstrale mot ytan av ett prov och analyserar fran provets yta emitterade rontgenstralar samt anordning for genomforande...

Info

Publication number
SE388941B
SE388941B SE7217014A SE1701472A SE388941B SE 388941 B SE388941 B SE 388941B SE 7217014 A SE7217014 A SE 7217014A SE 1701472 A SE1701472 A SE 1701472A SE 388941 B SE388941 B SE 388941B
Authority
SE
Sweden
Prior art keywords
sample
radium
rays
analyzing
devices
Prior art date
Application number
SE7217014A
Other languages
English (en)
Swedish (sv)
Inventor
J Sahores
Original Assignee
Aquitaine Petrole
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Aquitaine Petrole filed Critical Aquitaine Petrole
Publication of SE388941B publication Critical patent/SE388941B/xx

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00X-ray tubes
    • H01J35/02Details
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00X-ray tubes
    • H01J35/02Details
    • H01J35/04Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
SE7217014A 1971-12-29 1972-12-27 Spektrometriskt analysforfarande enligt vilket man riktar en direktemitterad ofokuserad elektronstrale mot ytan av ett prov och analyserar fran provets yta emitterade rontgenstralar samt anordning for genomforande... SE388941B (sv)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7147291A FR2166540A5 (pt) 1971-12-29 1971-12-29

Publications (1)

Publication Number Publication Date
SE388941B true SE388941B (sv) 1976-10-18

Family

ID=9088304

Family Applications (1)

Application Number Title Priority Date Filing Date
SE7217014A SE388941B (sv) 1971-12-29 1972-12-27 Spektrometriskt analysforfarande enligt vilket man riktar en direktemitterad ofokuserad elektronstrale mot ytan av ett prov och analyserar fran provets yta emitterade rontgenstralar samt anordning for genomforande...

Country Status (21)

Country Link
JP (1) JPS4878996A (pt)
AR (1) AR194772A1 (pt)
AT (1) AT348801B (pt)
AU (1) AU470801B2 (pt)
BE (1) BE793444A (pt)
BR (1) BR7209163D0 (pt)
CA (1) CA994478A (pt)
CH (1) CH571718A5 (pt)
CS (1) CS177113B2 (pt)
DD (1) DD105664A5 (pt)
DE (1) DE2264192A1 (pt)
ES (1) ES410110A1 (pt)
FR (1) FR2166540A5 (pt)
GB (2) GB1422329A (pt)
IL (1) IL41187A (pt)
IT (1) IT972980B (pt)
LU (1) LU66757A1 (pt)
NL (1) NL7217760A (pt)
OA (1) OA04309A (pt)
SE (1) SE388941B (pt)
ZA (1) ZA729137B (pt)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2415365A1 (fr) * 1978-01-24 1979-08-17 Radiologie Cie Gle Dispositif de reduction de la divergence du faisceau utile d'un tube a rayons x, et tube ainsi equipe
NL8603264A (nl) * 1986-12-23 1988-07-18 Philips Nv Roentgenbuis met een ringvormig focus.
JP3165615B2 (ja) * 1995-03-17 2001-05-14 財団法人国際超電導産業技術研究センター 表面元素分析方法及び装置
DE102015220754B3 (de) * 2015-10-23 2017-02-09 Siemens Healthcare Gmbh Verfahren und Messeinrichtung zur Ermittlung des Elektrodenabstands von Röntgenröhren

Also Published As

Publication number Publication date
CH571718A5 (pt) 1976-01-15
IL41187A0 (en) 1973-02-28
FR2166540A5 (pt) 1973-08-17
AR194772A1 (es) 1973-08-14
AU470801B2 (en) 1976-04-01
NL7217760A (pt) 1973-07-03
AU5059072A (en) 1974-07-04
DE2264192A1 (de) 1973-07-12
BR7209163D0 (pt) 1973-09-25
ZA729137B (en) 1973-11-28
IT972980B (it) 1974-05-31
IL41187A (en) 1975-12-31
DD105664A5 (pt) 1974-05-05
BE793444A (fr) 1973-04-16
CA994478A (fr) 1976-08-03
GB1422330A (pt) 1976-01-28
CS177113B2 (pt) 1977-07-29
ATA1115872A (de) 1978-07-15
ES410110A1 (es) 1975-12-16
JPS4878996A (pt) 1973-10-23
GB1422329A (pt) 1976-01-28
AT348801B (de) 1979-03-12
LU66757A1 (pt) 1973-02-27
OA04309A (fr) 1980-01-15

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