GB1422330A - - Google Patents

Info

Publication number
GB1422330A
GB1422330A GB3371175A GB3371175A GB1422330A GB 1422330 A GB1422330 A GB 1422330A GB 3371175 A GB3371175 A GB 3371175A GB 3371175 A GB3371175 A GB 3371175A GB 1422330 A GB1422330 A GB 1422330A
Authority
GB
United Kingdom
Prior art keywords
cathode
electron beam
collimator
ray
glow
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB3371175A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of GB1422330A publication Critical patent/GB1422330A/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00X-ray tubes
    • H01J35/02Details
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00X-ray tubes
    • H01J35/02Details
    • H01J35/04Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076X-ray fluorescence

Abstract

1422330 Electron microscopes SOC NATIONALE DES PETROLES D'AQUITAINE 29 Dec 1972 [29 Dec 1971] 33711/75 Divided out of 1422329 Heading H1D [Also in Division H5] Apparatus suitable for the method of X-ray spectrometric investigation of a sample described and claimed in Specification 1,422,329, in which the angle between an incident electron beam irradiating an extended area of the sample surface to excite X-rays, and the X-ray beam selected by the spectrometer collimator does not exceed 40 degrees, includes a glow discharge tube as the electron source. The arrangement of Fig. 4b includes a pair of similar glow tubes (one only shown in full) detachably mounted in a frame 26 one either side of a collimator 1. The spacing between the cathode 20 and the anode 21 is adjustable by sliding portion 22 within portion 25, and gas exit and entry ports 23 and 24 are provided. In Fig. 5 the glow tube has an annular aluminium cathode 2 and mesh grid anode 3, which surrounds a collimator 1; to prevent excessive irradiation at the centre of the irradiated area, the cathode emissivity may be reduced in the inward radial direction, either by forming the cathode of a succession of concentric annuli of differing materials, or by forming it of indented shape, Fig. 11 (and Fig. 10, not shown), and rotating it in use. In other arrangements the incident electron beam may be directed normal to the specimen and the X-ray beam may be inclined thereto; both the electron beam and the X-ray beam may be directed normal to the specimen by deflecting the electron beam by magnetic (Fig. 3a, not shown) or electrostatic means (Figs. 3b, 12 and 13, not shown); and intersecting incident beams may be employed to ensure that every point on the sample surface receives electrons from at least two different directions.
GB3371175A 1971-12-29 1972-12-29 Expired GB1422330A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7147291A FR2166540A5 (en) 1971-12-29 1971-12-29

Publications (1)

Publication Number Publication Date
GB1422330A true GB1422330A (en) 1976-01-28

Family

ID=9088304

Family Applications (2)

Application Number Title Priority Date Filing Date
GB6004272A Expired GB1422329A (en) 1971-12-29 1972-12-29
GB3371175A Expired GB1422330A (en) 1971-12-29 1972-12-29

Family Applications Before (1)

Application Number Title Priority Date Filing Date
GB6004272A Expired GB1422329A (en) 1971-12-29 1972-12-29

Country Status (21)

Country Link
JP (1) JPS4878996A (en)
AR (1) AR194772A1 (en)
AT (1) AT348801B (en)
AU (1) AU470801B2 (en)
BE (1) BE793444A (en)
BR (1) BR7209163D0 (en)
CA (1) CA994478A (en)
CH (1) CH571718A5 (en)
CS (1) CS177113B2 (en)
DD (1) DD105664A5 (en)
DE (1) DE2264192A1 (en)
ES (1) ES410110A1 (en)
FR (1) FR2166540A5 (en)
GB (2) GB1422329A (en)
IL (1) IL41187A (en)
IT (1) IT972980B (en)
LU (1) LU66757A1 (en)
NL (1) NL7217760A (en)
OA (1) OA04309A (en)
SE (1) SE388941B (en)
ZA (1) ZA729137B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0732725A2 (en) * 1995-03-17 1996-09-18 International Superconductivity Technology Center Method for identifying surface atoms of solid sample and apparatus therefor
DE102015220754B3 (en) * 2015-10-23 2017-02-09 Siemens Healthcare Gmbh Method and measuring device for determining the electrode spacing of x-ray tubes

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2415365A1 (en) * 1978-01-24 1979-08-17 Radiologie Cie Gle DEVICE FOR REDUCING THE DIVERGENCE OF THE USEFUL BEAM OF AN X-RAY TUBE, AND THUS EQUIPPED TUBE
NL8603264A (en) * 1986-12-23 1988-07-18 Philips Nv ROENTGEN TUBE WITH A RING-SHAPED FOCUS.

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0732725A2 (en) * 1995-03-17 1996-09-18 International Superconductivity Technology Center Method for identifying surface atoms of solid sample and apparatus therefor
EP0732725A3 (en) * 1995-03-17 1997-12-29 International Superconductivity Technology Center Method for identifying surface atoms of solid sample and apparatus therefor
DE102015220754B3 (en) * 2015-10-23 2017-02-09 Siemens Healthcare Gmbh Method and measuring device for determining the electrode spacing of x-ray tubes

Also Published As

Publication number Publication date
AT348801B (en) 1979-03-12
IL41187A0 (en) 1973-02-28
DD105664A5 (en) 1974-05-05
IT972980B (en) 1974-05-31
BE793444A (en) 1973-04-16
ATA1115872A (en) 1978-07-15
AU5059072A (en) 1974-07-04
GB1422329A (en) 1976-01-28
ES410110A1 (en) 1975-12-16
JPS4878996A (en) 1973-10-23
CS177113B2 (en) 1977-07-29
CH571718A5 (en) 1976-01-15
AR194772A1 (en) 1973-08-14
DE2264192A1 (en) 1973-07-12
IL41187A (en) 1975-12-31
CA994478A (en) 1976-08-03
OA04309A (en) 1980-01-15
SE388941B (en) 1976-10-18
FR2166540A5 (en) 1973-08-17
ZA729137B (en) 1973-11-28
LU66757A1 (en) 1973-02-27
NL7217760A (en) 1973-07-03
AU470801B2 (en) 1976-04-01
BR7209163D0 (en) 1973-09-25

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PCNP Patent ceased through non-payment of renewal fee