OA04309A - X-ray spectrometric analysis method and apparatus. - Google Patents

X-ray spectrometric analysis method and apparatus.

Info

Publication number
OA04309A
OA04309A OA54800A OA54800A OA04309A OA 04309 A OA04309 A OA 04309A OA 54800 A OA54800 A OA 54800A OA 54800 A OA54800 A OA 54800A OA 04309 A OA04309 A OA 04309A
Authority
OA
OAPI
Prior art keywords
analysis method
spectrometric analysis
ray spectrometric
ray
spectrometric
Prior art date
Application number
OA54800A
Other languages
French (fr)
Inventor
Jean Sahores
Original Assignee
Aquitaine Petrole
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Aquitaine Petrole filed Critical Aquitaine Petrole
Publication of OA04309A publication Critical patent/OA04309A/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00X-ray tubes
    • H01J35/02Details
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00X-ray tubes
    • H01J35/02Details
    • H01J35/04Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
OA54800A 1971-12-29 1972-12-28 X-ray spectrometric analysis method and apparatus. OA04309A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7147291A FR2166540A5 (en) 1971-12-29 1971-12-29

Publications (1)

Publication Number Publication Date
OA04309A true OA04309A (en) 1980-01-15

Family

ID=9088304

Family Applications (1)

Application Number Title Priority Date Filing Date
OA54800A OA04309A (en) 1971-12-29 1972-12-28 X-ray spectrometric analysis method and apparatus.

Country Status (21)

Country Link
JP (1) JPS4878996A (en)
AR (1) AR194772A1 (en)
AT (1) AT348801B (en)
AU (1) AU470801B2 (en)
BE (1) BE793444A (en)
BR (1) BR7209163D0 (en)
CA (1) CA994478A (en)
CH (1) CH571718A5 (en)
CS (1) CS177113B2 (en)
DD (1) DD105664A5 (en)
DE (1) DE2264192A1 (en)
ES (1) ES410110A1 (en)
FR (1) FR2166540A5 (en)
GB (2) GB1422329A (en)
IL (1) IL41187A (en)
IT (1) IT972980B (en)
LU (1) LU66757A1 (en)
NL (1) NL7217760A (en)
OA (1) OA04309A (en)
SE (1) SE388941B (en)
ZA (1) ZA729137B (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2415365A1 (en) * 1978-01-24 1979-08-17 Radiologie Cie Gle DEVICE FOR REDUCING THE DIVERGENCE OF THE USEFUL BEAM OF AN X-RAY TUBE, AND THUS EQUIPPED TUBE
NL8603264A (en) * 1986-12-23 1988-07-18 Philips Nv ROENTGEN TUBE WITH A RING-SHAPED FOCUS.
JP3165615B2 (en) * 1995-03-17 2001-05-14 財団法人国際超電導産業技術研究センター Surface elemental analysis method and device
DE102015220754B3 (en) * 2015-10-23 2017-02-09 Siemens Healthcare Gmbh Method and measuring device for determining the electrode spacing of x-ray tubes

Also Published As

Publication number Publication date
CH571718A5 (en) 1976-01-15
IL41187A0 (en) 1973-02-28
FR2166540A5 (en) 1973-08-17
AR194772A1 (en) 1973-08-14
AU470801B2 (en) 1976-04-01
NL7217760A (en) 1973-07-03
AU5059072A (en) 1974-07-04
DE2264192A1 (en) 1973-07-12
BR7209163D0 (en) 1973-09-25
ZA729137B (en) 1973-11-28
IT972980B (en) 1974-05-31
IL41187A (en) 1975-12-31
DD105664A5 (en) 1974-05-05
BE793444A (en) 1973-04-16
CA994478A (en) 1976-08-03
GB1422330A (en) 1976-01-28
CS177113B2 (en) 1977-07-29
ATA1115872A (en) 1978-07-15
ES410110A1 (en) 1975-12-16
JPS4878996A (en) 1973-10-23
GB1422329A (en) 1976-01-28
AT348801B (en) 1979-03-12
LU66757A1 (en) 1973-02-27
SE388941B (en) 1976-10-18

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