NL7217760A - - Google Patents

Info

Publication number
NL7217760A
NL7217760A NL7217760A NL7217760A NL7217760A NL 7217760 A NL7217760 A NL 7217760A NL 7217760 A NL7217760 A NL 7217760A NL 7217760 A NL7217760 A NL 7217760A NL 7217760 A NL7217760 A NL 7217760A
Authority
NL
Netherlands
Application number
NL7217760A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of NL7217760A publication Critical patent/NL7217760A/xx

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00X-ray tubes
    • H01J35/02Details
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00X-ray tubes
    • H01J35/02Details
    • H01J35/04Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
NL7217760A 1971-12-29 1972-12-28 NL7217760A (pt)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7147291A FR2166540A5 (pt) 1971-12-29 1971-12-29

Publications (1)

Publication Number Publication Date
NL7217760A true NL7217760A (pt) 1973-07-03

Family

ID=9088304

Family Applications (1)

Application Number Title Priority Date Filing Date
NL7217760A NL7217760A (pt) 1971-12-29 1972-12-28

Country Status (21)

Country Link
JP (1) JPS4878996A (pt)
AR (1) AR194772A1 (pt)
AT (1) AT348801B (pt)
AU (1) AU470801B2 (pt)
BE (1) BE793444A (pt)
BR (1) BR7209163D0 (pt)
CA (1) CA994478A (pt)
CH (1) CH571718A5 (pt)
CS (1) CS177113B2 (pt)
DD (1) DD105664A5 (pt)
DE (1) DE2264192A1 (pt)
ES (1) ES410110A1 (pt)
FR (1) FR2166540A5 (pt)
GB (2) GB1422329A (pt)
IL (1) IL41187A (pt)
IT (1) IT972980B (pt)
LU (1) LU66757A1 (pt)
NL (1) NL7217760A (pt)
OA (1) OA04309A (pt)
SE (1) SE388941B (pt)
ZA (1) ZA729137B (pt)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2415365A1 (fr) * 1978-01-24 1979-08-17 Radiologie Cie Gle Dispositif de reduction de la divergence du faisceau utile d'un tube a rayons x, et tube ainsi equipe
NL8603264A (nl) * 1986-12-23 1988-07-18 Philips Nv Roentgenbuis met een ringvormig focus.
JP3165615B2 (ja) * 1995-03-17 2001-05-14 財団法人国際超電導産業技術研究センター 表面元素分析方法及び装置
DE102015220754B3 (de) * 2015-10-23 2017-02-09 Siemens Healthcare Gmbh Verfahren und Messeinrichtung zur Ermittlung des Elektrodenabstands von Röntgenröhren

Also Published As

Publication number Publication date
CH571718A5 (pt) 1976-01-15
IL41187A0 (en) 1973-02-28
FR2166540A5 (pt) 1973-08-17
AR194772A1 (es) 1973-08-14
AU470801B2 (en) 1976-04-01
AU5059072A (en) 1974-07-04
DE2264192A1 (de) 1973-07-12
BR7209163D0 (pt) 1973-09-25
ZA729137B (en) 1973-11-28
IT972980B (it) 1974-05-31
IL41187A (en) 1975-12-31
DD105664A5 (pt) 1974-05-05
BE793444A (fr) 1973-04-16
CA994478A (fr) 1976-08-03
GB1422330A (pt) 1976-01-28
CS177113B2 (pt) 1977-07-29
ATA1115872A (de) 1978-07-15
ES410110A1 (es) 1975-12-16
JPS4878996A (pt) 1973-10-23
GB1422329A (pt) 1976-01-28
AT348801B (de) 1979-03-12
LU66757A1 (pt) 1973-02-27
SE388941B (sv) 1976-10-18
OA04309A (fr) 1980-01-15

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Legal Events

Date Code Title Description
BV The patent application has lapsed