SE332721B - - Google Patents
Info
- Publication number
- SE332721B SE332721B SE15924/66A SE1592466A SE332721B SE 332721 B SE332721 B SE 332721B SE 15924/66 A SE15924/66 A SE 15924/66A SE 1592466 A SE1592466 A SE 1592466A SE 332721 B SE332721 B SE 332721B
- Authority
- SE
- Sweden
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02097—Self-interferometers
- G01B9/02098—Shearing interferometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/45—Multiple detectors for detecting interferometer signals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/70—Using polarization in the interferometer
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| NL6515207A NL6515207A (de) | 1965-11-24 | 1965-11-24 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SE332721B true SE332721B (de) | 1971-02-15 |
Family
ID=19794724
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SE15924/66A SE332721B (de) | 1965-11-24 | 1966-11-21 |
Country Status (7)
| Country | Link |
|---|---|
| BE (1) | BE690100A (de) |
| CH (1) | CH470651A (de) |
| DE (1) | DE1497539A1 (de) |
| FR (1) | FR1502280A (de) |
| GB (1) | GB1138225A (de) |
| NL (1) | NL6515207A (de) |
| SE (1) | SE332721B (de) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2082403A5 (de) * | 1970-03-13 | 1971-12-10 | Thomson Csf | |
| DE3031961C2 (de) * | 1980-08-25 | 1985-02-07 | Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt | Interferometrische Einrichtung zur Messung physikalischer Größen |
| US4647196A (en) * | 1981-01-20 | 1987-03-03 | Hitachi Metals, Ltd. | Surface flaw detection method |
| US5872629A (en) * | 1997-06-23 | 1999-02-16 | Charles Evans & Associates | Analytical depth monitor utilizing differential interferometric analysis |
| CN116448243B (zh) * | 2023-06-19 | 2023-09-22 | 中国工程物理研究院激光聚变研究中心 | 一种基于交叉偏振波的三维光场自参考测量装置及方法 |
-
1965
- 1965-11-24 NL NL6515207A patent/NL6515207A/xx unknown
-
1966
- 1966-11-19 DE DE19661497539 patent/DE1497539A1/de active Granted
- 1966-11-21 CH CH1664366A patent/CH470651A/de not_active IP Right Cessation
- 1966-11-21 SE SE15924/66A patent/SE332721B/xx unknown
- 1966-11-22 GB GB52258/66A patent/GB1138225A/en not_active Expired
- 1966-11-23 BE BE690100D patent/BE690100A/xx unknown
- 1966-11-24 FR FR84861A patent/FR1502280A/fr not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| NL6515207A (de) | 1967-05-25 |
| BE690100A (de) | 1967-05-23 |
| CH470651A (de) | 1969-03-31 |
| GB1138225A (en) | 1968-12-27 |
| FR1502280A (fr) | 1967-11-18 |
| DE1497539A1 (de) | 1969-03-27 |
| DE1497539B2 (de) | 1975-07-03 |