SE0702468L - Reläkontakt - Google Patents
ReläkontaktInfo
- Publication number
- SE0702468L SE0702468L SE0702468A SE0702468A SE0702468L SE 0702468 L SE0702468 L SE 0702468L SE 0702468 A SE0702468 A SE 0702468A SE 0702468 A SE0702468 A SE 0702468A SE 0702468 L SE0702468 L SE 0702468L
- Authority
- SE
- Sweden
- Prior art keywords
- relay contact
- relay
- contact
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R29/00—Coupling parts for selective co-operation with a counterpart in different ways to establish different circuits, e.g. for voltage selection, for series-parallel selection, programmable connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R31/00—Coupling parts supported only by co-operation with counterpart
- H01R31/06—Intermediate parts for linking two coupling parts, e.g. adapter
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
-
- G01R31/04—
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R43/00—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Manufacturing Of Electrical Connectors (AREA)
- Coupling Device And Connection With Printed Circuit (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006305364A JP4845031B2 (ja) | 2006-11-10 | 2006-11-10 | 中継コネクター |
JP2007265372A JP4906666B2 (ja) | 2006-11-10 | 2007-10-11 | 中継コネクター |
Publications (3)
Publication Number | Publication Date |
---|---|
SE0702468L true SE0702468L (sv) | 2008-05-11 |
SE532247C2 SE532247C2 (sv) | 2009-11-24 |
SE532247C8 SE532247C8 (sv) | 2010-01-19 |
Family
ID=38786634
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SE0702468A SE532247C8 (sv) | 2006-11-10 | 2007-11-09 | Reläkontakt för elektrisk anslutning av ett kontaktdon som skall inspekteras |
SE0702467A SE532151C2 (sv) | 2006-11-10 | 2007-11-09 | Reläkontakt för elektrisk anslutning av ett kontaktdon som skall inspekteras |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SE0702467A SE532151C2 (sv) | 2006-11-10 | 2007-11-09 | Reläkontakt för elektrisk anslutning av ett kontaktdon som skall inspekteras |
Country Status (7)
Country | Link |
---|---|
US (1) | US7568957B2 (sv) |
JP (1) | JP4845031B2 (sv) |
KR (1) | KR101059177B1 (sv) |
CN (1) | CN101178427B (sv) |
FI (1) | FI121693B (sv) |
SE (2) | SE532247C8 (sv) |
TW (1) | TWI376852B (sv) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4783825B2 (ja) * | 2008-11-01 | 2011-09-28 | 株式会社ヨコオ | クリップ式中継コネクタ |
JP5579547B2 (ja) | 2010-09-07 | 2014-08-27 | 株式会社ヨコオ | コネクタ接続用検査治具 |
JP6627655B2 (ja) * | 2016-06-17 | 2020-01-08 | オムロン株式会社 | ソケット |
CN106153988A (zh) * | 2016-06-24 | 2016-11-23 | 段超毅 | 接触导通结构、接触导通装置和板对板测试器 |
US11764527B2 (en) | 2019-05-16 | 2023-09-19 | Samsung Display Co., Ltd. | Connector |
CN114223098B (zh) * | 2019-10-04 | 2024-04-12 | 株式会社村田制作所 | 探头 |
KR102576071B1 (ko) * | 2021-07-16 | 2023-09-08 | 주식회사 센서뷰 | 소형 커넥터 테스트용 연결지그 |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4225819A (en) * | 1978-10-12 | 1980-09-30 | Bell Telephone Laboratories, Incorporated | Circuit board contact contamination probe |
US4471298A (en) * | 1981-12-11 | 1984-09-11 | Cirdyne, Inc. | Apparatus for automatically electrically testing printed circuit boards |
US5484295A (en) * | 1994-04-01 | 1996-01-16 | Teledyne Electronic Technologies | Low profile compression electrical connector |
US5642054A (en) * | 1995-08-08 | 1997-06-24 | Hughes Aircraft Company | Active circuit multi-port membrane probe for full wafer testing |
US5764069A (en) * | 1995-10-30 | 1998-06-09 | International Faster Corporation | High density grid for testing circuit boards |
JPH1183521A (ja) | 1997-09-02 | 1999-03-26 | Nissan Motor Co Ltd | 車両用経路誘導装置 |
JP3214415B2 (ja) | 1997-10-30 | 2001-10-02 | 日本電産リード株式会社 | 基板検査装置および基板検査方法 |
JPH11183521A (ja) | 1997-12-22 | 1999-07-09 | Yokowo Co Ltd | クリップ式中継コネクタ |
US7257465B2 (en) * | 2002-10-15 | 2007-08-14 | Rain Bird Corporation | Open architecture modularity for irrigation controllers |
JP4251855B2 (ja) * | 2002-11-19 | 2009-04-08 | 株式会社ヨコオ | 高周波・高速用デバイスの検査治具の製法 |
DE10260238B4 (de) | 2002-12-20 | 2007-04-05 | Atg Test Systems Gmbh & Co.Kg | Adapter zum Testen einer oder mehrerer Leiteranordnungen und Verfahren |
JP2004309441A (ja) * | 2003-02-18 | 2004-11-04 | Yamaha Corp | プローブヘッド及びその組立方法並びにプローブカード |
JP2004273192A (ja) | 2003-03-06 | 2004-09-30 | Yokowo Co Ltd | コネクタ検査用治具 |
JP4011530B2 (ja) * | 2003-08-22 | 2007-11-21 | 日本航空電子工業株式会社 | コネクタ |
WO2005106512A1 (ja) * | 2004-04-30 | 2005-11-10 | Advantest Corporation | マニュアル試験用器具 |
JP2007294146A (ja) | 2006-04-21 | 2007-11-08 | Yamaichi Electronics Co Ltd | 位置決め治具 |
-
2006
- 2006-11-10 JP JP2006305364A patent/JP4845031B2/ja active Active
-
2007
- 2007-11-07 US US11/979,733 patent/US7568957B2/en active Active
- 2007-11-08 FI FI20070847A patent/FI121693B/sv active IP Right Grant
- 2007-11-09 KR KR1020070114326A patent/KR101059177B1/ko active IP Right Grant
- 2007-11-09 SE SE0702468A patent/SE532247C8/sv unknown
- 2007-11-09 TW TW096142362A patent/TWI376852B/zh active
- 2007-11-09 SE SE0702467A patent/SE532151C2/sv unknown
- 2007-11-12 CN CN2007101863554A patent/CN101178427B/zh active Active
Also Published As
Publication number | Publication date |
---|---|
CN101178427B (zh) | 2011-06-15 |
FI20070847A0 (sv) | 2007-11-08 |
SE532151C2 (sv) | 2009-11-03 |
TW200836433A (en) | 2008-09-01 |
SE532247C2 (sv) | 2009-11-24 |
US7568957B2 (en) | 2009-08-04 |
SE532247C8 (sv) | 2010-01-19 |
KR20080042746A (ko) | 2008-05-15 |
US20080113527A1 (en) | 2008-05-15 |
JP4845031B2 (ja) | 2011-12-28 |
SE0702467L (sv) | 2008-05-11 |
TWI376852B (en) | 2012-11-11 |
KR101059177B1 (ko) | 2011-08-25 |
FI121693B (sv) | 2011-02-28 |
CN101178427A (zh) | 2008-05-14 |
JP2008123795A (ja) | 2008-05-29 |
FI20070847A (sv) | 2008-05-11 |
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