SE0303048D0 - Förfarande och anordning - Google Patents

Förfarande och anordning

Info

Publication number
SE0303048D0
SE0303048D0 SE0303048A SE0303048A SE0303048D0 SE 0303048 D0 SE0303048 D0 SE 0303048D0 SE 0303048 A SE0303048 A SE 0303048A SE 0303048 A SE0303048 A SE 0303048A SE 0303048 D0 SE0303048 D0 SE 0303048D0
Authority
SE
Sweden
Prior art keywords
light
line
column
images
recorded
Prior art date
Application number
SE0303048A
Other languages
English (en)
Other versions
SE0303048L (sv
SE525206C2 (sv
Inventor
Hans Aahlen
Original Assignee
Optonova Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Optonova Ab filed Critical Optonova Ab
Priority to SE0303048A priority Critical patent/SE525206C2/sv
Publication of SE0303048D0 publication Critical patent/SE0303048D0/sv
Priority to EP04800335A priority patent/EP1692460A1/en
Priority to PCT/SE2004/001672 priority patent/WO2005047816A1/en
Publication of SE0303048L publication Critical patent/SE0303048L/sv
Publication of SE525206C2 publication Critical patent/SE525206C2/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
SE0303048A 2003-11-17 2003-11-17 Förfarande och anordning för beröringsfri avsyning och inmätning av ytegenskaper och ytdefekter på en materialyta SE525206C2 (sv)

Priority Applications (3)

Application Number Priority Date Filing Date Title
SE0303048A SE525206C2 (sv) 2003-11-17 2003-11-17 Förfarande och anordning för beröringsfri avsyning och inmätning av ytegenskaper och ytdefekter på en materialyta
EP04800335A EP1692460A1 (en) 2003-11-17 2004-11-17 Scanning and measuring of surface features
PCT/SE2004/001672 WO2005047816A1 (en) 2003-11-17 2004-11-17 Scanning and measuring of surface features

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE0303048A SE525206C2 (sv) 2003-11-17 2003-11-17 Förfarande och anordning för beröringsfri avsyning och inmätning av ytegenskaper och ytdefekter på en materialyta

Publications (3)

Publication Number Publication Date
SE0303048D0 true SE0303048D0 (sv) 2003-11-17
SE0303048L SE0303048L (sv) 2004-12-28
SE525206C2 SE525206C2 (sv) 2004-12-28

Family

ID=29729074

Family Applications (1)

Application Number Title Priority Date Filing Date
SE0303048A SE525206C2 (sv) 2003-11-17 2003-11-17 Förfarande och anordning för beröringsfri avsyning och inmätning av ytegenskaper och ytdefekter på en materialyta

Country Status (3)

Country Link
EP (1) EP1692460A1 (sv)
SE (1) SE525206C2 (sv)
WO (1) WO2005047816A1 (sv)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105823782B (zh) * 2016-03-10 2019-01-11 北京大学 一种二维材料中晶界和原子缺陷的表征方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE385048B (sv) * 1974-08-05 1976-05-31 Svenska Traeforskningsinst Forfarande for metning av en ytas topografi
FR2665959B1 (fr) * 1990-08-16 1994-01-14 Oreal Appareil destine a permettre d'evaluer la brillance d'une surface, en particulier de la peau.
US5208766A (en) * 1990-11-13 1993-05-04 Hughes Aircraft Company Automated evaluation of painted surface quality
DE60236337D1 (de) * 2001-03-26 2010-06-24 Candela Instr Fremont System zur Messung von Phasendifferenzen von reflektierten Lichtsignalen
US6931149B2 (en) * 2002-04-19 2005-08-16 Norsk Elektro Optikk A/S Pipeline internal inspection device and method

Also Published As

Publication number Publication date
SE0303048L (sv) 2004-12-28
SE525206C2 (sv) 2004-12-28
EP1692460A1 (en) 2006-08-23
WO2005047816A1 (en) 2005-05-26

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Legal Events

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