SE0003078D0 - Device, method and system for measuring the distribution of selected properties in a material - Google Patents

Device, method and system for measuring the distribution of selected properties in a material

Info

Publication number
SE0003078D0
SE0003078D0 SE0003078A SE0003078A SE0003078D0 SE 0003078 D0 SE0003078 D0 SE 0003078D0 SE 0003078 A SE0003078 A SE 0003078A SE 0003078 A SE0003078 A SE 0003078A SE 0003078 D0 SE0003078 D0 SE 0003078D0
Authority
SE
Sweden
Prior art keywords
distribution
selected properties
electromagnetic radiation
measuring
frequency
Prior art date
Application number
SE0003078A
Other languages
English (en)
Other versions
SE517701C2 (sv
SE0003078L (sv
Inventor
Harald Merkel
Mikael Reimers
Original Assignee
Merkel Physik
Mikael Reimers
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Merkel Physik, Mikael Reimers filed Critical Merkel Physik
Priority to SE0003078A priority Critical patent/SE517701C2/sv
Publication of SE0003078D0 publication Critical patent/SE0003078D0/sv
Priority to US09/885,285 priority patent/US7057743B2/en
Priority to PCT/SE2001/001840 priority patent/WO2002018920A1/en
Priority to JP2002523592A priority patent/JP2004520568A/ja
Priority to EP01961549A priority patent/EP1314022B1/en
Priority to AT01961549T priority patent/ATE445153T1/de
Priority to DE60140134T priority patent/DE60140134D1/de
Publication of SE0003078L publication Critical patent/SE0003078L/sv
Publication of SE517701C2 publication Critical patent/SE517701C2/sv
Priority to US11/302,220 priority patent/US7280227B2/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
    • G01N22/04—Investigating moisture content

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Electromagnetism (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
SE0003078A 2000-08-31 2000-08-31 Anordning, metod och system för att mäta distrubution av valda egenskaper i ett material SE517701C2 (sv)

Priority Applications (8)

Application Number Priority Date Filing Date Title
SE0003078A SE517701C2 (sv) 2000-08-31 2000-08-31 Anordning, metod och system för att mäta distrubution av valda egenskaper i ett material
US09/885,285 US7057743B2 (en) 2000-08-31 2000-12-04 Device, method and system for measuring the distribution of selected properties in a material
PCT/SE2001/001840 WO2002018920A1 (en) 2000-08-31 2001-08-30 Device, method and system for measuring the distribution of selected properties in a material
JP2002523592A JP2004520568A (ja) 2000-08-31 2001-08-30 物質中の選択された特性の分布を測定するための装置、方法及びシステム
EP01961549A EP1314022B1 (en) 2000-08-31 2001-08-30 Device, method and system for measuring the distribution of selected properties in a material
AT01961549T ATE445153T1 (de) 2000-08-31 2001-08-30 Einrichtung, verfahren und system zur messung der verteilung gewählter eigenschaften in einem material
DE60140134T DE60140134D1 (de) 2000-08-31 2001-08-30 Einrichtung, verfahren und system zur messung der verteilung gewählter eigenschaften in einem material
US11/302,220 US7280227B2 (en) 2000-08-31 2005-12-14 Device, method and system for measuring the distribution of selected properties in a material

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE0003078A SE517701C2 (sv) 2000-08-31 2000-08-31 Anordning, metod och system för att mäta distrubution av valda egenskaper i ett material

Publications (3)

Publication Number Publication Date
SE0003078D0 true SE0003078D0 (sv) 2000-08-31
SE0003078L SE0003078L (sv) 2002-03-01
SE517701C2 SE517701C2 (sv) 2002-07-02

Family

ID=20280848

Family Applications (1)

Application Number Title Priority Date Filing Date
SE0003078A SE517701C2 (sv) 2000-08-31 2000-08-31 Anordning, metod och system för att mäta distrubution av valda egenskaper i ett material

Country Status (7)

Country Link
US (2) US7057743B2 (sv)
EP (1) EP1314022B1 (sv)
JP (1) JP2004520568A (sv)
AT (1) ATE445153T1 (sv)
DE (1) DE60140134D1 (sv)
SE (1) SE517701C2 (sv)
WO (1) WO2002018920A1 (sv)

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US20070041613A1 (en) * 2005-05-11 2007-02-22 Luc Perron Database of target objects suitable for use in screening receptacles or people and method and apparatus for generating same
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CA2584683A1 (en) * 2006-04-20 2007-10-20 Optosecurity Inc. Apparatus, method and system for screening receptacles and persons
US7520667B2 (en) * 2006-05-11 2009-04-21 John Bean Technologies Ab Method and system for determining process parameters
US7899232B2 (en) * 2006-05-11 2011-03-01 Optosecurity Inc. Method and apparatus for providing threat image projection (TIP) in a luggage screening system, and luggage screening system implementing same
US8494210B2 (en) * 2007-03-30 2013-07-23 Optosecurity Inc. User interface for use in security screening providing image enhancement capabilities and apparatus for implementing same
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CN102142142A (zh) * 2010-01-29 2011-08-03 鸿富锦精密工业（深圳）有限公司 产品轮廓制程能力验证系统及方法
JP6025849B2 (ja) 2011-09-07 2016-11-16 ラピスカン システムズ、インコーポレイテッド マニフェストデータをイメージング／検知処理に統合するｘ線検査システム
WO2013079250A1 (en) * 2011-11-28 2013-06-06 Abb Research Ltd Method for the inspection of dielectric properties in electrical insulators
US9830523B2 (en) 2012-05-31 2017-11-28 Korea Institute Of Science And Technology Method and apparatus for recognizing object material using spatial image and spatial radar information
US9625509B1 (en) * 2013-03-06 2017-04-18 Nokomis, Inc. Automated sensor system for RF shielding characterization
US9386936B2 (en) 2013-03-13 2016-07-12 Ellumen, Inc. Distributed microwave image processing system and method
EP3033609B1 (en) * 2013-09-27 2018-11-28 Sensability Pty Ltd A method and an apparatus for identifying a content property of foodstuff
US9111334B2 (en) 2013-11-01 2015-08-18 Ellumen, Inc. Dielectric encoding of medical images
KR101525991B1 (ko) * 2013-12-31 2015-06-10 주식회사 이레테크 3차원 영상 기반의 스캐닝 방법, 스캐너 및 스캐너 시스템
US9800713B2 (en) 2014-09-12 2017-10-24 Hzo, Inc. Moisture detection response
US9939398B2 (en) 2014-09-12 2018-04-10 Hzo, Inc. Detecting moisture with an antenna
US10302807B2 (en) 2016-02-22 2019-05-28 Rapiscan Systems, Inc. Systems and methods for detecting threats and contraband in cargo
US9869641B2 (en) 2016-04-08 2018-01-16 Ellumen, Inc. Microwave imaging device
KR101710508B1 (ko) * 2016-04-12 2017-02-27 한국과학기술원 구조물의 진단 방법 및 진단 시스템
DE102016108022A1 (de) * 2016-04-29 2017-11-02 Claudia Resch Bilderzeugungsvorrichtung zur ortsauflösenden Vermessung von Änderungen der Dichte in 3-dimensionalen dielektrischen Objekten
CN110793979B (zh) * 2019-10-16 2021-04-06 中国科学院遥感与数字地球研究所 活立木木材密度测量方法及装置
SE544625C2 (en) 2020-04-14 2022-09-27 Epiroc Rock Drills Ab Arrangement, drill rig and method therein for detection of water in material flow
CN114778691B (zh) * 2022-06-16 2022-09-06 南京航空航天大学 一种变阵列形式的超声导波定量化成像方法

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Also Published As

Publication number Publication date
US7280227B2 (en) 2007-10-09
ATE445153T1 (de) 2009-10-15
JP2004520568A (ja) 2004-07-08
SE517701C2 (sv) 2002-07-02
EP1314022B1 (en) 2009-10-07
US7057743B2 (en) 2006-06-06
US20030024315A1 (en) 2003-02-06
WO2002018920A1 (en) 2002-03-07
SE0003078L (sv) 2002-03-01
DE60140134D1 (de) 2009-11-19
EP1314022A1 (en) 2003-05-28
US20060098211A1 (en) 2006-05-11

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