Classifications

• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
  • G01N27/60—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrostatic variables, e.g. electrographic flaw testing
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
  • G01N27/002—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the work function voltage
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
  • G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
  • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
  • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
  • G01Q60/30—Scanning potential microscopy
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
  • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
  • G01R1/02—General constructional details
  • G01R1/06—Measuring leads; Measuring probes
  • G01R1/067—Measuring probes
  • G01R1/07—Non contact-making probes
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
  • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
  • G01R1/02—General constructional details
  • G01R1/06—Measuring leads; Measuring probes
  • G01R1/067—Measuring probes
  • G01R1/073—Multiple probes
  • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
  • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
  • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
  • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
  • G01R35/007—Standards or reference devices, e.g. voltage or resistance standards, "golden references"

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• Physics & Mathematics (AREA)
• General Physics & Mathematics (AREA)
• Chemical & Material Sciences (AREA)
• General Health & Medical Sciences (AREA)
• Health & Medical Sciences (AREA)
• Immunology (AREA)
• Analytical Chemistry (AREA)
• Biochemistry (AREA)
• Electrochemistry (AREA)
• Chemical Kinetics & Catalysis (AREA)
• Life Sciences & Earth Sciences (AREA)
• Pathology (AREA)
• Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
• Radiology & Medical Imaging (AREA)
• Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
• Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
• Measuring Leads Or Probes (AREA)
• Sampling And Sample Adjustment (AREA)

Applications Claiming Priority (5)

Publications (3)

Family

ID=57585185

Family Applications (1)

Country Status (9)

Family Cites Families (17)

• 2016
  • 2016-06-24 AU AU2016281432A patent/AU2016281432B2/en active Active
  • 2016-06-24 RU RU2018102394A patent/RU2710526C2/ru active
  • 2016-06-24 CN CN201690000915.5U patent/CN209148735U/zh active Active
  • 2016-06-24 CA CA2990048A patent/CA2990048C/en active Active
  • 2016-06-24 US US15/739,945 patent/US10620159B2/en active Active
  • 2016-06-24 JP JP2018519673A patent/JP6861704B2/ja active Active
  • 2016-06-24 WO PCT/NO2016/050140 patent/WO2016209087A1/en active Application Filing
  • 2016-06-24 EP EP16814787.4A patent/EP3314272B1/en active Active
  • 2016-06-24 KR KR1020187002059A patent/KR102569330B1/ko active IP Right Grant

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