RU1807445C - Method of recovering object from its diffraction pattern - Google Patents

Abstract

The invention relates to the field of pattern recognition of laser locations and can be used in optics, space technology, astronomy to restore an object and uniquely determine its spatial orientation. Essence: a method of reconstructing an object from its diffraction pattern consists in that, in addition to recovering the object, a part of the scattered object field is extracted, it is deformed nonuniformly and the primary diffraction pattern and diffraction pattern obtained from the structure of the initial diffraction pattern are recorded, according to which judge about the orientation of the object. Moreover, as an object, you can use the simulated radiation with a known orientation. 1 C.p. f-ls, 5 silt,

Description

/ The invention relates to the field of pattern recognition, laser location and can be used in optics, space technology, astronomy to restore an object and uniquely determine its spatial orientation.

The aim of the invention is to increase the information content by determining the orientation of the object.

To do this, a part of the radiation is extracted from the field scattered by the object, its phase structure is changed by deformation, additional primary and secondary diffraction patterns and any other primary and secondary diffraction patterns are recorded, and the orientation of the object is judged. As the scattered object field, simulated radiation is used, recovered from a scattering object with a known orientation, while the deformation of a part of the radiation is carried out according to the same law as the true object field.

Fig. 1 is a block diagram of a device implementing the method, indicating all interconnections between the blocks; figure 2 shows one of the possible structural solutions of the device.

The block diagram shown in FIG. 1 contains a coherent radiating unit 1, optically coupled through an object unit 2 to a dividing unit of an object field 3, which in turn is through an inhomogeneous deformation unit of an object field 4, and also directly optically connected to the block registration of the primary diffraction pattern 5. The coherent lighting unit 6 through unit 5 is optically coupled to the registration unit of the secondary diffraction pattern from the structure of the primary diffraction pattern 7, which is optically coupled to the analysis units 8 and restoration of the facility by a.s. No. 466798 and a unit for analyzing and determining the orientation of the object 10.

Block 8 is informationally coupled to a block for modeling a scattering object 9,

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which is optically coupled through blocks 4,5,7 with block 10.

The method is carried out as follows.

The distant object 2 is highlighted by laser radiation from the source 1. The field reflected by the object, which has passed through the telescopic system T, is split into two parts by the translucent mirror 3. One part falls onto photographic plate 5.1, and the second one falls onto photographic plate 5.2 after reflection from the curved mirror 4. Photographic plates 5.1 and 5.2 are located in the plane of the exit pupil of the telescope or in its conjugate plane, and mirror 4 has a known surface curvature. The resulting transparency 5.1 (photochemically processed photographic plate 5. is mounted directly in front of the Oa lens and is illuminated by a parallel coherent beam formed by the source 1.1 and the OL lens. In the Fourier plane of the Oa lens, the intensity distribution is recorded in the secondary diffraction pattern using the PMT 7, according to which a.c. 466798 defines an object.After that, a diffuser M and aperture D simulate the object (the diaphragm forms the contours of the object, and frosted glass M simulates the scattering surface object), illuminate such a model object with coherent light from a laser 1.2 and record the objective field reflected by a curved mirror 4 on photographic plate 5.3. Transparencies 5.2 and 5.3 (photochemically processed photographic plates 5.2 and 5.3) are illuminated with a parallel coherent beam formed by source 6 and the Oz lens Directly behind the banner0

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5.2 and 5.3 install lenses 04 and OB, in the focal planes of which, with the help of PMTs 7.1 and 7.2, the intensity distribution in the secondary diffraction patterns is recorded. Computer 10 compares these patterns and determines the orientation of the object under study as coinciding with the orientation of the model, in the case of similarity of paintings, or as the centrally symmetric orientation of the model object in the absence of similarity.

Claims (2)

1. A method of reconstructing an object from its diffraction pattern, including recording a primary diffraction pattern from an object, illuminating it with monochromatic light and registering a secondary diffraction pattern, which is important and so that, in order to increase the information content by determining orientation of the object, extract part of the radiation scattered from the field by the object, change its phase structure by deformation, register additional primary and secondary diffraction patterns and, comparing the primary and secondary th secondary diffraction patterns is judged on the orientation of the object. ; 2. The method according to claim 1, with the exception that the modeled radiation recovered from the scattering object with a known orientation is used as a scattered object field, while the deformation of a part of the radiation is carried out in the same way the law as the true object sex., FIG. FIG. 2