PL396135A1 - Device for testing defects used for testing of a formed sheet - Google Patents

Device for testing defects used for testing of a formed sheet

Info

Publication number
PL396135A1
PL396135A1 PL396135A PL39613509A PL396135A1 PL 396135 A1 PL396135 A1 PL 396135A1 PL 396135 A PL396135 A PL 396135A PL 39613509 A PL39613509 A PL 39613509A PL 396135 A1 PL396135 A1 PL 396135A1
Authority
PL
Poland
Prior art keywords
testing
formed sheet
defects used
defects
testing defects
Prior art date
Application number
PL396135A
Other languages
Polish (pl)
Inventor
Osamu Hirose
Original Assignee
Sumitomo Chemical Company, Limited
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Chemical Company, Limited filed Critical Sumitomo Chemical Company, Limited
Publication of PL396135A1 publication Critical patent/PL396135A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/8921—Streaks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G01N21/8903—Optical details; Scanning details using a multiple detector array
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9511—Optical elements other than lenses, e.g. mirrors
PL396135A 2008-11-21 2009-11-17 Device for testing defects used for testing of a formed sheet PL396135A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008298680A JP5619348B2 (en) 2008-11-21 2008-11-21 Mold sheet inspection system

Publications (1)

Publication Number Publication Date
PL396135A1 true PL396135A1 (en) 2011-12-05

Family

ID=42198000

Family Applications (1)

Application Number Title Priority Date Filing Date
PL396135A PL396135A1 (en) 2008-11-21 2009-11-17 Device for testing defects used for testing of a formed sheet

Country Status (8)

Country Link
JP (1) JP5619348B2 (en)
KR (1) KR20110095344A (en)
CN (1) CN102224412A (en)
CZ (1) CZ2011295A3 (en)
PL (1) PL396135A1 (en)
SK (1) SK50342011A3 (en)
TW (1) TW201033602A (en)
WO (1) WO2010058557A1 (en)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BR112013015006B1 (en) * 2010-12-23 2020-10-20 Pirelli Tyre S.P.A method and apparatus for controlling the production and feeding of semi-finished products in a tire construction process
CN104583761B (en) * 2012-08-28 2016-12-21 住友化学株式会社 Flaw detection apparatus and defect detecting method
CN102854193A (en) * 2012-08-30 2013-01-02 苏州天准精密技术有限公司 Detection method and detection system used for image defect detection
TWI607212B (en) * 2013-01-16 2017-12-01 住友化學股份有限公司 Image generation device, defect inspection device, and defect inspection method
KR102110006B1 (en) * 2013-01-16 2020-05-12 스미또모 가가꾸 가부시키가이샤 Image generation device, defect inspection device, and defect inspection method
JP6191627B2 (en) * 2013-01-30 2017-09-06 住友化学株式会社 Image generating apparatus, defect inspection apparatus, and defect inspection method
TWI451076B (en) * 2013-02-08 2014-09-01 Benq Materials Corp A method of detecting stain on the optical lens
JP6250317B2 (en) * 2013-07-08 2017-12-20 住友化学株式会社 Defect inspection method
TWI493177B (en) * 2013-10-15 2015-07-21 Benq Materials Corp Method of detecting defect on optical film with periodic structure and device thereof
WO2015069218A1 (en) * 2013-11-05 2015-05-14 Compagnie Generale Des Etablissements Michelin Method and apparatus for non-destructive detection of tire anomalies
US20190094150A1 (en) * 2014-11-18 2019-03-28 Mitsubishi Chemical Corporation Method for mending metallic plate and method for manufacturing mold
JP6590653B2 (en) * 2014-11-19 2019-10-16 首都高技術株式会社 Point cloud data utilization system
CN105785604A (en) * 2014-12-24 2016-07-20 台湾动力检测科技股份有限公司 Defect detection method for optical layer element of display device
CN107709628B (en) 2015-06-26 2020-06-16 美泰乐科技(日本)股份有限公司 Replacement preventing agent for electrolytic hard gold plating solution and electrolytic hard gold plating solution containing same
JP6628185B2 (en) * 2016-03-11 2020-01-08 パナソニックＩｐマネジメント株式会社 Inspection method for transparent objects
JP2017211325A (en) * 2016-05-27 2017-11-30 株式会社ニレコ Defect inspection method and defect inspection device
JP2017215277A (en) * 2016-06-02 2017-12-07 住友化学株式会社 Defect inspection system, film manufacturing device and defect inspection method
JP2017217649A (en) * 2016-06-02 2017-12-14 国立大学法人九州大学 Detection device for breakage suspected portion of capping sheet, method for detection of breakage suspected portion of capping sheet, and computer program
JP6622679B2 (en) * 2016-10-26 2019-12-18 川崎重工業株式会社 Circle scratch inspection device
KR102438892B1 (en) * 2017-03-03 2022-08-31 스미또모 가가꾸 가부시키가이샤 Defect inspection system, film manufacturing apparatus, film manufacturing method, printing apparatus and printing method
WO2019039331A1 (en) * 2017-08-24 2019-02-28 日本電気硝子株式会社 Method for manufacturing glass sheet
JP7048342B2 (en) * 2018-02-15 2022-04-05 株式会社島精機製作所 Extension method and extension system
CN110857920A (en) * 2018-08-24 2020-03-03 东华大学 Method for detecting poor forming defect of coiled filament
KR20210073561A (en) * 2018-10-15 2021-06-18 쓰리엠 이노베이티브 프로퍼티즈 컴파니 Automated inspection of sheet parts of any shape from manufacturing film
JP2022522856A (en) * 2019-03-05 2022-04-20 フィリップ・モーリス・プロダクツ・ソシエテ・アノニム Inspection stations and methods for inspecting sheet materials
JP2020190441A (en) * 2019-05-20 2020-11-26 セーレン株式会社 Wrinkle inspection device, wrinkle determination device, and wrinkle inspection method
CN116993719A (en) * 2023-09-25 2023-11-03 惠州艺都宇正数码科技有限公司 OCA optical film surface defect visual detection method and system

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09159622A (en) * 1995-12-05 1997-06-20 Kawasaki Steel Corp Surface defect inspection equipment
JP4507533B2 (en) * 2003-08-29 2010-07-21 凸版印刷株式会社 Method for inspecting streaky irregularities in periodic patterns
JP4882204B2 (en) * 2004-03-05 2012-02-22 凸版印刷株式会社 Method for inspecting streaky irregularities in periodic patterns
JP5006551B2 (en) * 2006-02-14 2012-08-22 住友化学株式会社 Defect inspection apparatus and defect inspection method
JP5367292B2 (en) * 2008-03-31 2013-12-11 古河電気工業株式会社 Surface inspection apparatus and surface inspection method

Also Published As

Publication number Publication date
JP2010122192A (en) 2010-06-03
JP5619348B2 (en) 2014-11-05
CN102224412A (en) 2011-10-19
CZ2011295A3 (en) 2011-11-09
SK50342011A3 (en) 2011-09-05
WO2010058557A1 (en) 2010-05-27
TW201033602A (en) 2010-09-16
KR20110095344A (en) 2011-08-24

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