PL3491427T3 - Obrazowanie rozproszone - Google Patents

Obrazowanie rozproszone

Info

Publication number
PL3491427T3
PL3491427T3 PL17761305.6T PL17761305T PL3491427T3 PL 3491427 T3 PL3491427 T3 PL 3491427T3 PL 17761305 T PL17761305 T PL 17761305T PL 3491427 T3 PL3491427 T3 PL 3491427T3
Authority
PL
Poland
Prior art keywords
scatter imaging
scatter
imaging
Prior art date
Application number
PL17761305.6T
Other languages
English (en)
Inventor
Guillaume JEGOU
Original Assignee
Smiths Detection France S.A.S.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from GB1613065.0A external-priority patent/GB2552535B/en
Priority claimed from GB1613072.6A external-priority patent/GB2555564B/en
Application filed by Smiths Detection France S.A.S. filed Critical Smiths Detection France S.A.S.
Publication of PL3491427T3 publication Critical patent/PL3491427T3/pl

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/222Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays measuring scattered radiation
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KHANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators

Landscapes

  • Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Geophysics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
PL17761305.6T 2016-07-28 2017-07-27 Obrazowanie rozproszone PL3491427T3 (pl)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB1613065.0A GB2552535B (en) 2016-07-28 2016-07-28 Detection of scatter radiation
GB1613072.6A GB2555564B (en) 2016-07-28 2016-07-28 Scatter imaging
PCT/GB2017/052202 WO2018020261A1 (en) 2016-07-28 2017-07-27 Scatter imaging

Publications (1)

Publication Number Publication Date
PL3491427T3 true PL3491427T3 (pl) 2026-05-11

Family

ID=59761994

Family Applications (1)

Application Number Title Priority Date Filing Date
PL17761305.6T PL3491427T3 (pl) 2016-07-28 2017-07-27 Obrazowanie rozproszone

Country Status (5)

Country Link
US (1) US11016218B2 (pl)
EP (1) EP3491427B1 (pl)
CN (1) CN110199209B (pl)
PL (1) PL3491427T3 (pl)
WO (1) WO2018020261A1 (pl)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12474279B2 (en) * 2020-05-06 2025-11-18 Istituto Nazionale Di Fisica Nucleare Collimator
CN111487262A (zh) * 2020-06-23 2020-08-04 清华大学 用于进行辐射成像和放射性物质监测的融合系统和方法

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0271723B1 (de) 1986-11-26 1990-06-27 Heimann GmbH Röntgenscanner
EP0910807B1 (en) * 1996-07-12 2003-03-19 American Science & Engineering, Inc. Side scatter tomography system
CN1164928C (zh) * 2001-09-21 2004-09-01 清华大学 一种X或γ辐射成像无损检测方法与装置
US7065175B2 (en) 2003-03-03 2006-06-20 Varian Medical Systems Technologies, Inc. X-ray diffraction-based scanning system
GB0525593D0 (en) 2005-12-16 2006-01-25 Cxr Ltd X-ray tomography inspection systems
GB2403388A (en) * 2003-06-24 2004-12-29 Secr Defence X-ray inspection system having X-ray source with compound fluorescent secondary target
DE102004060610A1 (de) * 2004-12-16 2006-06-29 Yxlon International Security Gmbh Anordnung zum Messen des Impulsübertragungsspektrums von elastisch gestreuten Röntgenquanten sowie Verfahren zur Bestimmung dieses Impulsübertragungsspektrums
US7924979B2 (en) * 2006-08-23 2011-04-12 American Science And Engineering, Inc. Scatter attenuation tomography
US7840360B1 (en) * 2006-10-26 2010-11-23 Micheels Ronald H Optical system and method for inspection and characterization of liquids in vessels
CN102519988B (zh) * 2008-05-09 2014-08-20 清华大学 创建识别材料的函数曲线的方法和装置
US7835495B2 (en) * 2008-10-31 2010-11-16 Morpho Detection, Inc. System and method for X-ray diffraction imaging
EP3686901A1 (en) * 2009-05-26 2020-07-29 Rapiscan Systems, Inc. X-ray tomographic inspection method
CN101655465B (zh) * 2009-08-28 2012-03-07 北京睿思厚德辐射信息科技开发有限公司 点线复合扫描背散射和立体透射成像装置
JP5467830B2 (ja) * 2009-09-18 2014-04-09 浜松ホトニクス株式会社 放射線検出装置
MX2012009921A (es) 2010-02-25 2012-12-17 Rapiscan Systems Inc Un sistema de inspeccion basado en espectroscopia de rayos x de alta energia y metodos para determinar el numero atomico de materiales.
CN102313752B (zh) 2010-06-30 2014-07-23 清华大学 物品检测设备及其检测方法
WO2012109273A2 (en) * 2011-02-08 2012-08-16 Rapiscan Systems, Inc. Covert surveillance using multi-modality sensing
DE102011103851B4 (de) * 2011-05-26 2019-05-29 Siemens Healthcare Gmbh Gittermodul eines Streustrahlungsgitters, modulares Streustrahlungsgitter, CT-Detektor und CT-System
US9076563B2 (en) * 2013-06-03 2015-07-07 Zhengrong Ying Anti-scatter collimators for detector systems of multi-slice X-ray computed tomography systems
CN104749199B (zh) * 2013-12-30 2019-02-19 同方威视技术股份有限公司 双能/双视角的高能x射线透视成像系统
CN104062688A (zh) * 2014-07-04 2014-09-24 同方威视技术股份有限公司 基于分布式辐射源的x射线背散射通道式车辆安检系统和方法
JP6946180B2 (ja) * 2014-09-08 2021-10-06 コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. コンピュータ断層撮影法におけるスペクトル及び強度の格子変調のためのシステム及び方法
CN204405569U (zh) * 2014-12-25 2015-06-17 清华大学 车辆辐射成像检测系统

Also Published As

Publication number Publication date
US20190179050A1 (en) 2019-06-13
EP3491427B1 (en) 2025-10-15
EP3491427C0 (en) 2025-10-15
US11016218B2 (en) 2021-05-25
EP3491427A1 (en) 2019-06-05
WO2018020261A1 (en) 2018-02-01
CN110199209B (zh) 2021-07-30
CN110199209A (zh) 2019-09-03

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