PL3449508T3 - Detektor promieniowania i sposób jego wytwarzania - Google Patents

Detektor promieniowania i sposób jego wytwarzania

Info

Publication number
PL3449508T3
PL3449508T3 PL18700149T PL18700149T PL3449508T3 PL 3449508 T3 PL3449508 T3 PL 3449508T3 PL 18700149 T PL18700149 T PL 18700149T PL 18700149 T PL18700149 T PL 18700149T PL 3449508 T3 PL3449508 T3 PL 3449508T3
Authority
PL
Poland
Prior art keywords
radiation detector
producing same
producing
same
detector
Prior art date
Application number
PL18700149T
Other languages
English (en)
Inventor
Adam Rämer
Sergey Shevchenko
Original Assignee
Forschungsverbund Berlin E.V.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Forschungsverbund Berlin E.V. filed Critical Forschungsverbund Berlin E.V.
Publication of PL3449508T3 publication Critical patent/PL3449508T3/pl

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
    • H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
    • H10F30/21—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation
    • H10F30/28—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices being characterised by field-effect operation, e.g. junction field-effect phototransistors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
    • H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
    • H10F30/21—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation
    • H10F30/28—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices being characterised by field-effect operation, e.g. junction field-effect phototransistors
    • H10F30/282—Insulated-gate field-effect transistors [IGFET], e.g. MISFET [metal-insulator-semiconductor field-effect transistor] phototransistors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/026—Control of working procedures of a pyrometer, other than calibration; Bandwidth calculation; Gain control
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01Q—ANTENNAS, i.e. RADIO AERIALS
    • H01Q1/00—Details of, or arrangements associated with, antennas
    • H01Q1/12—Supports; Mounting means
    • H01Q1/22—Supports; Mounting means by structural association with other equipment or articles
    • H01Q1/2283—Supports; Mounting means by structural association with other equipment or articles mounted in or on the surface of a semiconductor substrate as a chip-type antenna or integrated with other components into an IC package
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01Q—ANTENNAS, i.e. RADIO AERIALS
    • H01Q9/00—Electrically-short antennas having dimensions not more than twice the operating wavelength and consisting of conductive active radiating elements
    • H01Q9/04—Resonant antennas
    • H01Q9/16—Resonant antennas with feed intermediate between the extremities of the antenna, e.g. centre-fed dipole
    • H01Q9/28—Conical, cylindrical, cage, strip, gauze, or like elements having an extended radiating surface; Elements comprising two conical surfaces having collinear axes and adjacent apices and fed by two-conductor transmission lines
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/40—Crystalline structures
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
    • H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
    • H10F30/21—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation
    • H10F30/28—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices being characterised by field-effect operation, e.g. junction field-effect phototransistors
    • H10F30/283—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices being characterised by field-effect operation, e.g. junction field-effect phototransistors the devices having Schottky gates
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00—Constructional details of devices covered by this subclass
    • H10F77/93—Interconnections
    • H10F77/933—Interconnections for devices having potential barriers
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W20/00—Interconnections in chips, wafers or substrates
    • H10W20/40—Interconnections external to wafers or substrates, e.g. back-end-of-line [BEOL] metallisations or vias connecting to gate electrodes
    • H10W20/495—Capacitive arrangements or effects of, or between wiring layers
    • H10W20/496—Capacitor integral with wiring layers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/0014—Radiation pyrometry, e.g. infrared or optical thermometry for sensing the radiation from gases, flames
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01Q—ANTENNAS, i.e. RADIO AERIALS
    • H01Q13/00—Waveguide horns or mouths; Slot antennas; Leaky-waveguide antennas; Equivalent structures causing radiation along the transmission path of a guided wave
    • H01Q13/10—Resonant slot antennas
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01Q—ANTENNAS, i.e. RADIO AERIALS
    • H01Q23/00—Antennas with active circuits or circuit elements integrated within them or attached to them
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00—Field-effect transistors [FET]
    • H10D30/40—FETs having zero-dimensional [0D], one-dimensional [1D] or two-dimensional [2D] charge carrier gas channels
    • H10D30/47—FETs having zero-dimensional [0D], one-dimensional [1D] or two-dimensional [2D] charge carrier gas channels having two-dimensional [2D] charge carrier gas channels, e.g. nanoribbon FETs or high electron mobility transistors [HEMT]
    • H10D30/471—High electron mobility transistors [HEMT] or high hole mobility transistors [HHMT]
    • H10D30/475—High electron mobility transistors [HEMT] or high hole mobility transistors [HHMT] having wider bandgap layer formed on top of lower bandgap active layer, e.g. undoped barrier HEMTs such as i-AlGaN/GaN HEMTs
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/80—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
    • H10D62/85—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group III-V materials, e.g. GaAs
    • H10D62/8503—Nitride Group III-V materials, e.g. AlN or GaN

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Junction Field-Effect Transistors (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Variable-Direction Aerials And Aerial Arrays (AREA)
  • Waveguide Aerials (AREA)
PL18700149T 2017-02-23 2018-01-10 Detektor promieniowania i sposób jego wytwarzania PL3449508T3 (pl)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102017103687.3A DE102017103687B3 (de) 2017-02-23 2017-02-23 Strahlungsdetektor und Verfahren zu dessen Herstellung
PCT/EP2018/050501 WO2018153557A1 (de) 2017-02-23 2018-01-10 Strahlungsdetektor und verfahren zu dessen herstellung
EP18700149.0A EP3449508B1 (de) 2017-02-23 2018-01-10 Strahlungsdetektor und verfahren zu dessen herstellung

Publications (1)

Publication Number Publication Date
PL3449508T3 true PL3449508T3 (pl) 2021-02-08

Family

ID=60943030

Family Applications (1)

Application Number Title Priority Date Filing Date
PL18700149T PL3449508T3 (pl) 2017-02-23 2018-01-10 Detektor promieniowania i sposób jego wytwarzania

Country Status (7)

Country Link
US (1) US10825947B2 (pl)
EP (1) EP3449508B1 (pl)
JP (1) JP6914967B2 (pl)
DE (1) DE102017103687B3 (pl)
ES (1) ES2822275T3 (pl)
PL (1) PL3449508T3 (pl)
WO (1) WO2018153557A1 (pl)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20240081150A1 (en) * 2019-10-10 2024-03-07 Sony Semiconductor Solutions Corporation Electromagnetic wave detection device, electromagnetic wave detection system, and electromagnetic wave detection method
JP2021077665A (ja) * 2019-11-05 2021-05-20 ソニーセミコンダクタソリューションズ株式会社 半導体装置および電子機器
US20230154227A1 (en) * 2020-03-13 2023-05-18 Fingerprint Cards Anacatum Ip Ab A terahertz biometric imaging package
CN113994394A (zh) * 2020-03-13 2022-01-28 指纹卡安娜卡敦知识产权有限公司 显示器下的无源太赫兹生物特征成像装置
EP4118570A4 (en) 2020-03-13 2023-10-25 Fingerprint Cards Anacatum IP AB UNDER-SCREEN TERAHERTZ BIOMETRIC IMAGING ARRANGEMENT
CN112467341B (zh) * 2020-11-10 2022-10-18 浙江中烟工业有限责任公司 一种基于石墨烯的频率可调谐车载天线
US12166033B2 (en) * 2020-11-26 2024-12-10 Innolux Corporation Electronic device
CN113639866B (zh) * 2021-08-25 2024-05-28 中国科学院苏州纳米技术与纳米仿生研究所 场效应宽谱探测器
CN116973333A (zh) * 2023-08-03 2023-10-31 浙大城市学院 基于超表面的太赫兹微型光谱仪

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004241471A (ja) * 2003-02-04 2004-08-26 Renesas Technology Corp 化合物半導体装置とその製造方法、半導体装置及び高周波モジュール
US7638817B2 (en) * 2004-04-26 2009-12-29 Sensor Electronic Technology, Inc. Device and method for managing radiation
US7957648B2 (en) * 2005-02-28 2011-06-07 The Invention Science Fund I, Llc Electromagnetic device with integral non-linear component
DE102007062562B4 (de) 2007-12-22 2009-10-01 Johann Wolfgang Goethe-Universität Frankfurt am Main Monolithisch integrierter Antennen- und Empfängerschaltkreis für die Erfassung von Terahertz-Wellen
DE102008047101A1 (de) 2008-09-12 2010-03-25 Bergische Universität Wuppertal Verteilter resistiver Mischer
JP2010135520A (ja) * 2008-12-03 2010-06-17 Panasonic Corp テラヘルツ受信素子
US8809834B2 (en) * 2009-07-06 2014-08-19 University Of Seoul Industry Cooperation Foundation Photodetector capable of detecting long wavelength radiation
JP2012175034A (ja) * 2011-02-24 2012-09-10 Panasonic Corp テラヘルツ波素子
DE102011076840B4 (de) 2011-05-31 2013-08-01 Johann Wolfgang Goethe-Universität Frankfurt am Main Monolithisch integrierter Antennen- und Empfängerschaltkreis und THz-Heterodynempfänger und bildgebendes System, diesen aufweisend, und Verwendung dieser zur Erfassung elektromagnetischer Strahlung im THz-Frequenzbereich
JP2015144248A (ja) * 2013-12-25 2015-08-06 キヤノン株式会社 半導体装置、及びその製造方法

Also Published As

Publication number Publication date
EP3449508A1 (de) 2019-03-06
US20190393374A1 (en) 2019-12-26
US10825947B2 (en) 2020-11-03
JP6914967B2 (ja) 2021-08-04
DE102017103687B3 (de) 2018-04-26
JP2020510323A (ja) 2020-04-02
ES2822275T3 (es) 2021-04-30
EP3449508B1 (de) 2020-07-01
WO2018153557A1 (de) 2018-08-30

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