PL3410091T3 - Sposób wykrywania funkcji przenoszenia modulacji i osiowania układu optycznego - Google Patents

Sposób wykrywania funkcji przenoszenia modulacji i osiowania układu optycznego

Info

Publication number
PL3410091T3
PL3410091T3 PL17174143T PL17174143T PL3410091T3 PL 3410091 T3 PL3410091 T3 PL 3410091T3 PL 17174143 T PL17174143 T PL 17174143T PL 17174143 T PL17174143 T PL 17174143T PL 3410091 T3 PL3410091 T3 PL 3410091T3
Authority
PL
Poland
Prior art keywords
detecting
transfer function
modulation transfer
optical system
centring
Prior art date
Application number
PL17174143T
Other languages
English (en)
Inventor
Iris Erichsen
Alexander Bai
Simon Zilian
Aiko Ruprecht
Eugen Dumitrescu
Patrik Langehanenberg
Original Assignee
Trioptics Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Trioptics Gmbh filed Critical Trioptics Gmbh
Publication of PL3410091T3 publication Critical patent/PL3410091T3/pl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0292—Testing optical properties of objectives by measuring the optical modulation transfer function
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0207—Details of measuring devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0207—Details of measuring devices
    • G01M11/0214—Details of devices holding the object to be tested
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0221—Testing optical properties by determining the optical axis or position of lenses
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/003—Alignment of optical elements
    • G02B7/005—Motorised alignment

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Lens Barrels (AREA)
  • Mounting And Adjusting Of Optical Elements (AREA)
PL17174143T 2017-06-02 2017-06-02 Sposób wykrywania funkcji przenoszenia modulacji i osiowania układu optycznego PL3410091T3 (pl)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP17174143.2A EP3410091B1 (de) 2017-06-02 2017-06-02 Verfahren zum erfassen einer modulations-transferfunktion und einer zentrierung eines optischen systems

Publications (1)

Publication Number Publication Date
PL3410091T3 true PL3410091T3 (pl) 2022-01-17

Family

ID=59053920

Family Applications (1)

Application Number Title Priority Date Filing Date
PL17174143T PL3410091T3 (pl) 2017-06-02 2017-06-02 Sposób wykrywania funkcji przenoszenia modulacji i osiowania układu optycznego

Country Status (5)

Country Link
US (1) US10942087B2 (pl)
EP (1) EP3410091B1 (pl)
JP (2) JP7160564B2 (pl)
CN (2) CN108982070B (pl)
PL (1) PL3410091T3 (pl)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
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KR20210145439A (ko) * 2020-05-25 2021-12-02 삼성전기주식회사 장착 구조물 및 이를 구비하는 검사 장치
CN112304574B (zh) * 2020-09-22 2022-11-01 华中光电技术研究所（中国船舶重工集团公司第七一七研究所） 一种含有光学消旋组件的光学系统的像质测试装置及方法
DE102020125064A1 (de) * 2020-09-25 2022-03-31 Trioptics Gmbh MTF-Prüfgerät und dessen Verwendung
CN112285940B (zh) * 2020-10-29 2022-10-25 中国航空工业集团公司洛阳电光设备研究所 一种双视场镜头的光轴一致性装校方法
CN112507593B (zh) * 2020-12-16 2022-06-21 福州大学 一种振动对多孔径光学系统mtf影响的评价方法
DE102021105027A1 (de) * 2021-03-02 2022-09-08 Trioptics Gmbh Vorrichtung und Verfahren zum Messen von Abbildungseigenschaften eines optischen Systems
CN113702008B (zh) * 2021-09-22 2024-01-30 谷东科技有限公司 光学成像系统的像质检测方法及装置

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WO2017154945A1 (ja) * 2016-03-10 2017-09-14 パナソニックＩｐマネジメント株式会社 光学検査装置、レンズ、および光学検査方法
CN106768899B (zh) * 2017-03-28 2023-10-20 南京波长光电科技股份有限公司 一种用于镜片生产的mtf检测装置及检测镜片的方法

Also Published As

Publication number Publication date
JP2022191392A (ja) 2022-12-27
CN108982070B (zh) 2022-03-15
JP2019049524A (ja) 2019-03-28
CN108982070A (zh) 2018-12-11
EP3410091B1 (de) 2021-08-11
EP3410091A1 (de) 2018-12-05
JP7274032B2 (ja) 2023-05-15
CN114518220B (zh) 2023-06-27
JP7160564B2 (ja) 2022-10-25
US20180348084A1 (en) 2018-12-06
CN114518220A (zh) 2022-05-20
US10942087B2 (en) 2021-03-09

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