PL3022762T3 - Wlot spektrometru masowego o zmniejszonym średnim przepływie - Google Patents

Wlot spektrometru masowego o zmniejszonym średnim przepływie

Info

Publication number
PL3022762T3
PL3022762T3 PL14826637.2T PL14826637T PL3022762T3 PL 3022762 T3 PL3022762 T3 PL 3022762T3 PL 14826637 T PL14826637 T PL 14826637T PL 3022762 T3 PL3022762 T3 PL 3022762T3
Authority
PL
Poland
Prior art keywords
mass spectrometer
average flow
reduced average
spectrometer inlet
inlet
Prior art date
Application number
PL14826637.2T
Other languages
English (en)
Inventor
Vadym Berkout
Original Assignee
Smiths Detection Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Smiths Detection Inc. filed Critical Smiths Detection Inc.
Publication of PL3022762T3 publication Critical patent/PL3022762T3/pl

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0495—Vacuum locks; Valves
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0422—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for gaseous samples
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H01J49/0031—Step by step routines describing the use of the apparatus
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0468—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
PL14826637.2T 2013-07-19 2014-07-07 Wlot spektrometru masowego o zmniejszonym średnim przepływie PL3022762T3 (pl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201361856389P 2013-07-19 2013-07-19
PCT/US2014/045600 WO2015009478A1 (en) 2013-07-19 2014-07-07 Mass spectrometer inlet with reduced average flow

Publications (1)

Publication Number Publication Date
PL3022762T3 true PL3022762T3 (pl) 2022-10-17

Family

ID=52346636

Family Applications (1)

Application Number Title Priority Date Filing Date
PL14826637.2T PL3022762T3 (pl) 2013-07-19 2014-07-07 Wlot spektrometru masowego o zmniejszonym średnim przepływie

Country Status (10)

Country Link
US (1) US9679754B2 (pl)
EP (1) EP3022762B1 (pl)
JP (1) JP6488294B2 (pl)
KR (1) KR102248457B1 (pl)
CN (2) CN105493227B (pl)
CA (1) CA2918143C (pl)
MX (1) MX359727B (pl)
PL (1) PL3022762T3 (pl)
RU (2) RU2671228C2 (pl)
WO (1) WO2015009478A1 (pl)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9842728B2 (en) * 2013-07-19 2017-12-12 Smiths Detection Ion transfer tube with intermittent inlet
CN109789420B (zh) 2016-09-02 2021-09-24 得克萨斯大学体系董事会 收集探针及其使用方法
WO2019053850A1 (ja) * 2017-09-14 2019-03-21 株式会社島津製作所 液体クロマトグラフ
JP2021504703A (ja) * 2017-11-27 2021-02-15 ボード・オブ・リージエンツ，ザ・ユニバーシテイ・オブ・テキサス・システム 低侵襲性収集プローブおよびその使用方法
GB201808892D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Mass spectrometer
GB201808932D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808912D0 (en) * 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808949D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
US11373849B2 (en) 2018-05-31 2022-06-28 Micromass Uk Limited Mass spectrometer having fragmentation region
GB201808890D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808893D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
WO2019229469A1 (en) 2018-05-31 2019-12-05 Micromass Uk Limited Mass spectrometer
GB201808894D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Mass spectrometer
GB201808936D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
WO2019236139A1 (en) * 2018-06-04 2019-12-12 The Trustees Of Indiana University Interface for transporting ions from an atmospheric pressure environment to a low pressure environment
EP3852129A4 (en) 2018-09-11 2021-10-27 Lg Chem, Ltd. INTERFACE UNIT
WO2024100977A1 (ja) * 2022-11-10 2024-05-16 株式会社島津製作所 質量分析装置

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* Cited by examiner, † Cited by third party
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US3500040A (en) * 1967-09-28 1970-03-10 Universal Oil Prod Co Sample introduction system for mass spectrometer analysis
JPS6215747A (ja) * 1985-07-15 1987-01-24 Hitachi Ltd 質量分析計
JPH03261062A (ja) * 1990-03-09 1991-11-20 Hitachi Ltd プラズマ極微量元素質量分析装置
JPH06302295A (ja) * 1993-04-14 1994-10-28 Hitachi Ltd 質量分析装置および差動排気装置
JPH06302296A (ja) 1993-04-16 1994-10-28 Shimadzu Corp 宇宙空間ガス分析装置
JPH06310091A (ja) * 1993-04-26 1994-11-04 Hitachi Ltd 大気圧イオン化質量分析計
US6518581B1 (en) * 2000-03-31 2003-02-11 Air Products And Chemicals, Inc. Apparatus for control of gas flow into a mass spectrometer using a series of small orifices
US20080116370A1 (en) * 2006-11-17 2008-05-22 Maurizio Splendore Apparatus and method for a multi-stage ion transfer tube assembly for use with mass spectrometry
WO2009023361A2 (en) * 2007-06-01 2009-02-19 Purdue Research Foundation Discontinuous atmospheric pressure interface
JP4885110B2 (ja) * 2007-11-07 2012-02-29 三菱重工業株式会社 試料導入装置及び試料分析システム
WO2009143623A1 (en) * 2008-05-30 2009-12-03 Mds Analytical Technologies Method and system for vacuum driven differential mobility spectrometer/mass spectrometer interface with adjustable resolution and selectivity
CN101713761A (zh) * 2008-10-06 2010-05-26 中国科学院大连化学物理研究所 一种用于在线质谱中实时分析多环芳烃样品的进样装置
EP2338160A4 (en) * 2008-10-13 2015-12-23 Purdue Research Foundation SYSTEMS AND METHODS FOR ION TRANSFER FOR ANALYSIS
RU2389004C1 (ru) * 2009-01-11 2010-05-10 Физико-технический институт Уральского отделения Российской Академии Наук ФТИ УрО РАН Устройство для ввода образца в вакуумную камеру
US8424367B2 (en) * 2009-03-04 2013-04-23 University Of South Carolina Systems and methods for measurement of gas permeation through polymer films
US8859957B2 (en) * 2010-02-26 2014-10-14 Purdue Research Foundation Systems and methods for sample analysis
JP5604165B2 (ja) * 2010-04-19 2014-10-08 株式会社日立ハイテクノロジーズ 質量分析装置
JP5497615B2 (ja) * 2010-11-08 2014-05-21 株式会社日立ハイテクノロジーズ 質量分析装置
JP6019037B2 (ja) * 2011-01-20 2016-11-02 パーデュー・リサーチ・ファウンデーションＰｕｒｄｕｅ Ｒｅｓｅａｒｃｈ Ｆｏｕｎｄａｔｉｏｎ 不連続の大気インターフェースの周期とのイオン形成の同期のためのシステムおよび方法
WO2012162036A1 (en) * 2011-05-20 2012-11-29 Purdue Research Foundation (Prf) Systems and methods for analyzing a sample
JP6025406B2 (ja) * 2012-06-04 2016-11-16 株式会社日立ハイテクノロジーズ 質量分析装置
GB2508574B (en) * 2012-06-24 2014-12-17 Fasmatech Science And Technology Sa Improvements in and relating to the control of ions
US9406492B1 (en) * 2015-05-12 2016-08-02 The University Of North Carolina At Chapel Hill Electrospray ionization interface to high pressure mass spectrometry and related methods

Also Published As

Publication number Publication date
EP3022762A4 (en) 2017-03-08
MX359727B (es) 2018-10-08
US9679754B2 (en) 2017-06-13
CN105493227B (zh) 2018-05-01
US20160181079A1 (en) 2016-06-23
RU2769119C2 (ru) 2022-03-28
RU2016103609A (ru) 2017-08-24
RU2671228C2 (ru) 2018-10-30
CN108807131B (zh) 2021-09-14
CA2918143C (en) 2022-07-26
CN105493227A (zh) 2016-04-13
RU2018133810A (ru) 2019-03-19
EP3022762A1 (en) 2016-05-25
RU2018133810A3 (pl) 2022-01-25
RU2016103609A3 (pl) 2018-03-20
EP3022762B1 (en) 2022-04-27
JP2016530680A (ja) 2016-09-29
KR102248457B1 (ko) 2021-05-04
CA2918143A1 (en) 2015-01-22
WO2015009478A1 (en) 2015-01-22
MX2016000371A (es) 2016-09-29
JP6488294B2 (ja) 2019-03-20
KR20160033162A (ko) 2016-03-25
CN108807131A (zh) 2018-11-13

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