PL3022762T3 - Wlot spektrometru masowego o zmniejszonym średnim przepływie - Google Patents

Wlot spektrometru masowego o zmniejszonym średnim przepływie

Info

Publication number
PL3022762T3
PL3022762T3 PL14826637.2T PL14826637T PL3022762T3 PL 3022762 T3 PL3022762 T3 PL 3022762T3 PL 14826637 T PL14826637 T PL 14826637T PL 3022762 T3 PL3022762 T3 PL 3022762T3
Authority
PL
Poland
Prior art keywords
mass spectrometer
average flow
reduced average
spectrometer inlet
inlet
Prior art date
Application number
PL14826637.2T
Other languages
English (en)
Inventor
Vadym Berkout
Original Assignee
Smiths Detection Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Smiths Detection Inc. filed Critical Smiths Detection Inc.
Publication of PL3022762T3 publication Critical patent/PL3022762T3/pl

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0495—Vacuum locks; Valves
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0422—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for gaseous samples
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H01J49/0031—Step by step routines describing the use of the apparatus
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0468—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
PL14826637.2T 2013-07-19 2014-07-07 Wlot spektrometru masowego o zmniejszonym średnim przepływie PL3022762T3 (pl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201361856389P 2013-07-19 2013-07-19
PCT/US2014/045600 WO2015009478A1 (en) 2013-07-19 2014-07-07 Mass spectrometer inlet with reduced average flow

Publications (1)

Publication Number Publication Date
PL3022762T3 true PL3022762T3 (pl) 2022-10-17

Family

ID=52346636

Family Applications (1)

Application Number Title Priority Date Filing Date
PL14826637.2T PL3022762T3 (pl) 2013-07-19 2014-07-07 Wlot spektrometru masowego o zmniejszonym średnim przepływie

Country Status (10)

Country Link
US (1) US9679754B2 (pl)
EP (1) EP3022762B1 (pl)
JP (1) JP6488294B2 (pl)
KR (1) KR102248457B1 (pl)
CN (2) CN108807131B (pl)
CA (1) CA2918143C (pl)
MX (1) MX359727B (pl)
PL (1) PL3022762T3 (pl)
RU (2) RU2769119C2 (pl)
WO (1) WO2015009478A1 (pl)

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US9842728B2 (en) * 2013-07-19 2017-12-12 Smiths Detection Ion transfer tube with intermittent inlet
EP4357784A3 (en) 2016-09-02 2024-07-31 Board of Regents, The University of Texas System Collection probe and methods for the use thereof
US10983098B2 (en) * 2017-09-14 2021-04-20 Shimadzu Corporation Liquid chromatograph
JP2021504703A (ja) * 2017-11-27 2021-02-15 ボード・オブ・リージエンツ,ザ・ユニバーシテイ・オブ・テキサス・システム 低侵襲性収集プローブおよびその使用方法
GB201808893D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808932D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808894D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Mass spectrometer
WO2019229469A1 (en) 2018-05-31 2019-12-05 Micromass Uk Limited Mass spectrometer
GB201808892D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Mass spectrometer
WO2019229463A1 (en) 2018-05-31 2019-12-05 Micromass Uk Limited Mass spectrometer having fragmentation region
GB201808912D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808936D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808949D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808890D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
WO2019236139A1 (en) * 2018-06-04 2019-12-12 The Trustees Of Indiana University Interface for transporting ions from an atmospheric pressure environment to a low pressure environment
EP3852129B1 (en) 2018-09-11 2026-04-22 LG Energy Solution, Ltd. Interface unit
BR112021014553A2 (pt) 2019-01-25 2021-10-05 Board Of Regents, The University Of Texas System Aparelho e métodos para limpeza e/ou troca de dispositivos médicos
WO2021222154A1 (en) * 2020-04-27 2021-11-04 Board Of Regents, The University Of Texas System Detecting chemical compounds for forensic analysis
WO2024100977A1 (ja) * 2022-11-10 2024-05-16 株式会社島津製作所 質量分析装置

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US3500040A (en) 1967-09-28 1970-03-10 Universal Oil Prod Co Sample introduction system for mass spectrometer analysis
JPS6215747A (ja) * 1985-07-15 1987-01-24 Hitachi Ltd 質量分析計
JPH03261062A (ja) * 1990-03-09 1991-11-20 Hitachi Ltd プラズマ極微量元素質量分析装置
JPH06302295A (ja) * 1993-04-14 1994-10-28 Hitachi Ltd 質量分析装置および差動排気装置
JPH06302296A (ja) 1993-04-16 1994-10-28 Shimadzu Corp 宇宙空間ガス分析装置
JPH06310091A (ja) * 1993-04-26 1994-11-04 Hitachi Ltd 大気圧イオン化質量分析計
US6518581B1 (en) * 2000-03-31 2003-02-11 Air Products And Chemicals, Inc. Apparatus for control of gas flow into a mass spectrometer using a series of small orifices
US20080116370A1 (en) 2006-11-17 2008-05-22 Maurizio Splendore Apparatus and method for a multi-stage ion transfer tube assembly for use with mass spectrometry
CN101820979B (zh) * 2007-06-01 2014-05-14 普度研究基金会 不连续的大气压接口
JP4885110B2 (ja) * 2007-11-07 2012-02-29 三菱重工業株式会社 試料導入装置及び試料分析システム
JP5767581B2 (ja) * 2008-05-30 2015-08-19 ディーエイチ テクノロジーズ デベロップメント プライベート リミテッド 調整可能な選択性および分解能を有する真空駆動微分型移動度分析計/質量分析計のための方法およびシステム
CN101713761A (zh) * 2008-10-06 2010-05-26 中国科学院大连化学物理研究所 一种用于在线质谱中实时分析多环芳烃样品的进样装置
CN102232238B (zh) * 2008-10-13 2015-08-05 普度研究基金会 用于转移离子以供分析的系统和方法
RU2389004C1 (ru) * 2009-01-11 2010-05-10 Физико-технический институт Уральского отделения Российской Академии Наук ФТИ УрО РАН Устройство для ввода образца в вакуумную камеру
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JP5604165B2 (ja) * 2010-04-19 2014-10-08 株式会社日立ハイテクノロジーズ 質量分析装置
JP5497615B2 (ja) * 2010-11-08 2014-05-21 株式会社日立ハイテクノロジーズ 質量分析装置
EP3667697B1 (en) * 2011-01-20 2025-12-10 Purdue Research Foundation (Prf) Ion formation from an emitter by inductive voltage
JP5784825B2 (ja) * 2011-05-20 2015-09-24 パーデュー・リサーチ・ファウンデーションPurdue Research Foundation 試料を分析するためのシステムおよび方法
JP6025406B2 (ja) * 2012-06-04 2016-11-16 株式会社日立ハイテクノロジーズ 質量分析装置
GB2508574B (en) * 2012-06-24 2014-12-17 Fasmatech Science And Technology Sa Improvements in and relating to the control of ions
US9406492B1 (en) * 2015-05-12 2016-08-02 The University Of North Carolina At Chapel Hill Electrospray ionization interface to high pressure mass spectrometry and related methods

Also Published As

Publication number Publication date
US9679754B2 (en) 2017-06-13
RU2769119C2 (ru) 2022-03-28
RU2016103609A (ru) 2017-08-24
RU2671228C2 (ru) 2018-10-30
CN105493227A (zh) 2016-04-13
MX359727B (es) 2018-10-08
RU2018133810A (ru) 2019-03-19
US20160181079A1 (en) 2016-06-23
EP3022762B1 (en) 2022-04-27
RU2016103609A3 (pl) 2018-03-20
KR20160033162A (ko) 2016-03-25
WO2015009478A1 (en) 2015-01-22
CN108807131A (zh) 2018-11-13
RU2018133810A3 (pl) 2022-01-25
CA2918143C (en) 2022-07-26
MX2016000371A (es) 2016-09-29
CN108807131B (zh) 2021-09-14
KR102248457B1 (ko) 2021-05-04
JP6488294B2 (ja) 2019-03-20
EP3022762A1 (en) 2016-05-25
CN105493227B (zh) 2018-05-01
CA2918143A1 (en) 2015-01-22
JP2016530680A (ja) 2016-09-29
EP3022762A4 (en) 2017-03-08

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