MX359727B - Entrada de espectrómetro de masas con flujo promedio reducido. - Google Patents

Entrada de espectrómetro de masas con flujo promedio reducido.

Info

Publication number
MX359727B
MX359727B MX2016000371A MX2016000371A MX359727B MX 359727 B MX359727 B MX 359727B MX 2016000371 A MX2016000371 A MX 2016000371A MX 2016000371 A MX2016000371 A MX 2016000371A MX 359727 B MX359727 B MX 359727B
Authority
MX
Mexico
Prior art keywords
conduit
inlet
mass spectrometer
outlet
flow path
Prior art date
Application number
MX2016000371A
Other languages
English (en)
Other versions
MX2016000371A (es
Inventor
Berkout Vadym
Original Assignee
Smiths Detection Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Smiths Detection Inc filed Critical Smiths Detection Inc
Publication of MX2016000371A publication Critical patent/MX2016000371A/es
Publication of MX359727B publication Critical patent/MX359727B/es

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0495Vacuum locks; Valves
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0422Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for gaseous samples
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/0027Methods for using particle spectrometers
    • H01J49/0031Step by step routines describing the use of the apparatus
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0468Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)

Abstract

Se proporciona una interfaz configurada para transferir los iones producidos a o cerca de las condiciones de presión atmosférica en un espectrómetro de masa para análisis de masa. La interfaz incluye un primer conducto incluyendo una entrada configurada para recibir un fluido que contiene iones y una salida configurada para dirigir el fluido que contiene los iones en el espectrómetro de masa. El primer conducto define un primer sendero de flujo extendiéndose de la entrada a la salida. La interfaz incluye una bomba. La interfaz incluye un segundo conducto. El segundo conducto define un segundo sendero de flujo extendiéndose desde una ubicación entre la entrada la salida del primer conducto a una salida del segundo conducto. La bomba está configurada para desviar una porción del fluido incluyendo los iones moviéndose en el primer sendero de flujo al segundo sendero de flujo.
MX2016000371A 2013-07-19 2014-07-07 Entrada de espectrómetro de masas con flujo promedio reducido. MX359727B (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201361856389P 2013-07-19 2013-07-19
PCT/US2014/045600 WO2015009478A1 (en) 2013-07-19 2014-07-07 Mass spectrometer inlet with reduced average flow

Publications (2)

Publication Number Publication Date
MX2016000371A MX2016000371A (es) 2016-09-29
MX359727B true MX359727B (es) 2018-10-08

Family

ID=52346636

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2016000371A MX359727B (es) 2013-07-19 2014-07-07 Entrada de espectrómetro de masas con flujo promedio reducido.

Country Status (10)

Country Link
US (1) US9679754B2 (es)
EP (1) EP3022762B1 (es)
JP (1) JP6488294B2 (es)
KR (1) KR102248457B1 (es)
CN (2) CN108807131B (es)
CA (1) CA2918143C (es)
MX (1) MX359727B (es)
PL (1) PL3022762T3 (es)
RU (2) RU2769119C2 (es)
WO (1) WO2015009478A1 (es)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9842728B2 (en) * 2013-07-19 2017-12-12 Smiths Detection Ion transfer tube with intermittent inlet
KR102543773B1 (ko) 2016-09-02 2023-06-16 더 보드 오브 리젠츠 오브 더 유니버시티 오브 텍사스 시스템 수집 프로브 및 이들의 사용 방법
JP6801794B2 (ja) * 2017-09-14 2020-12-16 株式会社島津製作所 液体クロマトグラフ
SG11202004568UA (en) * 2017-11-27 2020-06-29 Univ Texas Minimally invasive collection probe and methods for the use thereof
GB201808912D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808894D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Mass spectrometer
GB201808949D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
US11373849B2 (en) 2018-05-31 2022-06-28 Micromass Uk Limited Mass spectrometer having fragmentation region
US11367607B2 (en) 2018-05-31 2022-06-21 Micromass Uk Limited Mass spectrometer
GB201808890D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808892D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Mass spectrometer
GB201808893D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808932D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808936D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
WO2019236139A1 (en) * 2018-06-04 2019-12-12 The Trustees Of Indiana University Interface for transporting ions from an atmospheric pressure environment to a low pressure environment
CN111954917B (zh) 2018-09-11 2023-11-07 株式会社 Lg新能源 接口单元
EP3914891A4 (en) 2019-01-25 2022-09-28 Board of Regents, The University of Texas System DEVICE AND METHOD FOR CLEANING AND/OR REPLACING MEDICAL DEVICES
US20230170202A1 (en) * 2020-04-27 2023-06-01 Board Of Regents, The University Of Texas System Detecting chemical compounds for forensic analysis
WO2024100977A1 (ja) * 2022-11-10 2024-05-16 株式会社島津製作所 質量分析装置

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JPS6215747A (ja) * 1985-07-15 1987-01-24 Hitachi Ltd 質量分析計
JPH03261062A (ja) * 1990-03-09 1991-11-20 Hitachi Ltd プラズマ極微量元素質量分析装置
JPH06302295A (ja) * 1993-04-14 1994-10-28 Hitachi Ltd 質量分析装置および差動排気装置
JPH06302296A (ja) 1993-04-16 1994-10-28 Shimadzu Corp 宇宙空間ガス分析装置
JPH06310091A (ja) * 1993-04-26 1994-11-04 Hitachi Ltd 大気圧イオン化質量分析計
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CN101820979B (zh) * 2007-06-01 2014-05-14 普度研究基金会 不连续的大气压接口
JP4885110B2 (ja) * 2007-11-07 2012-02-29 三菱重工業株式会社 試料導入装置及び試料分析システム
JP5767581B2 (ja) * 2008-05-30 2015-08-19 ディーエイチ テクノロジーズ デベロップメント プライベート リミテッド 調整可能な選択性および分解能を有する真空駆動微分型移動度分析計/質量分析計のための方法およびシステム
CN101713761A (zh) * 2008-10-06 2010-05-26 中国科学院大连化学物理研究所 一种用于在线质谱中实时分析多环芳烃样品的进样装置
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JP5604165B2 (ja) * 2010-04-19 2014-10-08 株式会社日立ハイテクノロジーズ 質量分析装置
JP5497615B2 (ja) * 2010-11-08 2014-05-21 株式会社日立ハイテクノロジーズ 質量分析装置
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JP5784825B2 (ja) * 2011-05-20 2015-09-24 パーデュー・リサーチ・ファウンデーションPurdue Research Foundation 試料を分析するためのシステムおよび方法
JP6025406B2 (ja) * 2012-06-04 2016-11-16 株式会社日立ハイテクノロジーズ 質量分析装置
GB2508574B (en) * 2012-06-24 2014-12-17 Fasmatech Science And Technology Sa Improvements in and relating to the control of ions
US9406492B1 (en) * 2015-05-12 2016-08-02 The University Of North Carolina At Chapel Hill Electrospray ionization interface to high pressure mass spectrometry and related methods

Also Published As

Publication number Publication date
US9679754B2 (en) 2017-06-13
PL3022762T3 (pl) 2022-10-17
JP6488294B2 (ja) 2019-03-20
RU2769119C2 (ru) 2022-03-28
MX2016000371A (es) 2016-09-29
KR20160033162A (ko) 2016-03-25
CN105493227B (zh) 2018-05-01
CN108807131B (zh) 2021-09-14
KR102248457B1 (ko) 2021-05-04
JP2016530680A (ja) 2016-09-29
WO2015009478A1 (en) 2015-01-22
RU2016103609A3 (es) 2018-03-20
CA2918143A1 (en) 2015-01-22
RU2671228C2 (ru) 2018-10-30
CN108807131A (zh) 2018-11-13
EP3022762B1 (en) 2022-04-27
RU2016103609A (ru) 2017-08-24
US20160181079A1 (en) 2016-06-23
RU2018133810A3 (es) 2022-01-25
EP3022762A1 (en) 2016-05-25
RU2018133810A (ru) 2019-03-19
CA2918143C (en) 2022-07-26
EP3022762A4 (en) 2017-03-08
CN105493227A (zh) 2016-04-13

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