PL2884269T3 - System i sposób kontroli samolotów - Google Patents

System i sposób kontroli samolotów

Info

Publication number
PL2884269T3
PL2884269T3 PL14786438T PL14786438T PL2884269T3 PL 2884269 T3 PL2884269 T3 PL 2884269T3 PL 14786438 T PL14786438 T PL 14786438T PL 14786438 T PL14786438 T PL 14786438T PL 2884269 T3 PL2884269 T3 PL 2884269T3
Authority
PL
Poland
Prior art keywords
inspecting aircraft
inspecting
aircraft
Prior art date
Application number
PL14786438T
Other languages
English (en)
Inventor
Kejun Kang
Jianmin Li
Jingyu Gu
Yuanjing Li
Yulan Li
Yaohong Liu
Zhen Tan
Yucheng Wu
Weizhen Wang
Original Assignee
Nuctech Co Ltd
Univ Tsinghua
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nuctech Co Ltd, Univ Tsinghua filed Critical Nuctech Co Ltd
Publication of PL2884269T3 publication Critical patent/PL2884269T3/pl

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B64AIRCRAFT; AVIATION; COSMONAUTICS
    • B64FGROUND OR AIRCRAFT-CARRIER-DECK INSTALLATIONS SPECIALLY ADAPTED FOR USE IN CONNECTION WITH AIRCRAFT; DESIGNING, MANUFACTURING, ASSEMBLING, CLEANING, MAINTAINING OR REPAIRING AIRCRAFT, NOT OTHERWISE PROVIDED FOR; HANDLING, TRANSPORTING, TESTING OR INSPECTING AIRCRAFT COMPONENTS, NOT OTHERWISE PROVIDED FOR
    • B64F5/00Designing, manufacturing, assembling, cleaning, maintaining or repairing aircraft, not otherwise provided for; Handling, transporting, testing or inspecting aircraft components, not otherwise provided for
    • B64F5/60Testing or inspecting aircraft components or systems
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/232Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays having relative motion between the source, detector and object other than by conveyor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144Devices controlled by radiation
    • H01L27/146Imager structures
    • H01L27/14601Structural or functional details thereof
    • H01L27/14618Containers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/60Specific applications or type of materials
    • G01N2223/631Specific applications or type of materials large structures, walls
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/023Means for mechanically adjusting components not otherwise provided for

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Power Engineering (AREA)
  • Geophysics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Electromagnetism (AREA)
  • Manufacturing & Machinery (AREA)
  • Transportation (AREA)
  • Aviation & Aerospace Engineering (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
  • Geophysics And Detection Of Objects (AREA)
PL14786438T 2013-10-12 2014-07-31 System i sposób kontroli samolotów PL2884269T3 (pl)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
CN201310476261.6A CN103529480B (zh) 2013-10-12 2013-10-12 对飞机进行检查的系统和方法
EP14786438.3A EP2884269B1 (en) 2013-10-12 2014-07-31 System and method for inspecting aircraft
PCT/CN2014/083366 WO2015051665A1 (zh) 2013-10-12 2014-07-31 对飞机进行检查的系统和方法

Publications (1)

Publication Number Publication Date
PL2884269T3 true PL2884269T3 (pl) 2019-05-31

Family

ID=49931633

Family Applications (1)

Application Number Title Priority Date Filing Date
PL14786438T PL2884269T3 (pl) 2013-10-12 2014-07-31 System i sposób kontroli samolotów

Country Status (6)

Country Link
US (1) US10088595B2 (pl)
EP (1) EP2884269B1 (pl)
CN (1) CN103529480B (pl)
AR (1) AR093493A1 (pl)
PL (1) PL2884269T3 (pl)
WO (1) WO2015051665A1 (pl)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103529480B (zh) * 2013-10-12 2017-02-01 清华大学 对飞机进行检查的系统和方法
RO130582B1 (ro) * 2014-01-23 2021-12-30 Mb Telecom Ltd. S.R.L. Sistem şi metodă pentru inspecţia completă şi neintruzivă a aeronavelor
CN105784737B (zh) * 2016-03-29 2021-06-22 清华大学 集装箱ct检查系统
CN106053499B (zh) * 2016-07-20 2019-07-05 同方威视技术股份有限公司 射线检查系统和射线检查方法
KR102452955B1 (ko) * 2017-11-23 2022-10-11 삼성전자주식회사 광 신호 처리 방법 및 장치
CN108227027B (zh) 2017-12-29 2020-12-01 同方威视技术股份有限公司 车载背散射检查系统
CN110455838A (zh) * 2018-05-08 2019-11-15 清华大学 车辆检测用设备及车辆检测系统
JP6619904B1 (ja) * 2019-05-29 2019-12-11 株式会社日立パワーソリューションズ X線撮像システム及びx線撮像方法
CN115236757A (zh) * 2019-08-09 2022-10-25 同方威视技术股份有限公司 检查系统
CN111426706A (zh) * 2020-04-24 2020-07-17 安徽启路达光电科技有限公司 一种通过式微剂量x光足部探测仪
CN113834832A (zh) * 2020-06-23 2021-12-24 同方威视技术股份有限公司 移动式检测装置及检测方法
CN113358057A (zh) * 2021-06-03 2021-09-07 河南科技大学 一种飞机变形扫描检测设备及检测方法
GB2608187B (en) * 2021-06-25 2024-06-19 Smiths Detection France S A S X-ray inspection system and control architecture for an X-ray inspection system
KR102644699B1 (ko) * 2023-06-07 2024-03-08 (주)위플로 비행체용 점검 장치 및 이를 이용한 비행체의 점검 방법

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US5014293A (en) 1989-10-04 1991-05-07 Imatron, Inc. Computerized tomographic x-ray scanner system and gantry assembly
CN1039664C (zh) * 1995-03-31 1998-09-02 清华大学 自扫描式大型物体辐射检测系统
US5764683B1 (en) * 1996-02-12 2000-11-21 American Science & Eng Inc Mobile x-ray inspection system for large objects
US8503605B2 (en) * 2002-07-23 2013-08-06 Rapiscan Systems, Inc. Four sided imaging system and method for detection of contraband
CN100541187C (zh) * 2004-11-26 2009-09-16 同方威视技术股份有限公司 一种可ct断层扫描的集装箱检查系统
US7266174B2 (en) * 2005-03-07 2007-09-04 General Electric Company Radiographic inspection of airframes and other large objects
CN100587481C (zh) * 2006-12-14 2010-02-03 清华大学 一种可移动悬臂门式集装箱检查系统
CN101382507A (zh) * 2007-09-05 2009-03-11 同方威视技术股份有限公司 一种检查航空货运集装箱中违禁物品的装置
CN101382508A (zh) * 2007-09-05 2009-03-11 同方威视技术股份有限公司 一种检查航空货运集装箱中违禁物品的装置和方法
CN102483383A (zh) * 2009-07-29 2012-05-30 美国科技工程公司 自上向下x 光检查拖车
GB0917950D0 (en) * 2009-10-13 2009-11-25 Shawcor Ltd X-ray inspection method and apparatus for pipeline girth weld inspection
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EA024045B1 (ru) * 2010-05-05 2016-08-31 Научно-Производственное Частное Унитарное Предприятие Адани Система контроля самодвижущегося большегрузного транспортного средства
JP2012065769A (ja) * 2010-09-22 2012-04-05 Fujifilm Corp 可搬型の放射線画像撮影システム、およびこれに用いる保持具、並びに可搬型の放射線画像撮影セット
RO127988B1 (ro) * 2012-06-18 2019-12-30 Mb Telecom Ltd Srl Metodă şi sistem pentru inspecţia neintruzivă a aeronavelor
CN103529480B (zh) * 2013-10-12 2017-02-01 清华大学 对飞机进行检查的系统和方法
CN203490377U (zh) * 2013-10-12 2014-03-19 清华大学 对飞机进行检查的系统

Also Published As

Publication number Publication date
EP2884269B1 (en) 2018-09-12
AR093493A1 (es) 2015-06-10
CN103529480A (zh) 2014-01-22
EP2884269A1 (en) 2015-06-17
US10088595B2 (en) 2018-10-02
CN103529480B (zh) 2017-02-01
WO2015051665A1 (zh) 2015-04-16
US20160258884A1 (en) 2016-09-08
EP2884269A4 (en) 2015-12-23

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