AR093493A1 - Sistemas y metodos para inspeccionar una aeronave - Google Patents

Sistemas y metodos para inspeccionar una aeronave

Info

Publication number
AR093493A1
AR093493A1 ARP130104198A ARP130104198A AR093493A1 AR 093493 A1 AR093493 A1 AR 093493A1 AR P130104198 A ARP130104198 A AR P130104198A AR P130104198 A ARP130104198 A AR P130104198A AR 093493 A1 AR093493 A1 AR 093493A1
Authority
AR
Argentina
Prior art keywords
aircraft
inspect
systems
methods
passes
Prior art date
Application number
ARP130104198A
Other languages
English (en)
Inventor
Li Jianmin
Liu Yaohong
Tan Zhen
Wu Yucheng
Wang Weizhen
Li Yulan
Kang Kejun
Gu Jingyu
Li Yuanjing
Original Assignee
Univ Tsinghua
Nuctech Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univ Tsinghua, Nuctech Co Ltd filed Critical Univ Tsinghua
Publication of AR093493A1 publication Critical patent/AR093493A1/es

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B64AIRCRAFT; AVIATION; COSMONAUTICS
    • B64FGROUND OR AIRCRAFT-CARRIER-DECK INSTALLATIONS SPECIALLY ADAPTED FOR USE IN CONNECTION WITH AIRCRAFT; DESIGNING, MANUFACTURING, ASSEMBLING, CLEANING, MAINTAINING OR REPAIRING AIRCRAFT, NOT OTHERWISE PROVIDED FOR; HANDLING, TRANSPORTING, TESTING OR INSPECTING AIRCRAFT COMPONENTS, NOT OTHERWISE PROVIDED FOR
    • B64F5/00Designing, manufacturing, assembling, cleaning, maintaining or repairing aircraft, not otherwise provided for; Handling, transporting, testing or inspecting aircraft components, not otherwise provided for
    • B64F5/60Testing or inspecting aircraft components or systems
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/232Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays having relative motion between the source, detector and object other than by conveyor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144Devices controlled by radiation
    • H01L27/146Imager structures
    • H01L27/14601Structural or functional details thereof
    • H01L27/14618Containers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/60Specific applications or type of materials
    • G01N2223/631Specific applications or type of materials large structures, walls
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/023Means for mechanically adjusting components not otherwise provided for

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Power Engineering (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Electromagnetism (AREA)
  • Aviation & Aerospace Engineering (AREA)
  • Transportation (AREA)
  • Manufacturing & Machinery (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
  • Geophysics And Detection Of Objects (AREA)

Abstract

La presente divulgación provee un sistema y un método para inspeccionar una aeronave. Una fuente de rayos y un detector ubicado sobre y debajo de un fuselaje de una aeronave respectivamente. La fuente de rayos emite un haz de rayos, el cual pasa a trabes de la aeronave a detectar. El detector recibe y convierte el haz de rayos que pasa a trabes de la aeronave en una señal de salida y genera una imagen de transmisión vertical en tiempo real.
ARP130104198A 2013-10-12 2013-11-14 Sistemas y metodos para inspeccionar una aeronave AR093493A1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201310476261.6A CN103529480B (zh) 2013-10-12 2013-10-12 对飞机进行检查的系统和方法

Publications (1)

Publication Number Publication Date
AR093493A1 true AR093493A1 (es) 2015-06-10

Family

ID=49931633

Family Applications (1)

Application Number Title Priority Date Filing Date
ARP130104198A AR093493A1 (es) 2013-10-12 2013-11-14 Sistemas y metodos para inspeccionar una aeronave

Country Status (6)

Country Link
US (1) US10088595B2 (es)
EP (1) EP2884269B1 (es)
CN (1) CN103529480B (es)
AR (1) AR093493A1 (es)
PL (1) PL2884269T3 (es)
WO (1) WO2015051665A1 (es)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103529480B (zh) * 2013-10-12 2017-02-01 清华大学 对飞机进行检查的系统和方法
RO130582B1 (ro) * 2014-01-23 2021-12-30 Mb Telecom Ltd. S.R.L. Sistem şi metodă pentru inspecţia completă şi neintruzivă a aeronavelor
CN105784737B (zh) * 2016-03-29 2021-06-22 清华大学 集装箱ct检查系统
CN106053499B (zh) * 2016-07-20 2019-07-05 同方威视技术股份有限公司 射线检查系统和射线检查方法
KR102452955B1 (ko) * 2017-11-23 2022-10-11 삼성전자주식회사 광 신호 처리 방법 및 장치
CN108227027B (zh) 2017-12-29 2020-12-01 同方威视技术股份有限公司 车载背散射检查系统
CN110455838A (zh) * 2018-05-08 2019-11-15 清华大学 车辆检测用设备及车辆检测系统
JP6619904B1 (ja) * 2019-05-29 2019-12-11 株式会社日立パワーソリューションズ X線撮像システム及びx線撮像方法
CN115236757A (zh) * 2019-08-09 2022-10-25 同方威视技术股份有限公司 检查系统
CN111426706A (zh) * 2020-04-24 2020-07-17 安徽启路达光电科技有限公司 一种通过式微剂量x光足部探测仪
CN113834832A (zh) * 2020-06-23 2021-12-24 同方威视技术股份有限公司 移动式检测装置及检测方法
CN113358057A (zh) * 2021-06-03 2021-09-07 河南科技大学 一种飞机变形扫描检测设备及检测方法
GB2608187B (en) * 2021-06-25 2024-06-19 Smiths Detection France S A S X-ray inspection system and control architecture for an X-ray inspection system
KR102644699B1 (ko) * 2023-06-07 2024-03-08 (주)위플로 비행체용 점검 장치 및 이를 이용한 비행체의 점검 방법

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CN1039664C (zh) * 1995-03-31 1998-09-02 清华大学 自扫描式大型物体辐射检测系统
US5764683B1 (en) * 1996-02-12 2000-11-21 American Science & Eng Inc Mobile x-ray inspection system for large objects
US8503605B2 (en) * 2002-07-23 2013-08-06 Rapiscan Systems, Inc. Four sided imaging system and method for detection of contraband
CN100541187C (zh) * 2004-11-26 2009-09-16 同方威视技术股份有限公司 一种可ct断层扫描的集装箱检查系统
US7266174B2 (en) * 2005-03-07 2007-09-04 General Electric Company Radiographic inspection of airframes and other large objects
CN100587481C (zh) * 2006-12-14 2010-02-03 清华大学 一种可移动悬臂门式集装箱检查系统
CN101382508A (zh) * 2007-09-05 2009-03-11 同方威视技术股份有限公司 一种检查航空货运集装箱中违禁物品的装置和方法
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RO127988B1 (ro) * 2012-06-18 2019-12-30 Mb Telecom Ltd Srl Metodă şi sistem pentru inspecţia neintruzivă a aeronavelor
CN103529480B (zh) * 2013-10-12 2017-02-01 清华大学 对飞机进行检查的系统和方法
CN203490377U (zh) * 2013-10-12 2014-03-19 清华大学 对飞机进行检查的系统

Also Published As

Publication number Publication date
EP2884269A4 (en) 2015-12-23
EP2884269B1 (en) 2018-09-12
PL2884269T3 (pl) 2019-05-31
CN103529480A (zh) 2014-01-22
CN103529480B (zh) 2017-02-01
US10088595B2 (en) 2018-10-02
EP2884269A1 (en) 2015-06-17
WO2015051665A1 (zh) 2015-04-16
US20160258884A1 (en) 2016-09-08

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