PL2405260T3 - Sposób i urządzenie do przeprowadzania nieinwazyjnego badania przedmiotów promieniami rentgenowskimi - Google Patents

Sposób i urządzenie do przeprowadzania nieinwazyjnego badania przedmiotów promieniami rentgenowskimi

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Publication number
PL2405260T3
PL2405260T3 PL11173192T PL11173192T PL2405260T3 PL 2405260 T3 PL2405260 T3 PL 2405260T3 PL 11173192 T PL11173192 T PL 11173192T PL 11173192 T PL11173192 T PL 11173192T PL 2405260 T3 PL2405260 T3 PL 2405260T3
Authority
PL
Poland
Prior art keywords
invasive
objects
performing non
ray inspections
inspections
Prior art date
Application number
PL11173192T
Other languages
English (en)
Inventor
Pietro Pozzi
Giuseppe Rotondo
Nunzio Alberto Borghese
Original Assignee
Xnext S R L
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Xnext S R L filed Critical Xnext S R L
Publication of PL2405260T3 publication Critical patent/PL2405260T3/pl

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20181—Stacked detectors, e.g. for measuring energy and positional information
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/11—Region-based segmentation
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/136—Segmentation; Edge detection involving thresholding
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/143—Segmentation; Edge detection involving probabilistic approaches, e.g. Markov random field [MRF] modelling
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/174—Segmentation; Edge detection involving the use of two or more images
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/187—Segmentation; Edge detection involving region growing; involving region merging; involving connected component labelling
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/20—Sources of radiation
    • G01N2223/206—Sources of radiation sources operating at different energy levels
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/306—Accessories, mechanical or electrical features computer control
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3307—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts source and detector fixed; object moves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3308—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts object translates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/402—Imaging mapping distribution of elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/405—Imaging mapping of a material property
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/408—Imaging display on monitor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/41—Imaging imaging specifically internal structure
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/421—Imaging digitised image, analysed in real time (recognition algorithms)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/423—Imaging multispectral imaging-multiple energy imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/424—Imaging energy substraction image processing (dual energy processing)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/50—Detectors
    • G01N2223/501—Detectors array
    • G01N2223/5015—Detectors array linear array
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/601—Specific applications or type of materials density profile
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/639—Specific applications or type of materials material in a container
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/643—Specific applications or type of materials object on conveyor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/652—Specific applications or type of materials impurities, foreign matter, trace amounts
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10072—Tomographic images
    • G06T2207/10081—Computed x-ray tomography [CT]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10116—X-ray image
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20112—Image segmentation details
    • G06T2207/20156—Automatic seed setting
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30112—Baggage; Luggage; Suitcase
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30128—Food products

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Software Systems (AREA)
  • Probability & Statistics with Applications (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
PL11173192T 2010-07-09 2011-07-08 Sposób i urządzenie do przeprowadzania nieinwazyjnego badania przedmiotów promieniami rentgenowskimi PL2405260T3 (pl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
ITMI2010A001269A IT1405995B1 (it) 2010-07-09 2010-07-09 Sistema e metodo per la ispezione a raggi x e la identificazione della composizione chimica dei materiali
EP11173192.3A EP2405260B1 (en) 2010-07-09 2011-07-08 Method and apparatus for performing non-invasive x-ray inspections of objects

Publications (1)

Publication Number Publication Date
PL2405260T3 true PL2405260T3 (pl) 2014-10-31

Family

ID=43531024

Family Applications (1)

Application Number Title Priority Date Filing Date
PL11173192T PL2405260T3 (pl) 2010-07-09 2011-07-08 Sposób i urządzenie do przeprowadzania nieinwazyjnego badania przedmiotów promieniami rentgenowskimi

Country Status (5)

Country Link
EP (1) EP2405260B1 (pl)
DK (1) DK2405260T3 (pl)
ES (1) ES2487940T3 (pl)
IT (1) IT1405995B1 (pl)
PL (1) PL2405260T3 (pl)

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GB201113224D0 (en) 2011-08-01 2011-09-14 Kromek Ltd Method for the radiological investigation of an object
WO2013017877A1 (en) 2011-08-01 2013-02-07 Kromek Limited Detection and/or classification of materials
NZ713753A (en) * 2013-07-11 2019-08-30 Foss Analytical As Meat processing device incorporating an x-ray analyzer
CN104749199B (zh) 2013-12-30 2019-02-19 同方威视技术股份有限公司 双能/双视角的高能x射线透视成像系统
WO2016116795A1 (en) * 2015-01-20 2016-07-28 Koninklijke Philips N.V. Image data segmentation and display
CN104828544A (zh) * 2015-04-19 2015-08-12 成都安思科技有限公司 一种带物品推出机构的安检机
US11243327B2 (en) 2016-05-30 2022-02-08 Southern Innovation International Pty Ltd System and method for material characterization
EP3500844A4 (en) 2016-08-18 2020-05-06 Hydro-Québec APPARATUS AND METHOD FOR INSPECTING AN ELECTRIC LINE
KR102234019B1 (ko) * 2017-10-31 2021-03-30 주식회사 오리온이엔씨 이동식 식자재 방사능 전수검사 시스템 및 방법
CN109446875B (zh) * 2018-02-24 2022-04-22 北京首都机场航空安保有限公司 一种智能旅客安检系统
SK8449Y1 (sk) * 2018-05-11 2019-05-06 Fulop Marko Zariadenie na odhaľovanie nelegálnych úkrytov v náklade železnej rudy
DE102019111567A1 (de) * 2019-05-03 2020-11-05 Wipotec Gmbh Verfahren und Vorrichtung zur Röntgeninspektion von Produkten, insbesondere von Lebensmitteln
DE102019123479B3 (de) * 2019-09-02 2020-11-26 LuxFlux GmbH Analyse und Qualitätskontrolle von Lebensmitteln
CN111145173B (zh) * 2019-12-31 2024-04-26 上海联影医疗科技股份有限公司 一种冠脉造影图像的斑块识别方法、装置、设备及介质
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EP3954985A1 (en) * 2020-08-04 2022-02-16 Biometic S.r.l. Industrial tomography apparatus and method for checking the composition of industrial products which comprise a plurality of primary parts
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CN113781426B (zh) * 2021-09-07 2024-02-13 海深智能科技(上海)有限公司 一种识别液体成分的智能安检方法
CN114419773B (zh) * 2022-03-28 2022-06-07 成都古河云科技有限公司 自助式货车报备入场值守系统及货车自助入场方法
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JP2024134194A (ja) * 2023-03-20 2024-10-03 株式会社東芝 検査システム及び検査方法
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CN116934837B (zh) * 2023-09-13 2023-11-24 上海超群检测科技股份有限公司 物体检测处理方法、装置、系统、电子设备及存储介质

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Also Published As

Publication number Publication date
ITMI20101269A1 (it) 2012-01-10
EP2405260B1 (en) 2014-05-07
IT1405995B1 (it) 2014-02-06
ES2487940T3 (es) 2014-08-25
DK2405260T3 (da) 2014-08-11
EP2405260A1 (en) 2012-01-11

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