PL2325662T3 - Analizator wielowejściowy i wielowyjściowy - Google Patents

Analizator wielowejściowy i wielowyjściowy

Info

Publication number
PL2325662T3
PL2325662T3 PL09811143T PL09811143T PL2325662T3 PL 2325662 T3 PL2325662 T3 PL 2325662T3 PL 09811143 T PL09811143 T PL 09811143T PL 09811143 T PL09811143 T PL 09811143T PL 2325662 T3 PL2325662 T3 PL 2325662T3
Authority
PL
Poland
Prior art keywords
input
analyser
output
output analyser
Prior art date
Application number
PL09811143T
Other languages
English (en)
Inventor
VALDéS JUAN FRANCISCO VALENZUELA
HERNáNDEZ DAVID AGAPITO SáNCHEZ
GONZáLEZ ANTONIO MANUEL MARTíNEZ
Cabrera Juan Monzó
Original Assignee
Emite Ingenieria S L
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=41727486&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=PL2325662(T3) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Emite Ingenieria S L filed Critical Emite Ingenieria S L
Publication of PL2325662T3 publication Critical patent/PL2325662T3/pl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
    • G01R29/0871—Complete apparatus or systems; circuits, e.g. receivers or amplifiers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
    • G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
    • G01R29/0821—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning rooms and test sites therefor, e.g. anechoic chambers, open field sites or TEM cells
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B6/00—Heating by electric, magnetic or electromagnetic fields
    • H05B6/64—Heating using microwaves
    • H05B6/70—Feed lines
    • H05B6/705—Feed lines using microwave tuning
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B6/00—Heating by electric, magnetic or electromagnetic fields
    • H05B6/64—Heating using microwaves
    • H05B6/72—Radiators or antennas
PL09811143T 2008-09-03 2009-09-03 Analizator wielowejściowy i wielowyjściowy PL2325662T3 (pl)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
ES200802584A ES2342958B2 (es) 2008-09-03 2008-09-03 Analizador de multiples entradas y multiples salidas.
PCT/ES2009/070364 WO2010026274A1 (es) 2008-09-03 2009-09-03 Analizador de múltiples entradas y múltiples salidas
EP09811143.8A EP2325662B1 (en) 2008-09-03 2009-09-03 Multiple-input, multiple-output analyser

Publications (1)

Publication Number Publication Date
PL2325662T3 true PL2325662T3 (pl) 2019-11-29

Family

ID=41727486

Family Applications (1)

Application Number Title Priority Date Filing Date
PL09811143T PL2325662T3 (pl) 2008-09-03 2009-09-03 Analizator wielowejściowy i wielowyjściowy

Country Status (9)

Country Link
US (1) US8872080B2 (pl)
EP (1) EP2325662B1 (pl)
JP (1) JP5335921B2 (pl)
KR (1) KR20110058867A (pl)
DK (1) DK2325662T3 (pl)
ES (2) ES2342958B2 (pl)
HU (1) HUE045057T2 (pl)
PL (1) PL2325662T3 (pl)
WO (1) WO2010026274A1 (pl)

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Also Published As

Publication number Publication date
EP2325662B1 (en) 2019-07-03
JP5335921B2 (ja) 2013-11-06
ES2342958A1 (es) 2010-07-19
JP2012502535A (ja) 2012-01-26
WO2010026274A1 (es) 2010-03-11
ES2605233R1 (es) 2017-05-09
EP2325662A4 (en) 2017-07-05
WO2010026274A8 (es) 2011-03-24
ES2342958B2 (es) 2011-07-04
KR20110058867A (ko) 2011-06-01
HUE045057T2 (hu) 2019-12-30
DK2325662T3 (da) 2019-08-19
EP2325662A1 (en) 2011-05-25
ES2605233B1 (es) 2018-02-20
US8872080B2 (en) 2014-10-28
US20110155725A1 (en) 2011-06-30
ES2605233A2 (es) 2017-03-13

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