ES2605233R1 - Analizador ultrarrápido de múltiples entradas y múltiples salidas - Google Patents

Analizador ultrarrápido de múltiples entradas y múltiples salidas Download PDF

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Publication number
ES2605233R1
ES2605233R1 ES201631046A ES201631046A ES2605233R1 ES 2605233 R1 ES2605233 R1 ES 2605233R1 ES 201631046 A ES201631046 A ES 201631046A ES 201631046 A ES201631046 A ES 201631046A ES 2605233 R1 ES2605233 R1 ES 2605233R1
Authority
ES
Spain
Prior art keywords
analyzer
input
under test
output
exit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
ES201631046A
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English (en)
Other versions
ES2605233A2 (es
ES2605233B1 (es
Inventor
David SÁNCHEZ HERNÁNDEZ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Emite Ingenieria SL
Original Assignee
Emite Ingenieria SL
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
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First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=41727486&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=ES2605233(R1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Emite Ingenieria SL filed Critical Emite Ingenieria SL
Publication of ES2605233A2 publication Critical patent/ES2605233A2/es
Publication of ES2605233R1 publication Critical patent/ES2605233R1/es
Application granted granted Critical
Publication of ES2605233B1 publication Critical patent/ES2605233B1/es
Withdrawn - After Issue legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
    • G01R29/0871—Complete apparatus or systems; circuits, e.g. receivers or amplifiers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
    • G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
    • G01R29/0821—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning rooms and test sites therefor, e.g. anechoic chambers, open field sites or TEM cells
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B6/00—Heating by electric, magnetic or electromagnetic fields
    • H05B6/64—Heating using microwaves
    • H05B6/70—Feed lines
    • H05B6/705—Feed lines using microwave tuning
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B6/00—Heating by electric, magnetic or electromagnetic fields
    • H05B6/64—Heating using microwaves
    • H05B6/72—Radiators or antennas

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Constitution Of High-Frequency Heating (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
  • Variable-Direction Aerials And Aerial Arrays (AREA)

Abstract

Analizador ultrarrápido de múltiples entradas y múltiples salidas.#La presente adición al analizador de múltiples entradas y múltiples salidas incorpora un sistema de uno, dos o más filtros de entrada/salida que permiten que los elementos bajo prueba entren y salgan del analizador de forma continua mediante una o varias cintas. El sistema de filtros, que necesariamente deberá cubrir de forma novedosa varias bandas de frecuencias de trabajo simultáneamente, permite que los campos electromagnéticos sigan confinados en el interior del analizador pero habilita unas ranuras adicionales a las ya existentes en el analizador por donde pueden entrar y salir los dispositivos bajo prueba, permitiendo un aumento de la rapidez de las pruebas ya que evita la necesidad de abrir y cerrar la puerta para introducir y sacar dichos elementos bajo prueba.
ES201631046A 2008-09-03 2016-07-28 Analizador ultrarrápido de múltiples entradas y múltiples salidas Withdrawn - After Issue ES2605233B1 (es)

Applications Claiming Priority (7)

Application Number Priority Date Filing Date Title
ES200802584A ES2342958B2 (es) 2008-09-03 2008-09-03 Analizador de multiples entradas y multiples salidas.
ESP200802584 2008-09-03
PCT/ES2009/070364 WO2010026274A1 (es) 2008-09-03 2009-09-03 Analizador de múltiples entradas y múltiples salidas
EP2009070634 2009-09-03
WO11058867KR 2011-07-01
WO11794700US 2011-09-03
WO11058867JP 2011-09-08

Publications (3)

Publication Number Publication Date
ES2605233A2 ES2605233A2 (es) 2017-03-13
ES2605233R1 true ES2605233R1 (es) 2017-05-09
ES2605233B1 ES2605233B1 (es) 2018-02-20

Family

ID=41727486

Family Applications (2)

Application Number Title Priority Date Filing Date
ES200802584A Expired - Fee Related ES2342958B2 (es) 2008-09-03 2008-09-03 Analizador de multiples entradas y multiples salidas.
ES201631046A Withdrawn - After Issue ES2605233B1 (es) 2008-09-03 2016-07-28 Analizador ultrarrápido de múltiples entradas y múltiples salidas

Family Applications Before (1)

Application Number Title Priority Date Filing Date
ES200802584A Expired - Fee Related ES2342958B2 (es) 2008-09-03 2008-09-03 Analizador de multiples entradas y multiples salidas.

Country Status (9)

Country Link
US (1) US8872080B2 (es)
EP (1) EP2325662B1 (es)
JP (1) JP5335921B2 (es)
KR (1) KR20110058867A (es)
DK (1) DK2325662T3 (es)
ES (2) ES2342958B2 (es)
HU (1) HUE045057T2 (es)
PL (1) PL2325662T3 (es)
WO (1) WO2010026274A1 (es)

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WO2012097732A1 (en) * 2011-01-18 2012-07-26 The University Of Hongkong Compact electronic reverberation chamber
US9258067B2 (en) * 2011-06-15 2016-02-09 Bluetest Ab Method and apparatus for measuring the performance of antennas, mobile phones and other wireless terminals
KR20140022128A (ko) * 2012-08-13 2014-02-24 삼성전자주식회사 안테나 성능 측정 방법 및 그 시스템
US9746423B2 (en) * 2013-05-15 2017-08-29 ETS-Lindgren Inc. Reverberation chamber loading
DE102014001904B3 (de) * 2014-02-14 2015-04-09 Bundesrepublik Deutschland, vertreten durch das Bundesministerium der Verteidigung, vertreten durch das Bundesamt für Ausrüstung, Informationstechnik und Nutzung der Bundeswehr Modenverwirbelungskammer und entsprechendes Verfahren
FR3026894B1 (fr) * 2014-10-07 2019-07-26 Psa Automobiles Sa. Dispositif pour regler les pertes electromagnetiques d'une cavite
US9684023B2 (en) 2015-06-30 2017-06-20 Microsoft Technology Licensing, Llc RF measurement device and system
KR101701706B1 (ko) * 2016-07-15 2017-02-03 한국센서연구소 주식회사 차폐 특성을 갖는 저주파 노이즈 측정 장치
CN107897142B (zh) * 2017-11-27 2020-10-16 四川瑞进特科技有限公司 一种基于结构化地图的杀虫灯定位系统及方法
US10809290B2 (en) 2018-07-31 2020-10-20 Rohde & Schwarz Gmbh & Co. Kg Resonant cavity for wireless communication measurement and corresponding method
US11289946B2 (en) * 2019-04-08 2022-03-29 Purdue Research Foundation Method and system of uniform wireless power distribution within a chamber

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WO2008031964A2 (fr) * 2006-09-14 2008-03-20 European Aeronautic Defence And Space Company Eads France Chambre réverbérante

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US20060017630A1 (en) * 2000-03-31 2006-01-26 Per-Simon Kildal Method and an apparatus for measuring the performance of antennas, mobile phones and other wireless terminals
EP1223432A1 (en) * 2001-01-16 2002-07-17 Telefonaktiebolaget L M Ericsson (Publ) A chamber for and a method of processing electronic devices and the use of such a chamber
WO2008031964A2 (fr) * 2006-09-14 2008-03-20 European Aeronautic Defence And Space Company Eads France Chambre réverbérante

Also Published As

Publication number Publication date
ES2342958A1 (es) 2010-07-19
JP5335921B2 (ja) 2013-11-06
ES2605233A2 (es) 2017-03-13
KR20110058867A (ko) 2011-06-01
ES2605233B1 (es) 2018-02-20
US8872080B2 (en) 2014-10-28
HUE045057T2 (hu) 2019-12-30
US20110155725A1 (en) 2011-06-30
ES2342958B2 (es) 2011-07-04
EP2325662A4 (en) 2017-07-05
WO2010026274A8 (es) 2011-03-24
JP2012502535A (ja) 2012-01-26
EP2325662B1 (en) 2019-07-03
PL2325662T3 (pl) 2019-11-29
EP2325662A1 (en) 2011-05-25
WO2010026274A1 (es) 2010-03-11
DK2325662T3 (da) 2019-08-19

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