PL1602919T3 - Urządzenie pomiarowe do pomiaru stopnia przepuszczalności powłoki - Google Patents
Urządzenie pomiarowe do pomiaru stopnia przepuszczalności powłokiInfo
- Publication number
- PL1602919T3 PL1602919T3 PL04012900T PL04012900T PL1602919T3 PL 1602919 T3 PL1602919 T3 PL 1602919T3 PL 04012900 T PL04012900 T PL 04012900T PL 04012900 T PL04012900 T PL 04012900T PL 1602919 T3 PL1602919 T3 PL 1602919T3
- Authority
- PL
- Poland
- Prior art keywords
- coating
- measuring device
- transmittance
- survey
- light
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/54—Controlling or regulating the coating process
- C23C14/542—Controlling the film thickness or evaporation rate
- C23C14/545—Controlling the film thickness or evaporation rate using measurement on deposited material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/59—Transmissivity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/8422—Investigating thin films, e.g. matrix isolation method
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Mathematical Physics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Surface Treatment Of Glass (AREA)
- Glass Compositions (AREA)
- Optical Measuring Cells (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP04012900A EP1602919B1 (de) | 2004-06-01 | 2004-06-01 | Messvorrichtung für die Messung des Transmissionsgrads einer Beschichtung |
Publications (1)
Publication Number | Publication Date |
---|---|
PL1602919T3 true PL1602919T3 (pl) | 2008-06-30 |
Family
ID=34925203
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PL04012900T PL1602919T3 (pl) | 2004-06-01 | 2004-06-01 | Urządzenie pomiarowe do pomiaru stopnia przepuszczalności powłoki |
Country Status (9)
Country | Link |
---|---|
US (1) | US7414738B2 (pl) |
EP (1) | EP1602919B1 (pl) |
JP (1) | JP3904569B2 (pl) |
KR (1) | KR100910512B1 (pl) |
CN (1) | CN100371703C (pl) |
AT (1) | ATE386144T1 (pl) |
DE (1) | DE502004006191D1 (pl) |
PL (1) | PL1602919T3 (pl) |
TW (1) | TWI248506B (pl) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8855450B2 (en) | 2012-02-20 | 2014-10-07 | Cardinal Cg Company | System and method for measuring properties of a thin film coated glass |
US8666202B2 (en) | 2012-02-20 | 2014-03-04 | Cardinal Ig Company | System and method for measuring properties of a thin film coated glass |
CN102854301A (zh) * | 2012-08-10 | 2013-01-02 | 江阴沐祥节能装饰工程有限公司 | 一种透明度检测装置 |
EP2804457B1 (de) * | 2013-05-14 | 2016-04-20 | Pematech AG | Vorrichtung zu einem Transport oder zu einem Transport und zu einer Bearbeitung von Leiterplatten |
GB2560299B (en) | 2017-02-01 | 2021-07-07 | Nicoventures Trading Ltd | Heating element and method of analysing |
GB201701633D0 (en) | 2017-02-01 | 2017-03-15 | Nicoventures Holdings Ltd | Heating element selection method |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL253260A (pl) * | 1959-06-30 | |||
GB2029017B (en) * | 1978-08-18 | 1982-10-13 | Holland L | Control of deposition of thin films |
DE3623970A1 (de) * | 1986-07-16 | 1988-01-28 | Leybold Heraeus Gmbh & Co Kg | Transporteinrichtung mit rollensystemen fuer vakuum-beschichtungsanlagen |
EP0324351B1 (en) * | 1988-01-09 | 1993-10-06 | Sumitomo Bakelite Company Limited | Process for producing transparent conductive film coated with metal oxide thin film |
DE3806382A1 (de) * | 1988-02-29 | 1989-09-07 | Feldmuehle Ag | Verfahren und vorrichtung zum pruefen von laufenden transparenten bahnen |
DE3925536A1 (de) * | 1989-08-02 | 1991-02-07 | Leybold Ag | Anordnung zur dickenmessung von duennschichten |
DE4127701C2 (de) * | 1991-08-21 | 1995-11-30 | Siemens Ag | Verfahren zum Herstellen einer strukturierten Dünnschicht aus einem Hochtemperatursupraleiter und Vorrichtung zur Durchführung des Verfahrens |
DE4201274C2 (de) * | 1992-01-18 | 1995-02-23 | Ver Glaswerke Gmbh | Vorrichtung zum Messen der Reflexionseigenschaften einer mit einer teilreflektierenden Schicht versehenen Glasscheibe |
GB9219450D0 (en) * | 1992-09-15 | 1992-10-28 | Glaverbel | Thin film thickness monitoring and control |
DE19643018B4 (de) * | 1996-10-18 | 2010-06-17 | Isra Surface Vision Gmbh | Verfahren und Vorrichtung zum Messen des Verlaufs reflektierender Oberflächen |
US6194701B1 (en) * | 1999-04-06 | 2001-02-27 | The United States Of Americas As Represented By The Secretary Of The Air Force | Portable night vision goggle haze and transmissivity measurement device |
JP3603996B2 (ja) * | 1999-04-28 | 2004-12-22 | シャープ株式会社 | シート抵抗測定器 |
US6359686B1 (en) * | 1999-06-29 | 2002-03-19 | Corning Incorporated | Inspection system for sheet material |
EP1143222A3 (en) * | 2000-04-06 | 2002-01-02 | Applied Materials, Inc. | Method and apparatus for detecting the thickness of copper oxide |
JP2002275656A (ja) * | 2000-12-21 | 2002-09-25 | Furukawa Electric Co Ltd:The | 電気電子機器用の金属板材、それを用いた電気電子機器 |
DE10141897C1 (de) * | 2001-08-28 | 2003-04-17 | Interpane Entw & Beratungsges | System mit Verglasungselement und Gasversorgungsvorrichtung |
-
2004
- 2004-06-01 DE DE502004006191T patent/DE502004006191D1/de not_active Expired - Lifetime
- 2004-06-01 AT AT04012900T patent/ATE386144T1/de not_active IP Right Cessation
- 2004-06-01 PL PL04012900T patent/PL1602919T3/pl unknown
- 2004-06-01 EP EP04012900A patent/EP1602919B1/de not_active Expired - Lifetime
- 2004-07-01 US US10/883,561 patent/US7414738B2/en not_active Expired - Fee Related
- 2004-08-11 TW TW093124038A patent/TWI248506B/zh not_active IP Right Cessation
- 2004-08-19 JP JP2004238977A patent/JP3904569B2/ja not_active Expired - Fee Related
- 2004-08-31 KR KR1020040068876A patent/KR100910512B1/ko not_active IP Right Cessation
- 2004-09-02 CN CNB2004100751948A patent/CN100371703C/zh not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
CN1704717A (zh) | 2005-12-07 |
TWI248506B (en) | 2006-02-01 |
ATE386144T1 (de) | 2008-03-15 |
KR100910512B1 (ko) | 2009-07-31 |
EP1602919B1 (de) | 2008-02-13 |
US20050264829A1 (en) | 2005-12-01 |
EP1602919A1 (de) | 2005-12-07 |
JP3904569B2 (ja) | 2007-04-11 |
KR20050114584A (ko) | 2005-12-06 |
JP2005345460A (ja) | 2005-12-15 |
CN100371703C (zh) | 2008-02-27 |
TW200540393A (en) | 2005-12-16 |
DE502004006191D1 (de) | 2008-03-27 |
US7414738B2 (en) | 2008-08-19 |
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