PH12017501810A1 - Integrated circuit (ic) test socket with faraday cage background - Google Patents
Integrated circuit (ic) test socket with faraday cage backgroundInfo
- Publication number
- PH12017501810A1 PH12017501810A1 PH12017501810A PH12017501810A PH12017501810A1 PH 12017501810 A1 PH12017501810 A1 PH 12017501810A1 PH 12017501810 A PH12017501810 A PH 12017501810A PH 12017501810 A PH12017501810 A PH 12017501810A PH 12017501810 A1 PH12017501810 A1 PH 12017501810A1
- Authority
- PH
- Philippines
- Prior art keywords
- test socket
- shield
- integrated circuit
- faraday cage
- base
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0441—Details
- G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/18—Screening arrangements against electric or magnetic fields, e.g. against earth's field
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
An integrated circuit test socket includes a highly conductive compliant material that is cut and installed into the test socket. The conductive material draws electrical charge away from the test socket, leading to more accurate testing. The test socket base is grounded, and a ground current runs through the base and into conductive strips. The configuration forms an electromagnetic impulse shield, protecting the chip from electromagnetic interference. The compliance of the shield material allows the shield to be sealed when activated, ensuring that the electromagnetic impulse shield is complete around the semi-conductor chip.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/US2015/023839 WO2016160009A1 (en) | 2015-04-01 | 2015-04-01 | Integrated circuit (ic) test socket with faraday cage background |
Publications (1)
Publication Number | Publication Date |
---|---|
PH12017501810A1 true PH12017501810A1 (en) | 2018-04-23 |
Family
ID=57007062
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PH12017501810A PH12017501810A1 (en) | 2015-04-01 | 2017-10-02 | Integrated circuit (ic) test socket with faraday cage background |
Country Status (7)
Country | Link |
---|---|
EP (1) | EP3278118A4 (en) |
JP (1) | JP2018511806A (en) |
KR (1) | KR20170134612A (en) |
CN (1) | CN107683416A (en) |
PH (1) | PH12017501810A1 (en) |
SG (1) | SG11201708108VA (en) |
WO (1) | WO2016160009A1 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DK3158345T3 (en) * | 2014-06-20 | 2024-02-19 | Xcerra Corp | Test plug device and related methods |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02288083A (en) * | 1989-04-26 | 1990-11-28 | Mitsubishi Electric Corp | Ic socket |
CA2180578A1 (en) * | 1995-07-07 | 1997-01-08 | David A. Johnson | Impedance controlled interconnection device |
CN1166956C (en) * | 1997-05-12 | 2004-09-15 | 株式会社爱德万测试 | Semiconductor device testing apparatus |
US6300781B1 (en) * | 1998-10-30 | 2001-10-09 | St Assembly Test Services Pte Ltd | Reliable method and apparatus for interfacing between a ball grid array handler and a ball grid array testing system |
US6515870B1 (en) * | 2000-11-27 | 2003-02-04 | Intel Corporation | Package integrated faraday cage to reduce electromagnetic emissions from an integrated circuit |
US6400577B1 (en) * | 2001-08-30 | 2002-06-04 | Tyco Electronics Corporation | Integrated circuit socket assembly having integral shielding members |
JP2004006199A (en) * | 2001-12-27 | 2004-01-08 | Moldec Kk | Connector for integrated circuit, and assembly for mounting integrated circuit |
US7026806B2 (en) * | 2003-06-30 | 2006-04-11 | International Business Machines Corporation | Apparatus for preventing cross talk and interference in semiconductor devices during test |
CN100508301C (en) * | 2004-06-10 | 2009-07-01 | Fci亚洲技术有限公司 | Socket connector assembly for IC card and IC card connector |
US7106050B1 (en) * | 2005-06-08 | 2006-09-12 | Broadcom Corporation | Apparatus for shielding a device under test from electromagnetic waves |
JP4905876B2 (en) * | 2005-10-31 | 2012-03-28 | 日本発條株式会社 | Method for manufacturing conductive contact holder and conductive contact holder |
US7601009B2 (en) * | 2006-05-18 | 2009-10-13 | Centipede Systems, Inc. | Socket for an electronic device |
JP4516938B2 (en) * | 2006-06-16 | 2010-08-04 | Smk株式会社 | Socket for mounting electronic components |
CN101420076A (en) * | 2007-10-22 | 2009-04-29 | 鸿富锦精密工业(深圳)有限公司 | Connector component |
JP2010003511A (en) * | 2008-06-19 | 2010-01-07 | Yokowo Co Ltd | Socket for ic package inspection |
TWI382193B (en) * | 2009-02-17 | 2013-01-11 | Quanta Comp Inc | Testing system and testing method |
JP2012243487A (en) * | 2011-05-18 | 2012-12-10 | Alps Electric Co Ltd | Socket for electronic component |
-
2015
- 2015-04-01 SG SG11201708108VA patent/SG11201708108VA/en unknown
- 2015-04-01 WO PCT/US2015/023839 patent/WO2016160009A1/en active Application Filing
- 2015-04-01 EP EP15888016.1A patent/EP3278118A4/en not_active Withdrawn
- 2015-04-01 KR KR1020177031813A patent/KR20170134612A/en not_active Application Discontinuation
- 2015-04-01 JP JP2017551649A patent/JP2018511806A/en active Pending
- 2015-04-01 CN CN201580078675.0A patent/CN107683416A/en active Pending
-
2017
- 2017-10-02 PH PH12017501810A patent/PH12017501810A1/en unknown
Also Published As
Publication number | Publication date |
---|---|
CN107683416A (en) | 2018-02-09 |
SG11201708108VA (en) | 2017-10-30 |
JP2018511806A (en) | 2018-04-26 |
WO2016160009A1 (en) | 2016-10-06 |
EP3278118A4 (en) | 2019-01-16 |
KR20170134612A (en) | 2017-12-06 |
EP3278118A1 (en) | 2018-02-07 |
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