PE20210809A1 - Sistemas y metodos para interpretar interacciones de alta energia - Google Patents
Sistemas y metodos para interpretar interacciones de alta energiaInfo
- Publication number
- PE20210809A1 PE20210809A1 PE2021000426A PE2021000426A PE20210809A1 PE 20210809 A1 PE20210809 A1 PE 20210809A1 PE 2021000426 A PE2021000426 A PE 2021000426A PE 2021000426 A PE2021000426 A PE 2021000426A PE 20210809 A1 PE20210809 A1 PE 20210809A1
- Authority
- PE
- Peru
- Prior art keywords
- machine learning
- detector
- learning module
- energy interactions
- radiation
- Prior art date
Links
- 230000003993 interaction Effects 0.000 title abstract 4
- 238000000034 method Methods 0.000 title abstract 2
- 238000010801 machine learning Methods 0.000 abstract 4
- 230000005855 radiation Effects 0.000 abstract 4
- 239000012491 analyte Substances 0.000 abstract 1
- 238000004458 analytical method Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
- G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F18/00—Pattern recognition
- G06F18/20—Analysing
- G06F18/21—Design or setup of recognition systems or techniques; Extraction of features in feature space; Blind source separation
- G06F18/214—Generating training patterns; Bootstrap methods, e.g. bagging or boosting
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F18/00—Pattern recognition
- G06F18/20—Analysing
- G06F18/24—Classification techniques
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N20/00—Machine learning
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N20/00—Machine learning
- G06N20/20—Ensemble learning
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/33—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using ultraviolet light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Data Mining & Analysis (AREA)
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Evolutionary Computation (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Artificial Intelligence (AREA)
- General Engineering & Computer Science (AREA)
- Software Systems (AREA)
- Pathology (AREA)
- Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- Immunology (AREA)
- Analytical Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- Bioinformatics & Cheminformatics (AREA)
- Bioinformatics & Computational Biology (AREA)
- Evolutionary Biology (AREA)
- Medical Informatics (AREA)
- Computing Systems (AREA)
- Mathematical Physics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Dispersion Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Image Analysis (AREA)
Abstract
Los sistemas y metodos para interpretar interacciones de alta energia en una muestra se describen en esta solicitud. En particular, esta solicitud describe un metodo de analisis que comprende hacer incidir la radiacion de una fuente en un analito, detectar las interacciones de energia resultantes de la radiacion incidente mediante el uso de un detector de radiacion, ajustar la senal del detector de radiacion mediante el uso de un modulo de aprendizaje automatico para enfatizar partes especificas de la senal del detector, entrenar el modulo de aprendizaje automatico de manera supervisada o no supervisada, producir modelos cuantitativos y cualitativos mediante el uso del modulo de inclinacion de la maquina y luego aplicar el modulo de aprendizaje automatico a interacciones de energia adicionales. La senal recibida por el detector se puede preprocesar para enfatizar partes especificas de la senal del detector, que luego se asigna a un modulo de aprendizaje automatico para el entrenamiento de una manera supervisada o no supervisada. Los modelos cuantitativos y cualitativos derivados de este entrenamiento se pueden aplicar a nuevas entradas del detector de los mismos instrumentos o de otros similares. Se describen otras modalidades.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201862741231P | 2018-10-04 | 2018-10-04 | |
PCT/US2019/054741 WO2020072930A1 (en) | 2018-10-04 | 2019-10-04 | Systems and methods for interpreting high energy interactions |
Publications (1)
Publication Number | Publication Date |
---|---|
PE20210809A1 true PE20210809A1 (es) | 2021-04-26 |
Family
ID=70054605
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PE2021000426A PE20210809A1 (es) | 2018-10-04 | 2019-10-04 | Sistemas y metodos para interpretar interacciones de alta energia |
Country Status (7)
Country | Link |
---|---|
US (2) | US11874240B2 (es) |
EP (1) | EP3861319A4 (es) |
AU (1) | AU2019355055A1 (es) |
CA (1) | CA3113806A1 (es) |
CL (1) | CL2021000836A1 (es) |
PE (1) | PE20210809A1 (es) |
WO (1) | WO2020072930A1 (es) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20230204527A1 (en) * | 2020-04-03 | 2023-06-29 | Decision Tree, Llc | Systems and methods for interpreting high energy interactions |
JP7130267B2 (ja) * | 2020-09-03 | 2022-09-05 | 株式会社リガク | 全反射蛍光x線分析装置及び推定方法 |
US20230117908A1 (en) * | 2021-10-14 | 2023-04-20 | Arm Limited | Battery cell monitoring systems, battery packs, and methods of operation of the same |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5379764A (en) * | 1992-12-09 | 1995-01-10 | Diasense, Inc. | Non-invasive determination of analyte concentration in body of mammals |
US6801316B2 (en) * | 2002-07-19 | 2004-10-05 | Optix Lp | Measurement of an analyte concentration in a scattering medium |
AU2003304026B2 (en) * | 2002-10-29 | 2010-03-25 | Target Discovery, Inc. | Method for increasing ionization efficiency in mass spectroscopy |
US8586932B2 (en) | 2004-11-09 | 2013-11-19 | Spectrum Dynamics Llc | System and method for radioactive emission measurement |
US20140297201A1 (en) | 2011-04-28 | 2014-10-02 | Philip Morris Products S.A. | Computer-assisted structure identification |
US10107770B2 (en) | 2014-06-18 | 2018-10-23 | Texas Tech University System | Portable apparatus for soil chemical characterization |
US10398394B2 (en) * | 2017-01-06 | 2019-09-03 | General Electric Company | Energy-discriminating photon-counting detector and the use thereof |
US11333621B2 (en) * | 2017-07-11 | 2022-05-17 | Kla-Tencor Corporation | Methods and systems for semiconductor metrology based on polychromatic soft X-Ray diffraction |
US10816486B2 (en) * | 2018-03-28 | 2020-10-27 | Kla-Tencor Corporation | Multilayer targets for calibration and alignment of X-ray based measurement systems |
WO2020008420A2 (en) * | 2018-07-05 | 2020-01-09 | Bruker Jv Israel Ltd. | Small-angle x-ray scatterometry |
-
2019
- 2019-10-04 EP EP19869475.4A patent/EP3861319A4/en active Pending
- 2019-10-04 WO PCT/US2019/054741 patent/WO2020072930A1/en unknown
- 2019-10-04 US US17/282,206 patent/US11874240B2/en active Active
- 2019-10-04 PE PE2021000426A patent/PE20210809A1/es unknown
- 2019-10-04 CA CA3113806A patent/CA3113806A1/en active Pending
- 2019-10-04 AU AU2019355055A patent/AU2019355055A1/en active Pending
-
2021
- 2021-04-01 CL CL2021000836A patent/CL2021000836A1/es unknown
-
2023
- 2023-12-07 US US18/532,178 patent/US20240125717A1/en active Pending
Also Published As
Publication number | Publication date |
---|---|
US20240125717A1 (en) | 2024-04-18 |
WO2020072930A1 (en) | 2020-04-09 |
EP3861319A4 (en) | 2022-06-15 |
AU2019355055A1 (en) | 2021-04-15 |
EP3861319A1 (en) | 2021-08-11 |
US11874240B2 (en) | 2024-01-16 |
US20210341400A1 (en) | 2021-11-04 |
CL2021000836A1 (es) | 2021-10-01 |
CA3113806A1 (en) | 2020-04-09 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CL2021000836A1 (es) | Sistemas y métodos para interpretar interacciones de alta energía | |
ES2638965T3 (es) | Sistema y método para investigaciones por LIBS y espectroscopía de absorción IR combinadas | |
Nevin et al. | Raman spectra of proteinaceous materials used in paintings: a multivariate analytical approach for classification and identification | |
CN102564340B (zh) | 大口径平面镜面形检测装置 | |
BR112018072794A2 (pt) | sistema biométrico com imagem fotoacústica | |
Sabti et al. | Galaxy luminosity function pipeline for cosmology and astrophysics | |
Burke-Spolaor et al. | The Next-Generation Very Large Array: Supermassive Black Hole Pairs and Binaries | |
CL2022002710A1 (es) | Sistemas y métodos para interpretar interacciones de alta energía | |
AU2015271937A1 (en) | Methods and systems to characterize noises sensed by a knock sensor | |
BR112023021621A2 (pt) | Modelos de linguagem aprendidos por máquina que geram análise textual intermediária a serviço de geração de texto contextual | |
WO2017078504A3 (ko) | 공정가스 분석장치 | |
JP2018004594A5 (es) | ||
EP3276338A3 (en) | X-ray fluorescence analyzer | |
BR112022011312A2 (pt) | Análise de um analito disposto dentro de um meio | |
AR087067A1 (es) | Compensacion de amplitud de deriva en un espectometro | |
CN109612388A (zh) | 一种细胞穿孔的光学测量系统和方法 | |
van Mechelen | An industrial THz killer application? | |
Zhang et al. | Wide-bandwidth drift-scan pulsar surveys of globular clusters: application to early science observations with FAST | |
Chen et al. | Rotating target classification base on micro-Doppler features using a modified adaptive boosting algorithm | |
BR112019007138A2 (pt) | método e sistema de análise para testagem de uma amostra | |
EP2579026A3 (en) | Optical equipment and registration method | |
Zhang et al. | Optical time-series signals classification based on data augmentation for small sample | |
Liu et al. | Singular spectrum analysis and its application in Lamb wave-based damage detection | |
Peñil del Campo et al. | Systematic Search for γ-Ray Periodicity in Active Galactic Nuclei Detected by the Fermi Large Area Telescope | |
AR118057A1 (es) | Dispositivo de procesamiento de imágenes, sistema de cotejo de huellas dactilares, método de procesamiento de imágenes y programa |