CL2021000836A1 - Sistemas y métodos para interpretar interacciones de alta energía - Google Patents

Sistemas y métodos para interpretar interacciones de alta energía

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Publication number
CL2021000836A1
CL2021000836A1 CL2021000836A CL2021000836A CL2021000836A1 CL 2021000836 A1 CL2021000836 A1 CL 2021000836A1 CL 2021000836 A CL2021000836 A CL 2021000836A CL 2021000836 A CL2021000836 A CL 2021000836A CL 2021000836 A1 CL2021000836 A1 CL 2021000836A1
Authority
CL
Chile
Prior art keywords
machine learning
detector
learning module
energy interactions
radiation
Prior art date
Application number
CL2021000836A
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English (en)
Inventor
Brandon Lee Goodchild Drake
Original Assignee
Decision Tree Llc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Decision Tree Llc filed Critical Decision Tree Llc
Publication of CL2021000836A1 publication Critical patent/CL2021000836A1/es

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/21—Design or setup of recognition systems or techniques; Extraction of features in feature space; Blind source separation
    • G06F18/214—Generating training patterns; Bootstrap methods, e.g. bagging or boosting
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/24—Classification techniques
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00—Machine learning
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00—Machine learning
    • G06N20/20—Ensemble learning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/33—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using ultraviolet light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Data Mining & Analysis (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Evolutionary Computation (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Artificial Intelligence (AREA)
  • General Engineering & Computer Science (AREA)
  • Software Systems (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • Evolutionary Biology (AREA)
  • Medical Informatics (AREA)
  • Computing Systems (AREA)
  • Mathematical Physics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Dispersion Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Image Analysis (AREA)

Abstract

Los sistemas y métodos para interpretar interacciones de alta energía en una muestra se describen en esta solicitud. En particular, esta solicitud describe un método de análisis que comprende hacer incidir la radiación de una fuente en un analito, detectar las interacciones de energía resultantes de la radiación incidente mediante el uso de un detector de radiación, ajustar la señal del detector de radiación mediante el uso de un módulo de aprendizaje automático para enfatizar partes específicas de la señal del detector, entrenar el módulo de aprendizaje automático de manera supervisada o no supervisada, producir modelos cuantitativos y cualitativos mediante el uso del módulo de inclinación de la máquina y luego aplicar el módulo de aprendizaje automático a interacciones de energía adicionales. La señal recibida por el detector se puede preprocesar para enfatizar partes específicas de la señal del detector, que luego se asigna a un módulo de aprendizaje automático para el entrenamiento de una manera supervisada o no supervisada. Los modelos cuantitativos y cualitativos derivados de este entrenamiento se pueden aplicar a nuevas entradas del detector de los mismos instrumentos o de otros similares. Se describen otras modalidades.
CL2021000836A 2018-10-04 2021-04-01 Sistemas y métodos para interpretar interacciones de alta energía CL2021000836A1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US201862741231P 2018-10-04 2018-10-04

Publications (1)

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CL2021000836A1 true CL2021000836A1 (es) 2021-10-01

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CL2021000836A CL2021000836A1 (es) 2018-10-04 2021-04-01 Sistemas y métodos para interpretar interacciones de alta energía

Country Status (7)

Country Link
US (2) US11874240B2 (es)
EP (1) EP3861319A4 (es)
AU (1) AU2019355055A1 (es)
CA (1) CA3113806A1 (es)
CL (1) CL2021000836A1 (es)
PE (1) PE20210809A1 (es)
WO (1) WO2020072930A1 (es)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20230204527A1 (en) * 2020-04-03 2023-06-29 Decision Tree, Llc Systems and methods for interpreting high energy interactions
JP7130267B2 (ja) * 2020-09-03 2022-09-05 株式会社リガク 全反射蛍光ｘ線分析装置及び推定方法
US20230117908A1 (en) * 2021-10-14 2023-04-20 Arm Limited Battery cell monitoring systems, battery packs, and methods of operation of the same

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5379764A (en) * 1992-12-09 1995-01-10 Diasense, Inc. Non-invasive determination of analyte concentration in body of mammals
US6801316B2 (en) * 2002-07-19 2004-10-05 Optix Lp Measurement of an analyte concentration in a scattering medium
AU2003304026B2 (en) * 2002-10-29 2010-03-25 Target Discovery, Inc. Method for increasing ionization efficiency in mass spectroscopy
US8586932B2 (en) 2004-11-09 2013-11-19 Spectrum Dynamics Llc System and method for radioactive emission measurement
US20140297201A1 (en) 2011-04-28 2014-10-02 Philip Morris Products S.A. Computer-assisted structure identification
US10107770B2 (en) 2014-06-18 2018-10-23 Texas Tech University System Portable apparatus for soil chemical characterization
US10398394B2 (en) * 2017-01-06 2019-09-03 General Electric Company Energy-discriminating photon-counting detector and the use thereof
US11333621B2 (en) * 2017-07-11 2022-05-17 Kla-Tencor Corporation Methods and systems for semiconductor metrology based on polychromatic soft X-Ray diffraction
US10816486B2 (en) * 2018-03-28 2020-10-27 Kla-Tencor Corporation Multilayer targets for calibration and alignment of X-ray based measurement systems
WO2020008420A2 (en) * 2018-07-05 2020-01-09 Bruker Jv Israel Ltd. Small-angle x-ray scatterometry

Also Published As

Publication number Publication date
PE20210809A1 (es) 2021-04-26
US20240125717A1 (en) 2024-04-18
WO2020072930A1 (en) 2020-04-09
EP3861319A4 (en) 2022-06-15
AU2019355055A1 (en) 2021-04-15
EP3861319A1 (en) 2021-08-11
US11874240B2 (en) 2024-01-16
US20210341400A1 (en) 2021-11-04
CA3113806A1 (en) 2020-04-09

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