NO763310L - - Google Patents

Info

Publication number
NO763310L
NO763310L NO763310A NO763310A NO763310L NO 763310 L NO763310 L NO 763310L NO 763310 A NO763310 A NO 763310A NO 763310 A NO763310 A NO 763310A NO 763310 L NO763310 L NO 763310L
Authority
NO
Norway
Application number
NO763310A
Other languages
Norwegian (no)
Other versions
NO147199B (no
NO147199C (no
Inventor
J E Pehrson
S G Roos
B Valastro
Original Assignee
Ericsson Telefon Ab L M
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ericsson Telefon Ab L M filed Critical Ericsson Telefon Ab L M
Publication of NO763310L publication Critical patent/NO763310L/no
Publication of NO147199B publication Critical patent/NO147199B/no
Publication of NO147199C publication Critical patent/NO147199C/no

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
    • G06F11/0751—Error or fault detection not based on redundancy
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/003—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation in serial memories

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Debugging And Monitoring (AREA)
  • Dc Digital Transmission (AREA)
  • Manipulation Of Pulses (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Detection And Correction Of Errors (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Selective Calling Equipment (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)
  • Alarm Systems (AREA)
NO76763310A 1975-09-29 1976-09-28 Fremgangsmaate for aa overvaake klokkesignaler i digitale systemer NO147199C (no)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
AUPC336475 1975-09-29

Publications (3)

Publication Number Publication Date
NO763310L true NO763310L (ja) 1977-03-30
NO147199B NO147199B (no) 1982-11-08
NO147199C NO147199C (no) 1983-02-16

Family

ID=3766383

Family Applications (1)

Application Number Title Priority Date Filing Date
NO76763310A NO147199C (no) 1975-09-29 1976-09-28 Fremgangsmaate for aa overvaake klokkesignaler i digitale systemer

Country Status (25)

Country Link
US (1) US4081662A (ja)
JP (1) JPS5930288B2 (ja)
AR (1) AR212340A1 (ja)
BE (1) BE846703A (ja)
BR (1) BR7606344A (ja)
CA (1) CA1074020A (ja)
CH (1) CH607460A5 (ja)
CS (1) CS251055B2 (ja)
DD (1) DD126299A5 (ja)
DE (1) DE2641700A1 (ja)
DK (1) DK153605C (ja)
EG (1) EG13396A (ja)
ES (1) ES451922A1 (ja)
FI (1) FI64474C (ja)
FR (1) FR2326080A1 (ja)
GB (1) GB1527167A (ja)
HU (1) HU174136B (ja)
IN (1) IN146507B (ja)
IT (1) IT1072928B (ja)
MY (1) MY8100229A (ja)
NL (1) NL187136C (ja)
NO (1) NO147199C (ja)
PL (1) PL108782B1 (ja)
SU (1) SU1109073A3 (ja)
YU (1) YU37408B (ja)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4095045A (en) * 1977-01-19 1978-06-13 General Datacomm Industries, Inc. Method and apparatus for signaling in a communication system
DE3317642A1 (de) * 1982-05-21 1983-11-24 International Computers Ltd., London Datenverarbeitungseinrichtung
FR2553559B1 (fr) * 1983-10-14 1988-10-14 Citroen Sa Controle du chargement de circuits integres du type registre serie parallele ayant un registre de chargement distinct des etages de sortie
US4542509A (en) * 1983-10-31 1985-09-17 International Business Machines Corporation Fault testing a clock distribution network
US4653054A (en) * 1985-04-12 1987-03-24 Itt Corporation Redundant clock combiner
US4800564A (en) * 1986-09-29 1989-01-24 International Business Machines Corporation High performance clock system error detection and fault isolation
EP0294505B1 (en) * 1987-06-11 1993-03-03 International Business Machines Corporation Clock generator system
DE3804969C1 (ja) * 1988-02-18 1989-09-14 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut, De
US5077739A (en) * 1989-05-17 1991-12-31 Unisys Corporation Method for isolating failures of clear signals in instruction processors
DE19923231C1 (de) * 1999-05-20 2001-01-11 Beta Res Gmbh Digitale Analysierung von Frequenzen bei Chipkarten
US9115870B2 (en) * 2013-03-14 2015-08-25 Cree, Inc. LED lamp and hybrid reflector
US9897651B2 (en) * 2016-03-03 2018-02-20 Qualcomm Incorporated Ultra-fast autonomous clock monitoring circuit for safe and secure automotive applications

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE197047C1 (ja) *
US3056108A (en) * 1959-06-30 1962-09-25 Internat Bushiness Machines Co Error check circuit
US3176269A (en) * 1962-05-28 1965-03-30 Ibm Ring counter checking circuit
DE1537379C3 (de) * 1967-09-22 1980-07-03 Siemens Ag, 1000 Berlin Und 8000 Muenchen Sicherheitsschaltung zum Durchführen logischer Verknüpfungen für binäre Schaltvariable und deren antivalente Schaltvariable
US3659088A (en) * 1970-08-06 1972-04-25 Cogar Corp Method for indicating memory chip failure modes
US3805152A (en) * 1971-08-04 1974-04-16 Ibm Recirculating testing methods and apparatus
US3815025A (en) * 1971-10-18 1974-06-04 Ibm Large-scale integrated circuit testing structure
US3789205A (en) * 1972-09-28 1974-01-29 Ibm Method of testing mosfet planar boards
US3761695A (en) * 1972-10-16 1973-09-25 Ibm Method of level sensitive testing a functional logic system
US3961252A (en) * 1974-12-20 1976-06-01 International Business Machines Corporation Testing embedded arrays

Also Published As

Publication number Publication date
HU174136B (hu) 1979-11-28
JPS5243335A (en) 1977-04-05
AR212340A1 (es) 1978-06-30
YU232476A (en) 1983-04-27
ES451922A1 (es) 1977-09-01
IN146507B (ja) 1979-06-23
PL108782B1 (en) 1980-04-30
NL187136C (nl) 1991-06-03
DD126299A5 (ja) 1977-07-06
FR2326080A1 (fr) 1977-04-22
FI762704A (ja) 1977-03-30
FI64474B (fi) 1983-07-29
FI64474C (fi) 1983-11-10
DK436276A (da) 1977-03-30
CA1074020A (en) 1980-03-18
JPS5930288B2 (ja) 1984-07-26
IT1072928B (it) 1985-04-13
DK153605C (da) 1988-12-19
NO147199B (no) 1982-11-08
FR2326080B1 (ja) 1982-12-03
DE2641700C2 (ja) 1987-10-29
BR7606344A (pt) 1977-05-31
NL187136B (nl) 1991-01-02
EG13396A (en) 1981-03-31
DE2641700A1 (de) 1977-04-07
DK153605B (da) 1988-08-01
YU37408B (en) 1984-08-31
SU1109073A3 (ru) 1984-08-15
NL7610427A (nl) 1977-03-31
NO147199C (no) 1983-02-16
CS251055B2 (en) 1987-06-11
BE846703A (fr) 1977-01-17
US4081662A (en) 1978-03-28
CH607460A5 (ja) 1978-12-29
MY8100229A (en) 1981-12-31
GB1527167A (en) 1978-10-04

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