NO20032012L - Elektrostatisk kapasitansdetekteringskrets, elektrostatisk kapasitansdetekteringsanordning og mikrofonanordning - Google Patents

Elektrostatisk kapasitansdetekteringskrets, elektrostatisk kapasitansdetekteringsanordning og mikrofonanordning

Info

Publication number
NO20032012L
NO20032012L NO20032012A NO20032012A NO20032012L NO 20032012 L NO20032012 L NO 20032012L NO 20032012 A NO20032012 A NO 20032012A NO 20032012 A NO20032012 A NO 20032012A NO 20032012 L NO20032012 L NO 20032012L
Authority
NO
Norway
Prior art keywords
electrostatic capacitance
capacitance detection
detection circuit
microphone
microphone device
Prior art date
Application number
NO20032012A
Other languages
English (en)
Other versions
NO20032012D0 (no
Inventor
Masami Yakabe
Naoki Ikeuchi
Original Assignee
Sumitomo Metal Ind
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Metal Ind filed Critical Sumitomo Metal Ind
Publication of NO20032012D0 publication Critical patent/NO20032012D0/no
Publication of NO20032012L publication Critical patent/NO20032012L/no

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04R—LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; DEAF-AID SETS; PUBLIC ADDRESS SYSTEMS
    • H04R29/00—Monitoring arrangements; Testing arrangements
    • H04R29/004—Monitoring arrangements; Testing arrangements for microphones
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Otolaryngology (AREA)
  • Engineering & Computer Science (AREA)
  • Acoustics & Sound (AREA)
  • Signal Processing (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Circuit For Audible Band Transducer (AREA)
  • Electrostatic, Electromagnetic, Magneto- Strictive, And Variable-Resistance Transducers (AREA)
NO20032012A 2001-09-06 2003-05-05 Elektrostatisk kapasitansdetekteringskrets, elektrostatisk kapasitansdetekteringsanordning og mikrofonanordning NO20032012L (no)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2001269993 2001-09-06
PCT/JP2002/009138 WO2003023421A1 (fr) 2001-09-06 2002-09-06 Circuit de mesure de la capacite, instrument de mesure de la capacite et dispositif de microphone

Publications (2)

Publication Number Publication Date
NO20032012D0 NO20032012D0 (no) 2003-05-05
NO20032012L true NO20032012L (no) 2003-07-03

Family

ID=19095712

Family Applications (1)

Application Number Title Priority Date Filing Date
NO20032012A NO20032012L (no) 2001-09-06 2003-05-05 Elektrostatisk kapasitansdetekteringskrets, elektrostatisk kapasitansdetekteringsanordning og mikrofonanordning

Country Status (7)

Country Link
US (1) US7019540B2 (no)
EP (1) EP1426773A4 (no)
KR (1) KR100715062B1 (no)
CN (1) CN1271418C (no)
NO (1) NO20032012L (no)
TW (1) TWI221195B (no)
WO (1) WO2003023421A1 (no)

Families Citing this family (20)

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US7663607B2 (en) 2004-05-06 2010-02-16 Apple Inc. Multipoint touchscreen
JP4310234B2 (ja) * 2004-05-18 2009-08-05 株式会社オーディオテクニカ コンデンサマイクロホン
TW200614846A (en) * 2004-09-24 2006-05-01 Hosiden Corp Signal amplifying circuit and acceleration sensor having the same
US8243027B2 (en) * 2006-06-09 2012-08-14 Apple Inc. Touch screen liquid crystal display
CN104965621B (zh) 2006-06-09 2018-06-12 苹果公司 触摸屏液晶显示器及其操作方法
CN102147680B (zh) 2006-06-09 2015-07-22 苹果公司 触摸屏液晶显示器
JP2008135147A (ja) * 2006-10-24 2008-06-12 D & M Holdings Inc 操作子及び再生装置
US8493330B2 (en) * 2007-01-03 2013-07-23 Apple Inc. Individual channel phase delay scheme
US9710095B2 (en) * 2007-01-05 2017-07-18 Apple Inc. Touch screen stack-ups
DE102008035627A1 (de) * 2008-07-31 2010-02-11 Gerd Reime Vorrichtung zur kapazitiven Messung von Änderungen
CN102713811B (zh) 2009-08-21 2016-06-29 苹果公司 用于电容感测的方法和装置
US20110273189A1 (en) * 2010-05-06 2011-11-10 Steve Gerber Sensing apparatus for and associated methods
US8804056B2 (en) * 2010-12-22 2014-08-12 Apple Inc. Integrated touch screens
DE102011083052B4 (de) * 2011-09-20 2016-03-10 Hauni Maschinenbau Ag Kapazitive HF-Strangmessvorrichtung und Strangmaschine
GB2550402B (en) 2016-05-19 2022-04-20 Ultra Electronics Ltd Circuit for simulating a capacitance fuel probe
FR3072176B1 (fr) * 2017-10-10 2022-03-04 Fogale Nanotech Dispositif de mesure d'impedance
JP7132015B2 (ja) * 2018-07-24 2022-09-06 アズビル株式会社 電気伝導率計
CN111238098A (zh) * 2018-11-29 2020-06-05 桂林航天工业学院 一种空调换热器实时监测系统
CN110061710A (zh) * 2019-05-30 2019-07-26 杭州欧贲科技有限公司 高度集成的电荷放大器电路
CN113008275A (zh) * 2021-03-01 2021-06-22 上海木西电子科技有限公司 一种电容式模拟量信号输出传感器

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4918376A (en) * 1989-03-07 1990-04-17 Ade Corporation A.C. capacitive gauging system
JPH09280806A (ja) * 1996-04-09 1997-10-31 Nissan Motor Co Ltd 静電容量式変位計
AU729354B2 (en) 1998-01-23 2001-02-01 Hokuto Electronics, Inc. Impedance-to-voltage converter
TW418323B (en) * 1998-02-19 2001-01-11 Sumitomo Metal Ind Capacitance detection system and method
JP4124867B2 (ja) * 1998-07-14 2008-07-23 松下電器産業株式会社 変換装置
JP3501401B2 (ja) 2000-03-07 2004-03-02 住友金属工業株式会社 インピーダンス検出回路、インピーダンス検出装置、及びインピーダンス検出方法
JP3501398B2 (ja) * 2000-07-10 2004-03-02 住友金属工業株式会社 インピーダンス検出回路及びインピーダンス検出方法
JP3454426B2 (ja) 2000-07-10 2003-10-06 住友金属工業株式会社 インピーダンス検出回路及びインピーダンス検出方法
JP2002157671A (ja) * 2000-11-16 2002-05-31 Sumitomo Metal Ind Ltd センシングシステム

Also Published As

Publication number Publication date
EP1426773A4 (en) 2005-09-21
EP1426773A1 (en) 2004-06-09
US7019540B2 (en) 2006-03-28
KR20040041603A (ko) 2004-05-17
CN1271418C (zh) 2006-08-23
CN1551990A (zh) 2004-12-01
KR100715062B1 (ko) 2007-05-04
NO20032012D0 (no) 2003-05-05
US20050017737A1 (en) 2005-01-27
TWI221195B (en) 2004-09-21
WO2003023421A1 (fr) 2003-03-20

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