NL7801558A - METHOD OF TESTING AN ELECTRONIC NETWORK. - Google Patents

METHOD OF TESTING AN ELECTRONIC NETWORK.

Info

Publication number
NL7801558A
NL7801558A NL7801558A NL7801558A NL7801558A NL 7801558 A NL7801558 A NL 7801558A NL 7801558 A NL7801558 A NL 7801558A NL 7801558 A NL7801558 A NL 7801558A NL 7801558 A NL7801558 A NL 7801558A
Authority
NL
Netherlands
Prior art keywords
testing
electronic network
network
electronic
Prior art date
Application number
NL7801558A
Other languages
Dutch (nl)
Original Assignee
Secretary Industry Brit
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Secretary Industry Brit filed Critical Secretary Industry Brit
Publication of NL7801558A publication Critical patent/NL7801558A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/305—Contactless testing using electron beams
    • G01R31/306—Contactless testing using electron beams of printed or hybrid circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Electrodes For Cathode-Ray Tubes (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
NL7801558A 1977-02-11 1978-02-10 METHOD OF TESTING AN ELECTRONIC NETWORK. NL7801558A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB5835/77A GB1594597A (en) 1977-02-11 1977-02-11 Electron probe testing analysis and fault diagnosis in electronic circuits

Publications (1)

Publication Number Publication Date
NL7801558A true NL7801558A (en) 1978-08-15

Family

ID=9803533

Family Applications (1)

Application Number Title Priority Date Filing Date
NL7801558A NL7801558A (en) 1977-02-11 1978-02-10 METHOD OF TESTING AN ELECTRONIC NETWORK.

Country Status (6)

Country Link
JP (1) JPS53121476A (en)
DE (1) DE2805673A1 (en)
FR (1) FR2380556A1 (en)
GB (1) GB1594597A (en)
NL (1) NL7801558A (en)
SE (1) SE425869B (en)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2902495A1 (en) * 1979-01-23 1980-07-31 Siemens Ag DEVICE FOR CONTACTLESS POTENTIAL MEASUREMENT
DE3036713A1 (en) * 1980-09-29 1982-05-13 Siemens AG, 1000 Berlin und 8000 München METHOD AND ARRANGEMENT FOR QUANTITATIVE POTENTIAL MEASUREMENT ON SURFACE WAVE FILTERS
DE3110140A1 (en) * 1981-03-16 1982-09-23 Siemens AG, 1000 Berlin und 8000 München DEVICE AND METHOD FOR A RAPID INTERNAL LOGIC CHECK ON INTEGRATED CIRCUITS
DE3138926A1 (en) * 1981-09-30 1983-04-14 Siemens AG, 1000 Berlin und 8000 München Electron-optical arrangement for high-resolution electron-beam metrology
DE3138901A1 (en) * 1981-09-30 1983-04-14 Siemens AG, 1000 Berlin und 8000 München IMPROVED COUNTERFIELD SPECTROMETER FOR ELECTRON BEAM MEASUREMENT TECHNOLOGY
DE3138990A1 (en) * 1981-09-30 1983-04-14 Siemens AG, 1000 Berlin und 8000 München Coaxial opposing field spectrometer of high acceptance for secondary electrons and an electron beam test set
DE3206309A1 (en) * 1982-02-22 1983-09-15 Siemens AG, 1000 Berlin und 8000 München SECONDARY ELECTRON SPECTROMETER AND METHOD FOR ITS OPERATION
DE3232671A1 (en) * 1982-09-02 1984-03-08 Siemens AG, 1000 Berlin und 8000 München ARRANGEMENT AND METHOD FOR MEASURING VOLTAGE ON A CURVED MEASURING OBJECT
DE3235698A1 (en) * 1982-09-27 1984-03-29 Siemens AG, 1000 Berlin und 8000 München DEVICE AND METHOD FOR DIRECTLY MEASURING SIGNAL PROCESSES AT MULTIPLE MEASURING POINTS WITH HIGH TIME RESOLUTION
JPH0646550B2 (en) * 1985-08-19 1994-06-15 株式会社東芝 Electronic beam fixed position irradiation control method and electronic beam fixed position irradiation control device
DE3685331D1 (en) * 1986-10-23 1992-06-17 Ibm METHOD FOR TESTING BOARDS FOR INTEGRATED CIRCUITS BY MEANS OF A LASER IN A VACUUM.
DE3719202A1 (en) * 1987-06-09 1988-12-29 Siemens Ag Method for automatically testing electrical assemblies

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3549999A (en) * 1968-06-05 1970-12-22 Gen Electric Method and apparatus for testing circuits by measuring secondary emission electrons generated by electron beam bombardment of the pulsed circuit
GB1286454A (en) * 1968-08-24 1972-08-23 Cambridge Scientific Instr Ltd Surface potential analysis by electron beams
DE1946931A1 (en) * 1969-09-17 1971-03-18 Gen Electric Method for testing circuits and devices for carrying out the method
US3796947A (en) * 1973-02-27 1974-03-12 Bell Telephone Labor Inc Electron beam testing of film integrated circuits
JPS5093078A (en) * 1973-12-17 1975-07-24
JPS51108569A (en) * 1975-03-19 1976-09-25 Hitachi Ltd Sosadenshikenbikyo mataha ruijisochi

Also Published As

Publication number Publication date
FR2380556A1 (en) 1978-09-08
SE7801530L (en) 1978-08-12
FR2380556B1 (en) 1985-02-08
SE425869B (en) 1982-11-15
JPH0330258B2 (en) 1991-04-26
JPS53121476A (en) 1978-10-23
DE2805673A1 (en) 1978-08-17
GB1594597A (en) 1981-07-30

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Legal Events

Date Code Title Description
A85 Still pending on 85-01-01
BA A request for search or an international-type search has been filed
CNR Transfer of rights (patent application after its laying open for public inspection)

Free format text: LINTECH INSTRUMENTS LIMITED

BB A search report has been drawn up
BC A request for examination has been filed
BT A notification was added to the application dossier and made available to the public
BX A request for additional search has been filed
BY An additional search report has been drawn up
BV The patent application has lapsed