JPS53121476A - Method of testing electronic circuit network - Google Patents

Method of testing electronic circuit network

Info

Publication number
JPS53121476A
JPS53121476A JP1530678A JP1530678A JPS53121476A JP S53121476 A JPS53121476 A JP S53121476A JP 1530678 A JP1530678 A JP 1530678A JP 1530678 A JP1530678 A JP 1530678A JP S53121476 A JPS53121476 A JP S53121476A
Authority
JP
Japan
Prior art keywords
electronic circuit
circuit network
testing electronic
testing
network
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1530678A
Other languages
Japanese (ja)
Other versions
JPH0330258B2 (en
Inventor
Suchiyuaato Purouzu Gurahamu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
UK Secretary of State for Defence
Original Assignee
UK Secretary of State for Defence
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by UK Secretary of State for Defence filed Critical UK Secretary of State for Defence
Publication of JPS53121476A publication Critical patent/JPS53121476A/en
Publication of JPH0330258B2 publication Critical patent/JPH0330258B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/305—Contactless testing using electron beams
    • G01R31/306—Contactless testing using electron beams of printed or hybrid circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Electrodes For Cathode-Ray Tubes (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP1530678A 1977-02-11 1978-02-13 Method of testing electronic circuit network Granted JPS53121476A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB5835/77A GB1594597A (en) 1977-02-11 1977-02-11 Electron probe testing analysis and fault diagnosis in electronic circuits

Publications (2)

Publication Number Publication Date
JPS53121476A true JPS53121476A (en) 1978-10-23
JPH0330258B2 JPH0330258B2 (en) 1991-04-26

Family

ID=9803533

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1530678A Granted JPS53121476A (en) 1977-02-11 1978-02-13 Method of testing electronic circuit network

Country Status (6)

Country Link
JP (1) JPS53121476A (en)
DE (1) DE2805673A1 (en)
FR (1) FR2380556A1 (en)
GB (1) GB1594597A (en)
NL (1) NL7801558A (en)
SE (1) SE425869B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5599053A (en) * 1979-01-23 1980-07-28 Siemens Ag Noocontact potential measuring device

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3036713A1 (en) * 1980-09-29 1982-05-13 Siemens AG, 1000 Berlin und 8000 München METHOD AND ARRANGEMENT FOR QUANTITATIVE POTENTIAL MEASUREMENT ON SURFACE WAVE FILTERS
DE3110140A1 (en) * 1981-03-16 1982-09-23 Siemens AG, 1000 Berlin und 8000 München DEVICE AND METHOD FOR A RAPID INTERNAL LOGIC CHECK ON INTEGRATED CIRCUITS
DE3138926A1 (en) * 1981-09-30 1983-04-14 Siemens AG, 1000 Berlin und 8000 München Electron-optical arrangement for high-resolution electron-beam metrology
DE3138901A1 (en) * 1981-09-30 1983-04-14 Siemens AG, 1000 Berlin und 8000 München IMPROVED COUNTERFIELD SPECTROMETER FOR ELECTRON BEAM MEASUREMENT TECHNOLOGY
DE3138990A1 (en) * 1981-09-30 1983-04-14 Siemens AG, 1000 Berlin und 8000 München Coaxial opposing field spectrometer of high acceptance for secondary electrons and an electron beam test set
DE3206309A1 (en) * 1982-02-22 1983-09-15 Siemens AG, 1000 Berlin und 8000 München SECONDARY ELECTRON SPECTROMETER AND METHOD FOR ITS OPERATION
DE3232671A1 (en) * 1982-09-02 1984-03-08 Siemens AG, 1000 Berlin und 8000 München ARRANGEMENT AND METHOD FOR MEASURING VOLTAGE ON A CURVED MEASURING OBJECT
DE3235698A1 (en) * 1982-09-27 1984-03-29 Siemens AG, 1000 Berlin und 8000 München DEVICE AND METHOD FOR DIRECTLY MEASURING SIGNAL PROCESSES AT MULTIPLE MEASURING POINTS WITH HIGH TIME RESOLUTION
JPH0646550B2 (en) * 1985-08-19 1994-06-15 株式会社東芝 Electronic beam fixed position irradiation control method and electronic beam fixed position irradiation control device
DE3685331D1 (en) * 1986-10-23 1992-06-17 Ibm METHOD FOR TESTING BOARDS FOR INTEGRATED CIRCUITS BY MEANS OF A LASER IN A VACUUM.
DE3719202A1 (en) * 1987-06-09 1988-12-29 Siemens Ag Method for automatically testing electrical assemblies

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5093078A (en) * 1973-12-17 1975-07-24
JPS51108569A (en) * 1975-03-19 1976-09-25 Hitachi Ltd Sosadenshikenbikyo mataha ruijisochi

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3549999A (en) * 1968-06-05 1970-12-22 Gen Electric Method and apparatus for testing circuits by measuring secondary emission electrons generated by electron beam bombardment of the pulsed circuit
GB1286454A (en) * 1968-08-24 1972-08-23 Cambridge Scientific Instr Ltd Surface potential analysis by electron beams
DE1946931A1 (en) * 1969-09-17 1971-03-18 Gen Electric Method for testing circuits and devices for carrying out the method
US3796947A (en) * 1973-02-27 1974-03-12 Bell Telephone Labor Inc Electron beam testing of film integrated circuits

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5093078A (en) * 1973-12-17 1975-07-24
JPS51108569A (en) * 1975-03-19 1976-09-25 Hitachi Ltd Sosadenshikenbikyo mataha ruijisochi

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5599053A (en) * 1979-01-23 1980-07-28 Siemens Ag Noocontact potential measuring device

Also Published As

Publication number Publication date
SE7801530L (en) 1978-08-12
FR2380556B1 (en) 1985-02-08
GB1594597A (en) 1981-07-30
DE2805673A1 (en) 1978-08-17
FR2380556A1 (en) 1978-09-08
NL7801558A (en) 1978-08-15
JPH0330258B2 (en) 1991-04-26
SE425869B (en) 1982-11-15

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