NL7710164A - Werkwijze ter behandeling van een eenkristal- lijn lichaam. - Google Patents

Werkwijze ter behandeling van een eenkristal- lijn lichaam.

Info

Publication number
NL7710164A
NL7710164A NL7710164A NL7710164A NL7710164A NL 7710164 A NL7710164 A NL 7710164A NL 7710164 A NL7710164 A NL 7710164A NL 7710164 A NL7710164 A NL 7710164A NL 7710164 A NL7710164 A NL 7710164A
Authority
NL
Netherlands
Prior art keywords
treating
single crystal
line body
crystal line
line
Prior art date
Application number
NL7710164A
Other languages
English (en)
Dutch (nl)
Original Assignee
Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Nv filed Critical Philips Nv
Priority to NL7710164A priority Critical patent/NL7710164A/xx
Priority to DE2839535A priority patent/DE2839535C2/de
Priority to FR7826179A priority patent/FR2403647A1/fr
Priority to IT27637/78A priority patent/IT1099071B/it
Priority to US05/941,969 priority patent/US4177094A/en
Priority to GB7836653A priority patent/GB2005011B/en
Priority to CA311,348A priority patent/CA1112375A/en
Priority to JP11401578A priority patent/JPS5453684A/ja
Publication of NL7710164A publication Critical patent/NL7710164A/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0683—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating measurement during deposition or removal of the layer
    • C—CHEMISTRY; METALLURGY
    • C30—CRYSTAL GROWTH
    • C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
    • C30B25/02—Epitaxial-layer growth
    • C30B25/16—Controlling or regulating

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Weting (AREA)
  • Length Measuring Devices By Optical Means (AREA)
NL7710164A 1977-09-16 1977-09-16 Werkwijze ter behandeling van een eenkristal- lijn lichaam. NL7710164A (nl)

Priority Applications (8)

Application Number Priority Date Filing Date Title
NL7710164A NL7710164A (nl) 1977-09-16 1977-09-16 Werkwijze ter behandeling van een eenkristal- lijn lichaam.
DE2839535A DE2839535C2 (de) 1977-09-16 1978-09-11 Verfahren zur Herstellung eines Meßkörpers für Interferenzmessungen von Schichtdicken eines einkristallinen Körpers und Verwendung dieses Meßkörpers für die Herstellung eines Halbleiterkörpers
FR7826179A FR2403647A1 (fr) 1977-09-16 1978-09-12 Procede pour le controle d'epaisseur d'un corps monocristallin et corps ainsi obtenu
IT27637/78A IT1099071B (it) 1977-09-16 1978-09-13 Metodo di trattamento di un corpo monocristallino
US05/941,969 US4177094A (en) 1977-09-16 1978-09-13 Method of treating a monocrystalline body utilizing a measuring member consisting of a monocrystalline layer and an adjoining substratum of different index of refraction
GB7836653A GB2005011B (en) 1977-09-16 1978-09-13 Method of treating a monocrystalline body
CA311,348A CA1112375A (en) 1977-09-16 1978-09-14 Method of treating a monocrystalline body
JP11401578A JPS5453684A (en) 1977-09-16 1978-09-16 Treatment of single crystal

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL7710164A NL7710164A (nl) 1977-09-16 1977-09-16 Werkwijze ter behandeling van een eenkristal- lijn lichaam.

Publications (1)

Publication Number Publication Date
NL7710164A true NL7710164A (nl) 1979-03-20

Family

ID=19829190

Family Applications (1)

Application Number Title Priority Date Filing Date
NL7710164A NL7710164A (nl) 1977-09-16 1977-09-16 Werkwijze ter behandeling van een eenkristal- lijn lichaam.

Country Status (8)

Country Link
US (1) US4177094A (xx)
JP (1) JPS5453684A (xx)
CA (1) CA1112375A (xx)
DE (1) DE2839535C2 (xx)
FR (1) FR2403647A1 (xx)
GB (1) GB2005011B (xx)
IT (1) IT1099071B (xx)
NL (1) NL7710164A (xx)

Families Citing this family (43)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4420873A (en) * 1980-01-25 1983-12-20 Massachusetts Institute Of Technology Optical guided wave devices employing semiconductor-insulator structures
US4435898A (en) 1982-03-22 1984-03-13 International Business Machines Corporation Method for making a base etched transistor integrated circuit
DE3219409C2 (de) * 1982-05-19 1984-10-11 Schweizerische Aluminium Ag, Chippis Verfahren zur Bestimmung der Oxidationsgeschwindigkeit an der Oberfläche einer Metallschmelze
US4855013A (en) * 1984-08-13 1989-08-08 Agency Of Industrial Science And Technology Method for controlling the thickness of a thin crystal film
DE3604798A1 (de) * 1986-02-15 1987-08-27 Licentia Gmbh Verfahren zum herstellen duenner halbleiterfolien
JPS6369164A (ja) * 1986-09-11 1988-03-29 株式会社　潤工社 高速線路用コネクタ
JPH0512954Y2 (xx) * 1987-07-30 1993-04-05
JPH01106466A (ja) * 1987-10-19 1989-04-24 Fujitsu Ltd 半導体装置の製造方法
JPH067594B2 (ja) * 1987-11-20 1994-01-26 富士通株式会社 半導体基板の製造方法
JPH03101871U (xx) * 1990-02-03 1991-10-23
TW211621B (xx) * 1991-07-31 1993-08-21 Canon Kk
DE69233314T2 (de) * 1991-10-11 2005-03-24 Canon K.K. Verfahren zur Herstellung von Halbleiter-Produkten
JP3416163B2 (ja) * 1992-01-31 2003-06-16 キヤノン株式会社 半導体基板及びその作製方法
US5334281A (en) * 1992-04-30 1994-08-02 International Business Machines Corporation Method of forming thin silicon mesas having uniform thickness
US5234846A (en) * 1992-04-30 1993-08-10 International Business Machines Corporation Method of making bipolar transistor with reduced topography
US5258318A (en) * 1992-05-15 1993-11-02 International Business Machines Corporation Method of forming a BiCMOS SOI wafer having thin and thick SOI regions of silicon
US5395769A (en) * 1992-06-26 1995-03-07 International Business Machines Corporation Method for controlling silicon etch depth
FR2765031B1 (fr) * 1997-06-19 1999-09-24 Alsthom Cge Alcatel Controle de la profondeur de gravure dans la fabrication de composants semiconducteurs
US6392257B1 (en) 2000-02-10 2002-05-21 Motorola Inc. Semiconductor structure, semiconductor device, communicating device, integrated circuit, and process for fabricating the same
US6693033B2 (en) * 2000-02-10 2004-02-17 Motorola, Inc. Method of removing an amorphous oxide from a monocrystalline surface
KR20030011083A (ko) 2000-05-31 2003-02-06 모토로라 인코포레이티드 반도체 디바이스 및 이를 제조하기 위한 방법
AU2001277001A1 (en) 2000-07-24 2002-02-05 Motorola, Inc. Heterojunction tunneling diodes and process for fabricating same
US20020096683A1 (en) 2001-01-19 2002-07-25 Motorola, Inc. Structure and method for fabricating GaN devices utilizing the formation of a compliant substrate
WO2002082551A1 (en) 2001-04-02 2002-10-17 Motorola, Inc. A semiconductor structure exhibiting reduced leakage current
US20020179930A1 (en) * 2001-06-01 2002-12-05 Motorola, Inc. Composite semiconductor structure and device with optical testing elements
US6709989B2 (en) 2001-06-21 2004-03-23 Motorola, Inc. Method for fabricating a semiconductor structure including a metal oxide interface with silicon
US6992321B2 (en) 2001-07-13 2006-01-31 Motorola, Inc. Structure and method for fabricating semiconductor structures and devices utilizing piezoelectric materials
US7019332B2 (en) 2001-07-20 2006-03-28 Freescale Semiconductor, Inc. Fabrication of a wavelength locker within a semiconductor structure
US6693298B2 (en) 2001-07-20 2004-02-17 Motorola, Inc. Structure and method for fabricating epitaxial semiconductor on insulator (SOI) structures and devices utilizing the formation of a compliant substrate for materials used to form same
US6855992B2 (en) 2001-07-24 2005-02-15 Motorola Inc. Structure and method for fabricating configurable transistor devices utilizing the formation of a compliant substrate for materials used to form the same
US20030026310A1 (en) * 2001-08-06 2003-02-06 Motorola, Inc. Structure and method for fabrication for a lighting device
US6639249B2 (en) * 2001-08-06 2003-10-28 Motorola, Inc. Structure and method for fabrication for a solid-state lighting device
US20030034491A1 (en) 2001-08-14 2003-02-20 Motorola, Inc. Structure and method for fabricating semiconductor structures and devices for detecting an object
US6673667B2 (en) * 2001-08-15 2004-01-06 Motorola, Inc. Method for manufacturing a substantially integral monolithic apparatus including a plurality of semiconductor materials
US20030071327A1 (en) 2001-10-17 2003-04-17 Motorola, Inc. Method and apparatus utilizing monocrystalline insulator
US6916717B2 (en) 2002-05-03 2005-07-12 Motorola, Inc. Method for growing a monocrystalline oxide layer and for fabricating a semiconductor device on a monocrystalline substrate
US7169619B2 (en) * 2002-11-19 2007-01-30 Freescale Semiconductor, Inc. Method for fabricating semiconductor structures on vicinal substrates using a low temperature, low pressure, alkaline earth metal-rich process
US6885065B2 (en) 2002-11-20 2005-04-26 Freescale Semiconductor, Inc. Ferromagnetic semiconductor structure and method for forming the same
US6806202B2 (en) 2002-12-03 2004-10-19 Motorola, Inc. Method of removing silicon oxide from a surface of a substrate
US6963090B2 (en) 2003-01-09 2005-11-08 Freescale Semiconductor, Inc. Enhancement mode metal-oxide-semiconductor field effect transistor
US6965128B2 (en) 2003-02-03 2005-11-15 Freescale Semiconductor, Inc. Structure and method for fabricating semiconductor microresonator devices
DE102006030869A1 (de) * 2006-07-04 2008-01-10 Infineon Technologies Ag Verfahren zur Herstellung einer Halbleiterscheibe
JP4450850B2 (ja) * 2007-09-26 2010-04-14 Ｏｋｉセミコンダクタ株式会社 半導体装置の製造方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE607571A (xx) * 1960-09-09
US3449071A (en) * 1965-09-28 1969-06-10 Lexington Lab Inc Preparation of alumina crystals from a vapor phase reaction by monitoring the spectral scattering of light
GB1186340A (en) * 1968-07-11 1970-04-02 Standard Telephones Cables Ltd Manufacture of Semiconductor Devices
US3620814A (en) * 1968-08-09 1971-11-16 Bell Telephone Labor Inc Continuous measurement of the thickness of hot thin films
US3664942A (en) * 1970-12-31 1972-05-23 Ibm End point detection method and apparatus for sputter etching
US3799800A (en) * 1971-07-19 1974-03-26 Optical Coating Laboratory Inc Coating method utilizing two coating materials
NL7408110A (nl) * 1974-06-18 1975-12-22 Philips Nv Halfgeleiderinrichting met complementaire tran- sistorstrukturen en werkwijze ter vervaardiging daarvan.
JPS51140560A (en) * 1975-05-30 1976-12-03 Hitachi Ltd Method of monitoring homoepitaxy film thickness
US4024291A (en) * 1975-06-17 1977-05-17 Leybold-Heraeus Gmbh & Co. Kg Control of vapor deposition
JPS5326569A (en) * 1976-08-25 1978-03-11 Hitachi Ltd Layer thickness control me thod of epitaxial growth layer
US4118857A (en) * 1977-01-12 1978-10-10 The United States Of America As Represented By The Secretary Of The Army Flipped method for characterization of epitaxial layers

Also Published As

Publication number Publication date
FR2403647A1 (fr) 1979-04-13
JPS5652876B2 (xx) 1981-12-15
GB2005011B (en) 1982-02-10
DE2839535A1 (de) 1979-03-29
JPS5453684A (en) 1979-04-27
IT1099071B (it) 1985-09-18
US4177094A (en) 1979-12-04
GB2005011A (en) 1979-04-11
IT7827637A0 (it) 1978-09-13
DE2839535C2 (de) 1985-08-08
FR2403647B1 (xx) 1982-11-19
CA1112375A (en) 1981-11-10

Similar Documents

Publication Publication Date Title
NL7710164A (nl) Werkwijze ter behandeling van een eenkristal- lijn lichaam.
JPS51130091A (en) Surgical method
JPS51133415A (en) Diagnostic method
NL7807843A (nl) Verwerken van koolwaterstoffen.
SE7802322L (sv) Slipkropp
NL7808825A (nl) Ofthalmische werkwijze.
NO153765C (no) Fremgangsmaate for behandling av avvann.
NL7605884A (nl) Planetair tandwielstelsel.
SE7802323L (sv) Slipkropp
JPS53137893A (en) Catalyst treatment method
NL7801005A (nl) Derivaten van meta-sulfonamido-benzamide.
NL7703160A (nl) Werkwijze ter vervaardiging van een afsluit- middel.
IT7831071A0 (it) Trattamento di idrocarburi.
AU2170177A (en) Method of solubilisation
NO146072C (no) Bremsesko
JPS53104727A (en) Disinfectant method
NL7804473A (nl) Motorreduktor.
NL7804548A (nl) Werkwijze ter behandeling van vezelbanen.
GB1547731A (en) Catalyst treatment method
JPS5347172A (en) Wastewater treatment method
PT66441B (pt) Reduction process
NO782187L (no) Kvistingsapparat.
JPS5287623A (en) Pulse source
JPS5411840A (en) Chromic acid treating method
NL7810331A (nl) Zouten van n-epsilon- trimethyl -l-lysine.

Legal Events

Date Code Title Description
BV The patent application has lapsed