NL7610249A - Corpusculair stralenmicroscoop met ringzone- segmentafbeelding. - Google Patents
Corpusculair stralenmicroscoop met ringzone- segmentafbeelding.Info
- Publication number
- NL7610249A NL7610249A NL7610249A NL7610249A NL7610249A NL 7610249 A NL7610249 A NL 7610249A NL 7610249 A NL7610249 A NL 7610249A NL 7610249 A NL7610249 A NL 7610249A NL 7610249 A NL7610249 A NL 7610249A
- Authority
- NL
- Netherlands
- Prior art keywords
- ringzone
- segment image
- ray microscope
- corpuscular ray
- corpuscular
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
- H01J37/10—Lenses
- H01J37/14—Lenses magnetic
- H01J37/141—Electromagnetic lenses
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
- H01J37/153—Electron-optical or ion-optical arrangements for the correction of image defects, e.g. stigmators
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/10—Lenses
- H01J2237/14—Lenses magnetic
- H01J2237/1405—Constructional details
- H01J2237/141—Coils
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/10—Lenses
- H01J2237/14—Lenses magnetic
- H01J2237/142—Lenses magnetic with superconducting coils
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S505/00—Superconductor technology: apparatus, material, process
- Y10S505/825—Apparatus per se, device per se, or process of making or operating same
- Y10S505/871—Magnetic lens
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Microscoopes, Condenser (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Electron Sources, Ion Sources (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19752541915 DE2541915A1 (de) | 1975-09-19 | 1975-09-19 | Korpuskularstrahlenmikroskop mit ringzonensegmentabbildung |
Publications (1)
Publication Number | Publication Date |
---|---|
NL7610249A true NL7610249A (nl) | 1977-03-22 |
Family
ID=5956950
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NL7610249A NL7610249A (nl) | 1975-09-19 | 1976-09-15 | Corpusculair stralenmicroscoop met ringzone- segmentafbeelding. |
Country Status (6)
Country | Link |
---|---|
US (1) | US4214162A (nl) |
JP (1) | JPS5239362A (nl) |
DE (1) | DE2541915A1 (nl) |
FR (1) | FR2325181A1 (nl) |
GB (1) | GB1566294A (nl) |
NL (1) | NL7610249A (nl) |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL7804035A (nl) * | 1978-04-17 | 1979-10-19 | Philips Nv | Elektronenmikroskoop. |
JPS57118357A (en) * | 1981-01-14 | 1982-07-23 | Jeol Ltd | Objective lens for scan type electron microscope |
US4465934A (en) * | 1981-01-23 | 1984-08-14 | Veeco Instruments Inc. | Parallel charged particle beam exposure system |
FR2513398A1 (fr) * | 1981-09-22 | 1983-03-25 | Thomson Csf | Dispositif de correction d'astigmatisme dans un systeme d'optique electronique |
JPS60105149A (ja) * | 1983-11-11 | 1985-06-10 | Jeol Ltd | 電子線装置 |
GB2201288B (en) * | 1986-12-12 | 1990-08-22 | Texas Instruments Ltd | Electron beam apparatus |
DE3888712D1 (de) * | 1987-02-02 | 1994-05-05 | Integrated Circuit Testing | Detektorobjectiv für Rastermikroskope. |
US4963823A (en) * | 1988-06-27 | 1990-10-16 | Siemens Aktiengesellschaft | Electron beam measuring instrument |
US4962309A (en) * | 1989-08-21 | 1990-10-09 | Rockwell International Corporation | Magnetic optics adaptive technique |
US6580074B1 (en) * | 1996-09-24 | 2003-06-17 | Hitachi, Ltd. | Charged particle beam emitting device |
US6053241A (en) * | 1998-09-17 | 2000-04-25 | Nikon Corporation | Cooling method and apparatus for charged particle lenses and deflectors |
DE69939309D1 (de) | 1999-03-31 | 2008-09-25 | Advantest Corp | Teilchenstrahlgerät zur schrägen Beobachtung einer Probe |
US6614026B1 (en) | 1999-04-15 | 2003-09-02 | Applied Materials, Inc. | Charged particle beam column |
JP2002042707A (ja) * | 2000-07-25 | 2002-02-08 | Jeol Ltd | 非点収差補正装置 |
US8642959B2 (en) * | 2007-10-29 | 2014-02-04 | Micron Technology, Inc. | Method and system of performing three-dimensional imaging using an electron microscope |
US10504684B1 (en) * | 2018-07-12 | 2019-12-10 | ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH | High performance inspection scanning electron microscope device and method of operating the same |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2464419A (en) * | 1947-12-26 | 1949-03-15 | Rca Corp | Method of and apparatus for selectively achieving electronic darkfield and bright field illumation |
GB1238889A (nl) * | 1968-11-26 | 1971-07-14 | ||
DE2307822C3 (de) * | 1973-02-16 | 1982-03-18 | Siemens AG, 1000 Berlin und 8000 München | Supraleitendes Linsensystem für Korpuskularstrahlung |
NL7304298A (nl) * | 1973-03-28 | 1974-10-01 | ||
GB1420803A (en) * | 1973-06-28 | 1976-01-14 | Ass Elect Ind | Electron microscopes |
JPS5944743B2 (ja) * | 1974-04-16 | 1984-10-31 | 日本電子株式会社 | 走査電子顕微鏡等用照射電子レンズ系 |
-
1975
- 1975-09-19 DE DE19752541915 patent/DE2541915A1/de not_active Ceased
-
1976
- 1976-09-15 NL NL7610249A patent/NL7610249A/nl not_active Application Discontinuation
- 1976-09-16 GB GB38501/76A patent/GB1566294A/en not_active Expired
- 1976-09-17 FR FR7628086A patent/FR2325181A1/fr active Granted
- 1976-09-20 JP JP51111925A patent/JPS5239362A/ja active Pending
-
1978
- 1978-03-03 US US05/883,005 patent/US4214162A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
GB1566294A (en) | 1980-04-30 |
FR2325181B3 (nl) | 1979-06-01 |
JPS5239362A (en) | 1977-03-26 |
FR2325181A1 (fr) | 1977-04-15 |
US4214162A (en) | 1980-07-22 |
DE2541915A1 (de) | 1977-03-31 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
NL7606638A (nl) | Televisiestelsel. | |
NL7610521A (nl) | Elektronenweergeefinrichting. | |
NL187420C (nl) | Vaste-stof-beeldopneempaneel. | |
NL181487C (nl) | Zeefveld. | |
NO140837C (no) | Materist for forbrenningsovner. | |
NL7610343A (nl) | Vlak beeldpaneel. | |
NL7811716A (nl) | Elektronenmicroscoop. | |
NL7610249A (nl) | Corpusculair stralenmicroscoop met ringzone- segmentafbeelding. | |
NL7509473A (nl) | Televisiecamera. | |
NL7705958A (nl) | Elektronenweergeefinrichting. | |
NL7608908A (nl) | Kleurenelektronenstraalbuis. | |
NL7614122A (nl) | Electronenkanon. | |
NL7712445A (nl) | Beeldweergeefinrichting met een aantal elektronenbundels. | |
NL7603030A (nl) | Electronenbuis. | |
NL188192C (nl) | Elektronenmicroscoop. | |
NL7609400A (nl) | Elektronenweergeefinrichting. | |
NL7608024A (nl) | Verkortbaar scherm. | |
NL7511841A (nl) | Televisiekamera. | |
NL7609506A (nl) | Beeldversterkerinrichting. | |
NL7613718A (nl) | Beeldomzetter. | |
NL7610012A (nl) | Elektronenradiografische beeldkamer. | |
NL7609867A (nl) | Kijkinrichting. | |
NL7607957A (nl) | Rasterweergeefstelsel. | |
AT346620B (de) | Mikroskopkondensor | |
NL7606427A (nl) | Fotoelektrische microscoop. |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
BA | A request for search or an international-type search has been filed | ||
A85 | Still pending on 85-01-01 | ||
BB | A search report has been drawn up | ||
BV | The patent application has lapsed |