NL7606427A - Fotoelektrische microscoop. - Google Patents

Fotoelektrische microscoop.

Info

Publication number
NL7606427A
NL7606427A NL7606427A NL7606427A NL7606427A NL 7606427 A NL7606427 A NL 7606427A NL 7606427 A NL7606427 A NL 7606427A NL 7606427 A NL7606427 A NL 7606427A NL 7606427 A NL7606427 A NL 7606427A
Authority
NL
Netherlands
Prior art keywords
photo
electric microscope
microscope
electric
Prior art date
Application number
NL7606427A
Other languages
English (en)
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP7150075A external-priority patent/JPS51147348A/ja
Priority claimed from JP3600376A external-priority patent/JPS52119955A/ja
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Publication of NL7606427A publication Critical patent/NL7606427A/nl

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/04Measuring microscopes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
NL7606427A 1975-06-13 1976-06-14 Fotoelektrische microscoop. NL7606427A (nl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP7150075A JPS51147348A (en) 1975-06-13 1975-06-13 Photoelectronic microscope
JP3600376A JPS52119955A (en) 1976-04-02 1976-04-02 Photoelectric microscope

Publications (1)

Publication Number Publication Date
NL7606427A true NL7606427A (nl) 1976-12-15

Family

ID=26375017

Family Applications (1)

Application Number Title Priority Date Filing Date
NL7606427A NL7606427A (nl) 1975-06-13 1976-06-14 Fotoelektrische microscoop.

Country Status (3)

Country Link
US (1) US4045141A (nl)
DE (1) DE2626363C2 (nl)
NL (1) NL7606427A (nl)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55162756A (en) * 1979-06-04 1980-12-18 Mitsubishi Chem Ind Ltd Preparation of cyclohexenedicarboxylic acid diamide
DK386779A (da) * 1979-09-17 1981-03-18 S K Eidorff Instrument til maaling af planhed og retlinjethed
DE3218903C2 (de) * 1982-05-19 1986-05-15 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Lichtelektrische Meßeinrichtung
US4860374A (en) * 1984-04-19 1989-08-22 Nikon Corporation Apparatus for detecting position of reference pattern
US20060204544A1 (en) * 2002-05-20 2006-09-14 Musculoskeletal Transplant Foundation Allograft bone composition having a gelatin binder

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE596620C (de) * 1934-05-08 Viktor Oberguggenberger Dr Mikroskop zur optischen Laengenmessung
US3038369A (en) * 1958-12-22 1962-06-12 Bell Telephone Labor Inc Positioning a transistor by use of the optical reflectance characteristics of the electrode stripes
GB1029302A (en) * 1962-01-15 1966-05-11 Watson W & Sons Ltd Improvements in or relating to optical instruments
FR1358363A (fr) * 1962-02-27 1964-04-17 France Etat Nouveaux perfectionnements aux appareils de contrôle, notamment aux dispositifs de vérification de la symétrie d'une pièce ou de la position d'un organe de mesure
DE1917060U (de) * 1965-02-05 1965-06-03 Leitz Ernst Gmbh Vorrichtung zur beruehrungsfreien ermittlung der masse eines gegenstandes.
CH465250A (fr) * 1966-10-18 1968-11-15 Genevoise Instr Physique Microscope photoélectrique
GB1231431A (nl) * 1967-06-24 1971-05-12
GB1231055A (nl) * 1968-07-23 1971-05-05
US3592545A (en) * 1969-10-13 1971-07-13 Nasa Apparatus for remote measurement of displacement of marks on a specimen undergoing a tensile test
US3876311A (en) * 1973-05-12 1975-04-08 Nippon Kogaku Kk Two-axis photoelectric detector device

Also Published As

Publication number Publication date
US4045141A (en) 1977-08-30
DE2626363C2 (de) 1983-09-15
DE2626363A1 (de) 1976-12-16

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