NL7601997A - Oppervlakinspectie-inrichting. - Google Patents

Oppervlakinspectie-inrichting.

Info

Publication number
NL7601997A
NL7601997A NL7601997A NL7601997A NL7601997A NL 7601997 A NL7601997 A NL 7601997A NL 7601997 A NL7601997 A NL 7601997A NL 7601997 A NL7601997 A NL 7601997A NL 7601997 A NL7601997 A NL 7601997A
Authority
NL
Netherlands
Prior art keywords
inspection device
surface inspection
inspection
Prior art date
Application number
NL7601997A
Other languages
English (en)
Original Assignee
Ferranti Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from GB816875A external-priority patent/GB1535726A/en
Application filed by Ferranti Ltd filed Critical Ferranti Ltd
Publication of NL7601997A publication Critical patent/NL7601997A/nl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
NL7601997A 1975-02-27 1976-02-26 Oppervlakinspectie-inrichting. NL7601997A (nl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB816875A GB1535726A (en) 1975-02-27 1975-02-27 Detector circuits in a surface inspection system
GB1310975 1975-03-27

Publications (1)

Publication Number Publication Date
NL7601997A true NL7601997A (nl) 1976-08-31

Family

ID=26241999

Family Applications (1)

Application Number Title Priority Date Filing Date
NL7601997A NL7601997A (nl) 1975-02-27 1976-02-26 Oppervlakinspectie-inrichting.

Country Status (5)

Country Link
US (1) US4048510A (nl)
JP (1) JPS51110390A (nl)
CA (1) CA1068371A (nl)
DE (1) DE2607417A1 (nl)
NL (1) NL7601997A (nl)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4348114A (en) * 1979-12-07 1982-09-07 Ciba-Geigy Ag Method of inspecting coated web material to detect the presence of downlines thereon
JPS5745514A (en) * 1980-08-30 1982-03-15 Nippon Kogaku Kk <Nikon> Exposure controller of photographying device of microscope
US4538915A (en) * 1981-12-23 1985-09-03 E. I. Du Pont De Nemours And Company Web inspection system having a product characteristic signal normalizing network
ATE50644T1 (de) * 1983-12-22 1990-03-15 Leglertex Srl Apparat zum feststellung von fehlern bei der herstellung von kordsamt.
US4701985A (en) * 1983-12-22 1987-10-27 Leglertex S.R.L. Apparatus for detecting anomalies in corduroy preparation
DE3740801A1 (de) * 1987-12-02 1988-12-22 Bosch Gmbh Robert Warneinrichtung zur erkennung von schaeden an sich bewegenden teilen
US5243408A (en) * 1991-07-17 1993-09-07 P. H. Glatfelter Company Method and apparatus for detecting web discontinuities
US7423250B2 (en) * 2005-07-14 2008-09-09 Kla-Tencor Technologies Corp. Systems, circuits and methods for extending the detection range of an inspection system by avoiding circuit saturation
JP5302678B2 (ja) * 2005-07-14 2013-10-02 ケーエルエー−テンカー コーポレイション 検出器と回路の飽和を避けることにより検査システムの熱破損を削減して、検出範囲を拡張するためのシステム、回路、方法
US7414715B2 (en) * 2005-07-14 2008-08-19 Kla-Tencor Technologies Corp. Systems, circuits and methods for extending the detection range of an inspection system by avoiding detector saturation
US7436508B2 (en) * 2005-07-14 2008-10-14 Kla-Tencor Technologies Corp. Systems, circuits and methods for reducing thermal damage and extending the detection range of an inspection system
KR101502304B1 (ko) * 2007-08-01 2015-03-13 어플라이드 머티어리얼스, 인코포레이티드 기판 상의 박막들을 식별하기 위한 방법들 및 장치

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL6713063A (nl) * 1967-09-25 1969-03-27
US3584963A (en) * 1968-12-27 1971-06-15 Rca Corp Optical flaw detector
US3601615A (en) * 1969-10-09 1971-08-24 Seizi Maeda Electric apparatus for detecting minute variation in time-functional luminous energy
US3843890A (en) * 1973-07-27 1974-10-22 Du Pont Optical-electrical web inspection system

Also Published As

Publication number Publication date
US4048510A (en) 1977-09-13
JPS51110390A (en) 1976-09-29
CA1068371A (en) 1979-12-18
DE2607417A1 (de) 1976-09-09

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Legal Events

Date Code Title Description
BV The patent application has lapsed