NL7502387A - Coincidentie-correctiecircuit. - Google Patents

Coincidentie-correctiecircuit.

Info

Publication number
NL7502387A
NL7502387A NL7502387A NL7502387A NL7502387A NL 7502387 A NL7502387 A NL 7502387A NL 7502387 A NL7502387 A NL 7502387A NL 7502387 A NL7502387 A NL 7502387A NL 7502387 A NL7502387 A NL 7502387A
Authority
NL
Netherlands
Prior art keywords
correction circuit
coincidence correction
coincidence
circuit
correction
Prior art date
Application number
NL7502387A
Other languages
English (en)
Other versions
NL168333B (nl
NL168333C (nl
Original Assignee
Baker Chem Co J T
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Baker Chem Co J T filed Critical Baker Chem Co J T
Publication of NL7502387A publication Critical patent/NL7502387A/nl
Publication of NL168333B publication Critical patent/NL168333B/nl
Application granted granted Critical
Publication of NL168333C publication Critical patent/NL168333C/nl

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K21/00—Details of pulse counters or frequency dividers
    • H03K21/02—Input circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/1031—Investigating individual particles by measuring electrical or magnetic effects
    • G01N15/12—Investigating individual particles by measuring electrical or magnetic effects by observing changes in resistance or impedance across apertures when traversed by individual particles, e.g. by using the Coulter principle
    • G01N15/131—Details
    • G01N15/132—Circuits

Landscapes

  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
  • Measurement Of Radiation (AREA)
NLAANVRAGE7502387,A 1974-03-01 1975-02-28 Inrichting voor het tellen van deeltjes. NL168333C (nl)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US447530A US3864551A (en) 1974-03-01 1974-03-01 Coincidence correction circuit

Publications (3)

Publication Number Publication Date
NL7502387A true NL7502387A (nl) 1975-09-03
NL168333B NL168333B (nl) 1981-10-16
NL168333C NL168333C (nl) 1982-03-16

Family

ID=23776728

Family Applications (1)

Application Number Title Priority Date Filing Date
NLAANVRAGE7502387,A NL168333C (nl) 1974-03-01 1975-02-28 Inrichting voor het tellen van deeltjes.

Country Status (10)

Country Link
US (1) US3864551A (nl)
JP (1) JPS5639417B2 (nl)
BE (1) BE826007A (nl)
CA (1) CA1013434A (nl)
DE (1) DE2505837C3 (nl)
ES (1) ES435131A1 (nl)
FR (1) FR2262835B1 (nl)
GB (1) GB1468332A (nl)
NL (1) NL168333C (nl)
ZA (1) ZA75616B (nl)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE377612B (nl) * 1973-11-09 1975-07-14 T L B Greverus
US3938038A (en) * 1974-07-01 1976-02-10 Coulter Electronics, Inc. Method and apparatus for providing primary coincidence correction during particle analysis
US3944791A (en) * 1974-07-10 1976-03-16 General Science Corporation Platelet count correction circuit
US4042808A (en) * 1975-08-11 1977-08-16 Angel Engineering Corporation Particle count correction
DE2547885C3 (de) * 1975-10-25 1980-05-08 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Elektronischer Zähler
JPS5598333A (en) * 1979-01-22 1980-07-26 Toa Medical Electronics Co Ltd Particle counting device
US4366372A (en) * 1979-06-01 1982-12-28 Innovative Design, Inc. Apparatus and method for counting repetitive marks on a running web
US4447883A (en) * 1981-05-26 1984-05-08 Technicon Instruments Corporation Coincidence-error correcting apparatus and method
JPS59125931U (ja) * 1983-02-10 1984-08-24 近藤　祐二 洋服の肩パツド
JPS60314U (ja) * 1983-06-15 1985-01-05 岩崎産業株式会社 成形肩パツト
JPS61113806A (ja) * 1984-11-07 1986-05-31 丸善工業株式会社 肩当パツトの製造方法
JPS62170507A (ja) * 1986-01-22 1987-07-27 北岸　茂 肩当パツトの製造方法
JPS63115027U (nl) * 1987-01-14 1988-07-25
DE102006021487B3 (de) * 2006-05-05 2007-09-06 Parsum Gmbh Verfahren und Vorrichtung zur Bestimmung der in einem Partikelstrom enthaltenen Partikel
FR2917842A1 (fr) * 2007-06-19 2008-12-26 Commissariat Energie Atomique Dispositif et methode de comptage de particules elementaires emises par un fluide dans un conduit.

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3209130A (en) * 1962-04-30 1965-09-28 Westinghouse Electric Corp Digital measuring device
US3686665A (en) * 1969-12-31 1972-08-22 Leeds & Northrup Co Digital function generator

Also Published As

Publication number Publication date
ES435131A1 (es) 1977-02-01
NL168333B (nl) 1981-10-16
GB1468332A (en) 1977-03-23
DE2505837C3 (de) 1979-07-26
CA1013434A (en) 1977-07-05
JPS50120880A (nl) 1975-09-22
NL168333C (nl) 1982-03-16
FR2262835B1 (nl) 1979-06-08
BE826007A (fr) 1975-06-16
JPS5639417B2 (nl) 1981-09-12
US3864551A (en) 1975-02-04
DE2505837B2 (de) 1978-11-16
FR2262835A1 (nl) 1975-09-26
DE2505837A1 (de) 1975-09-25
ZA75616B (en) 1976-01-28
AU7808275A (en) 1976-08-12

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Legal Events

Date Code Title Description
SNR Assignments of patents or rights arising from examined patent applications

Owner name: BAKER INSTRUMENTS CORPORATION