NL7411128A - Electron beam tube arrangement - is for vertical deflection response control in industrial TV or electron microscope systems - Google Patents

Electron beam tube arrangement - is for vertical deflection response control in industrial TV or electron microscope systems

Info

Publication number
NL7411128A
NL7411128A NL7411128A NL7411128A NL7411128A NL 7411128 A NL7411128 A NL 7411128A NL 7411128 A NL7411128 A NL 7411128A NL 7411128 A NL7411128 A NL 7411128A NL 7411128 A NL7411128 A NL 7411128A
Authority
NL
Netherlands
Prior art keywords
industrial
electron beam
vertical deflection
electron
response control
Prior art date
Application number
NL7411128A
Other languages
English (en)
Dutch (nl)
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Publication of NL7411128A publication Critical patent/NL7411128A/xx

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/24—Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Details Of Television Scanning (AREA)
  • Radar Systems Or Details Thereof (AREA)
NL7411128A 1973-08-20 1974-08-20 Electron beam tube arrangement - is for vertical deflection response control in industrial TV or electron microscope systems NL7411128A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9254873A JPS5523510B2 (enExample) 1973-08-20 1973-08-20

Publications (1)

Publication Number Publication Date
NL7411128A true NL7411128A (en) 1975-02-24

Family

ID=14057437

Family Applications (1)

Application Number Title Priority Date Filing Date
NL7411128A NL7411128A (en) 1973-08-20 1974-08-20 Electron beam tube arrangement - is for vertical deflection response control in industrial TV or electron microscope systems

Country Status (2)

Country Link
JP (1) JPS5523510B2 (enExample)
NL (1) NL7411128A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2320673A1 (fr) * 1975-08-02 1977-03-04 Pusch Gunter Procede et dispositif d'analyse et de traitement electronique d'images thermiques

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6719000B2 (ja) * 2019-02-19 2020-07-08 日本電子株式会社 電子顕微鏡および電子顕微鏡の作動方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2320673A1 (fr) * 1975-08-02 1977-03-04 Pusch Gunter Procede et dispositif d'analyse et de traitement electronique d'images thermiques

Also Published As

Publication number Publication date
JPS5523510B2 (enExample) 1980-06-23
JPS5042720A (enExample) 1975-04-18

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