NL7306298A - - Google Patents
Info
- Publication number
- NL7306298A NL7306298A NL7306298A NL7306298A NL7306298A NL 7306298 A NL7306298 A NL 7306298A NL 7306298 A NL7306298 A NL 7306298A NL 7306298 A NL7306298 A NL 7306298A NL 7306298 A NL7306298 A NL 7306298A
- Authority
- NL
- Netherlands
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US25112572A | 1972-05-08 | 1972-05-08 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| NL7306298A true NL7306298A (en:Method) | 1973-11-12 |
| NL179693C NL179693C (nl) | 1986-10-16 |
Family
ID=22950578
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| NLAANVRAGE7306298,A NL179693C (nl) | 1972-05-08 | 1973-05-04 | Weergeefstelsel voor een veldemissie-aftastmicroscoop. |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US3767926A (en:Method) |
| JP (1) | JPS4956581A (en:Method) |
| CA (1) | CA977873A (en:Method) |
| DD (1) | DD107173A5 (en:Method) |
| DE (1) | DE2322649C2 (en:Method) |
| FR (1) | FR2184045B1 (en:Method) |
| GB (1) | GB1385170A (en:Method) |
| NL (1) | NL179693C (en:Method) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3916191A (en) * | 1974-03-01 | 1975-10-28 | Minnesota Mining & Mfg | Imaging apparatus and method for use with ion scattering spectrometer |
| DE2548831C2 (de) * | 1974-12-20 | 1985-11-14 | Nanometrics Inc., Sunnyvale, Calif. | Impulsgenerator für Rasteranzeigegeräte |
| JPS5826454Y2 (ja) * | 1975-09-27 | 1983-06-08 | 株式会社島津製作所 | デンシセンソウサガタシリヨウカンサツソウチ |
| US6194718B1 (en) * | 1998-09-23 | 2001-02-27 | Applied Materials, Inc. | Method for reducing aliasing effects in scanning beam microscopy |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR1023372A (fr) * | 1950-07-19 | 1953-03-18 | S E D A C Soc | Perfectionnements aux procédés de télévision et dispositifs pour la mise en oeuvre de ces procédés |
| US3309461A (en) * | 1962-08-01 | 1967-03-14 | Battelle Development Corp | Pseudo-random electron beam scanning system for narrow bandwidth image transmission |
-
1972
- 1972-05-08 US US00251125A patent/US3767926A/en not_active Expired - Lifetime
-
1973
- 1973-05-03 DE DE2322649A patent/DE2322649C2/de not_active Expired
- 1973-05-04 FR FR7316829A patent/FR2184045B1/fr not_active Expired
- 1973-05-04 JP JP48049191A patent/JPS4956581A/ja active Pending
- 1973-05-04 NL NLAANVRAGE7306298,A patent/NL179693C/xx not_active IP Right Cessation
- 1973-05-07 CA CA170,608A patent/CA977873A/en not_active Expired
- 1973-05-08 GB GB2198473A patent/GB1385170A/en not_active Expired
- 1973-05-08 DD DD170686A patent/DD107173A5/xx unknown
Also Published As
| Publication number | Publication date |
|---|---|
| DD107173A5 (en:Method) | 1974-07-12 |
| NL179693C (nl) | 1986-10-16 |
| FR2184045B1 (en:Method) | 1978-02-10 |
| JPS4956581A (en:Method) | 1974-06-01 |
| US3767926A (en) | 1973-10-23 |
| GB1385170A (en) | 1975-02-26 |
| DE2322649C2 (de) | 1986-01-30 |
| FR2184045A1 (en:Method) | 1973-12-21 |
| CA977873A (en) | 1975-11-11 |
| DE2322649A1 (de) | 1973-11-22 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| BA | A request for search or an international-type search has been filed | ||
| BB | A search report has been drawn up | ||
| BC | A request for examination has been filed | ||
| CNR | Transfer of rights (patent application after its laying open for public inspection) |
Free format text: WARNER LAMBERT TECHNOLOGIES, INC. |
|
| CNR | Transfer of rights (patent application after its laying open for public inspection) |
Free format text: NANOMETRICS, INC. |
|
| A85 | Still pending on 85-01-01 | ||
| V4 | Discontinued because of reaching the maximum lifetime of a patent |