NL7207823A - - Google Patents

Info

Publication number
NL7207823A
NL7207823A NL7207823A NL7207823A NL7207823A NL 7207823 A NL7207823 A NL 7207823A NL 7207823 A NL7207823 A NL 7207823A NL 7207823 A NL7207823 A NL 7207823A NL 7207823 A NL7207823 A NL 7207823A
Authority
NL
Netherlands
Application number
NL7207823A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of NL7207823A publication Critical patent/NL7207823A/xx

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/76—Masking faults in memories by using spares or by reconfiguring using address translation or modifications
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1012—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices using codes or arrangements adapted for a specific type of error
    • G06F11/1024—Identification of the type of error

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Hardware Redundancy (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
NL7207823A 1971-06-25 1972-06-09 NL7207823A (https=)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US15663771A 1971-06-25 1971-06-25

Publications (1)

Publication Number Publication Date
NL7207823A true NL7207823A (https=) 1972-12-28

Family

ID=22560395

Family Applications (1)

Application Number Title Priority Date Filing Date
NL7207823A NL7207823A (https=) 1971-06-25 1972-06-09

Country Status (11)

Country Link
US (1) US3735368A (https=)
JP (1) JPS5210613B1 (https=)
AU (1) AU458408B2 (https=)
BE (1) BE785380A (https=)
BR (1) BR7204117D0 (https=)
CA (1) CA960775A (https=)
CH (1) CH554052A (https=)
FR (1) FR2143342B1 (https=)
GB (1) GB1354849A (https=)
IT (1) IT950714B (https=)
NL (1) NL7207823A (https=)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1377859A (en) * 1972-08-03 1974-12-18 Catt I Digital integrated circuits
US4044341A (en) * 1976-03-22 1977-08-23 Rca Corporation Memory array
US4228528B2 (en) * 1979-02-09 1992-10-06 Memory with redundant rows and columns
EP0070823A1 (en) * 1981-02-02 1983-02-09 Mostek Corporation Semiconductor memory redundant element identification circuit
US4430727A (en) * 1981-11-10 1984-02-07 International Business Machines Corp. Storage element reconfiguration
JPH0670880B2 (ja) * 1983-01-21 1994-09-07 株式会社日立マイコンシステム 半導体記憶装置
US4922451A (en) * 1987-03-23 1990-05-01 International Business Machines Corporation Memory re-mapping in a microcomputer system
US5088066A (en) * 1989-02-10 1992-02-11 Intel Corporation Redundancy decoding circuit using n-channel transistors
US5031142A (en) * 1989-02-10 1991-07-09 Intel Corporation Reset circuit for redundant memory using CAM cells
EP0675502B1 (en) 1989-04-13 2005-05-25 SanDisk Corporation Multiple sector erase flash EEPROM system
US5051994A (en) * 1989-04-28 1991-09-24 International Business Machines Corporation Computer memory module
AU5930390A (en) * 1989-07-06 1991-02-06 Mv Limited A fault tolerant data storage system
US5128941A (en) * 1989-12-20 1992-07-07 Bull Hn Information Systems Inc. Method of organizing a memory for fault tolerance
US4992984A (en) * 1989-12-28 1991-02-12 International Business Machines Corporation Memory module utilizing partially defective memory chips
US5134616A (en) * 1990-02-13 1992-07-28 International Business Machines Corporation Dynamic ram with on-chip ecc and optimized bit and word redundancy
GB9023867D0 (en) * 1990-11-02 1990-12-12 Mv Ltd Improvements relating to a fault tolerant storage system
GB9305801D0 (en) * 1993-03-19 1993-05-05 Deans Alexander R Semiconductor memory system
GB2291516A (en) * 1995-03-28 1996-01-24 Memory Corp Plc Provision of write capability in partial memory systems
US6314527B1 (en) 1998-03-05 2001-11-06 Micron Technology, Inc. Recovery of useful areas of partially defective synchronous memory components
US6332183B1 (en) 1998-03-05 2001-12-18 Micron Technology, Inc. Method for recovery of useful areas of partially defective synchronous memory components
US6381708B1 (en) 1998-04-28 2002-04-30 Micron Technology, Inc. Method for decoding addresses for a defective memory array
US6381707B1 (en) 1998-04-28 2002-04-30 Micron Technology, Inc. System for decoding addresses for a defective memory array
US6496876B1 (en) 1998-12-21 2002-12-17 Micron Technology, Inc. System and method for storing a tag to identify a functional storage location in a memory device
US7111190B2 (en) 2001-02-23 2006-09-19 Intel Corporation Method and apparatus for reconfigurable memory
US6578157B1 (en) 2000-03-06 2003-06-10 Micron Technology, Inc. Method and apparatus for recovery of useful areas of partially defective direct rambus rimm components
US7269765B1 (en) * 2000-04-13 2007-09-11 Micron Technology, Inc. Method and apparatus for storing failing part locations in a module
KR102707649B1 (ko) * 2016-12-22 2024-09-20 에스케이하이닉스 주식회사 에러 정정 코드 회로를 갖는 반도체 메모리 장치

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL281825A (https=) * 1961-08-08
US3444526A (en) * 1966-06-08 1969-05-13 Ibm Storage system using a storage device having defective storage locations
US3434116A (en) * 1966-06-15 1969-03-18 Ibm Scheme for circumventing bad memory cells
US3588830A (en) * 1968-01-17 1971-06-28 Ibm System for using a memory having irremediable bad bits

Also Published As

Publication number Publication date
FR2143342B1 (https=) 1978-03-03
US3735368A (en) 1973-05-22
CA960775A (en) 1975-01-07
BR7204117D0 (pt) 1973-06-14
AU4390772A (en) 1974-01-03
DE2230759B2 (de) 1976-12-30
CH554052A (de) 1974-09-13
JPS5210613B1 (https=) 1977-03-25
BE785380A (fr) 1972-10-16
GB1354849A (en) 1974-06-05
FR2143342A1 (https=) 1973-02-02
IT950714B (it) 1973-06-20
AU458408B2 (en) 1975-02-27
DE2230759A1 (de) 1973-01-11

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Legal Events

Date Code Title Description
BV The patent application has lapsed