NL6804889A - - Google Patents
Info
- Publication number
- NL6804889A NL6804889A NL6804889A NL6804889A NL6804889A NL 6804889 A NL6804889 A NL 6804889A NL 6804889 A NL6804889 A NL 6804889A NL 6804889 A NL6804889 A NL 6804889A NL 6804889 A NL6804889 A NL 6804889A
- Authority
- NL
- Netherlands
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/227—Measuring photoelectric effect, e.g. photoelectron emission microscopy [PEEM]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
- H01J49/46—Static spectrometers
- H01J49/48—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Electron Tubes For Measurement (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US63421467A | 1967-04-27 | 1967-04-27 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| NL6804889A true NL6804889A (en:Method) | 1968-10-28 |
Family
ID=24542865
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| NL6804889A NL6804889A (en:Method) | 1967-04-27 | 1968-04-05 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US3461306A (en:Method) |
| BE (1) | BE714344A (en:Method) |
| ES (1) | ES352500A1 (en:Method) |
| FR (1) | FR1560972A (en:Method) |
| NL (1) | NL6804889A (en:Method) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3659095A (en) * | 1968-09-19 | 1972-04-25 | Boris Andreevich Gumenjuk | Magnetic beta-ray spectrometer and magnetic lenses for use therein |
| FR1593088A (en:Method) * | 1968-10-25 | 1970-05-25 | ||
| GB1246744A (en) * | 1969-01-02 | 1971-09-15 | Graham Stuart Plows | Electron beam apparatus |
| US3631238A (en) * | 1969-11-17 | 1971-12-28 | North American Rockwell | Method of measuring electric potential on an object surface using auger electron spectroscopy |
| US3679896A (en) * | 1969-12-23 | 1972-07-25 | Ibm | Electrostatic prism |
| US3787692A (en) * | 1971-05-17 | 1974-01-22 | Varian Associates | Induced electron emission spectrometer using plural radiation sources |
| DE2151167C3 (de) * | 1971-10-14 | 1974-05-09 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Elektronenstrahl-Mikroanalysator mit Auger-Elektronen-Nachweis |
| GB1530277A (en) * | 1975-01-02 | 1978-10-25 | Commissariat Energie Atomique | Process and apparatus for the elementary and chemical analysis of a sample by spectrum analysis of the energy of the secondary electrons |
| US4459482A (en) * | 1982-05-06 | 1984-07-10 | Bales Maurice J | Auger spectroscopic technique measuring the number of electrons emitted from a surface as a function of the energy level of those electrons |
| US4719120A (en) * | 1986-09-29 | 1988-01-12 | The United States Of America As Represented By The Secretary Of The Navy | Detection of oxygen in thin films |
| JPH0299846A (ja) * | 1988-10-07 | 1990-04-11 | Toshiba Corp | エネルギー分析装置 |
| JPH05296947A (ja) * | 1992-04-24 | 1993-11-12 | Japan Aviation Electron Ind Ltd | 電子線回折測定装置 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2405306A (en) * | 1944-01-31 | 1946-08-06 | Rca Corp | Electronic microanalyzer monitoring |
| US3356844A (en) * | 1963-07-02 | 1967-12-05 | Centre Nat Rech Metall | Rotatable sample changer for an electron probe microanalyzer having means for maintaining a vacuum in the analysis chamber |
| AT239876B (de) * | 1963-07-03 | 1965-04-26 | Fritz Dr Grasenick | Vorrichtung zum Festhalten von Objektträgern |
-
1967
- 1967-04-27 US US634214A patent/US3461306A/en not_active Expired - Lifetime
-
1968
- 1968-04-05 NL NL6804889A patent/NL6804889A/xx unknown
- 1968-04-06 ES ES352500A patent/ES352500A1/es not_active Expired
- 1968-04-26 FR FR1560972D patent/FR1560972A/fr not_active Expired
- 1968-04-26 BE BE714344D patent/BE714344A/xx unknown
Also Published As
| Publication number | Publication date |
|---|---|
| FR1560972A (en:Method) | 1969-03-21 |
| US3461306A (en) | 1969-08-12 |
| BE714344A (en:Method) | 1968-10-28 |
| ES352500A1 (es) | 1969-07-01 |