BE714344A - - Google Patents

Info

Publication number
BE714344A
BE714344A BE714344DA BE714344A BE 714344 A BE714344 A BE 714344A BE 714344D A BE714344D A BE 714344DA BE 714344 A BE714344 A BE 714344A
Authority
BE
Belgium
Application number
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of BE714344A publication Critical patent/BE714344A/xx

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/227Measuring photoelectric effect, e.g. photoelectron emission microscopy [PEEM]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/44Energy spectrometers, e.g. alpha-, beta-spectrometers
    • H01J49/46Static spectrometers
    • H01J49/48Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Electron Tubes For Measurement (AREA)
BE714344D 1967-04-27 1968-04-26 BE714344A (en:Method)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US63421467A 1967-04-27 1967-04-27

Publications (1)

Publication Number Publication Date
BE714344A true BE714344A (en:Method) 1968-10-28

Family

ID=24542865

Family Applications (1)

Application Number Title Priority Date Filing Date
BE714344D BE714344A (en:Method) 1967-04-27 1968-04-26

Country Status (5)

Country Link
US (1) US3461306A (en:Method)
BE (1) BE714344A (en:Method)
ES (1) ES352500A1 (en:Method)
FR (1) FR1560972A (en:Method)
NL (1) NL6804889A (en:Method)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3659095A (en) * 1968-09-19 1972-04-25 Boris Andreevich Gumenjuk Magnetic beta-ray spectrometer and magnetic lenses for use therein
FR1593088A (en:Method) * 1968-10-25 1970-05-25
GB1246744A (en) * 1969-01-02 1971-09-15 Graham Stuart Plows Electron beam apparatus
US3631238A (en) * 1969-11-17 1971-12-28 North American Rockwell Method of measuring electric potential on an object surface using auger electron spectroscopy
US3679896A (en) * 1969-12-23 1972-07-25 Ibm Electrostatic prism
US3787692A (en) * 1971-05-17 1974-01-22 Varian Associates Induced electron emission spectrometer using plural radiation sources
DE2151167C3 (de) * 1971-10-14 1974-05-09 Siemens Ag, 1000 Berlin Und 8000 Muenchen Elektronenstrahl-Mikroanalysator mit Auger-Elektronen-Nachweis
GB1530277A (en) * 1975-01-02 1978-10-25 Commissariat Energie Atomique Process and apparatus for the elementary and chemical analysis of a sample by spectrum analysis of the energy of the secondary electrons
US4459482A (en) * 1982-05-06 1984-07-10 Bales Maurice J Auger spectroscopic technique measuring the number of electrons emitted from a surface as a function of the energy level of those electrons
US4719120A (en) * 1986-09-29 1988-01-12 The United States Of America As Represented By The Secretary Of The Navy Detection of oxygen in thin films
JPH0299846A (ja) * 1988-10-07 1990-04-11 Toshiba Corp エネルギー分析装置
JPH05296947A (ja) * 1992-04-24 1993-11-12 Japan Aviation Electron Ind Ltd 電子線回折測定装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2405306A (en) * 1944-01-31 1946-08-06 Rca Corp Electronic microanalyzer monitoring
US3356844A (en) * 1963-07-02 1967-12-05 Centre Nat Rech Metall Rotatable sample changer for an electron probe microanalyzer having means for maintaining a vacuum in the analysis chamber
AT239876B (de) * 1963-07-03 1965-04-26 Fritz Dr Grasenick Vorrichtung zum Festhalten von Objektträgern

Also Published As

Publication number Publication date
FR1560972A (en:Method) 1969-03-21
US3461306A (en) 1969-08-12
ES352500A1 (es) 1969-07-01
NL6804889A (en:Method) 1968-10-28

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